×

Automated gauge, assessment system and method

  • US 5,542,280 A
  • Filed: 01/09/1995
  • Issued: 08/06/1996
  • Est. Priority Date: 01/09/1995
  • Status: Expired due to Term
First Claim
Patent Images

1. A gauge assessment apparatus for use with a gauge having a needle that deflects in response to an input control signal, comprising:

  • means for generating a predetermined gauge input signal;

    means for recording a needle deflection of the gauge in response to the predetermined input signal;

    means for analyzing the needle deflection to determine locations of a head portion of the gauge needle and a needle portion remote from said head portion to thereby determine the actual needle deflection; and

    means for comparing the actual needle deflection with an expected needle deflection corresponding to the predetermined gauge input signal to thereby assess the accuracy of the gauge.

View all claims
  • 19 Assignments
Timeline View
Assignment View
    ×
    ×