Dynamic dispatching rule that uses long term due date and short term queue time to improve delivery performance

• US 5,546,326 A
• Filed: 04/04/1995
• Issued: 08/13/1996
• Est. Priority Date: 04/04/1995
• Status: Expired due to Term

• Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Original Assignee: Taiwan Semiconductor Manufacturing Company Limited
• Inventors: Tai, Wei-Heng, Hsu, Yi-Chin
• Primary Examiner(s): Trammell, James P.
• Application Number:
  US08/416,165
• Time in Patent Office: 497 Days
• Field of Search: 364/401, 364/402, 364/403, 364/468, 364/552, 395/3, 395/50, 395/61, 395/904, 395/906
• US Class Current: 702/84
• CPC Class Codes: G06Q 10/047 Optimisation of routes or paths, e.g. travelling salesman problem
• CPC Class Codes: H01L 22/20 Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Abstract

This is a dynamic dispatching method for delivery performance by a factory. SLACK=(Due_-- Date-Now)-(Forecast_-- FAB_-- Out_-- Time); where Due_-- Date=Scheduled due date from Master Production Schedule. The OTD (On Time Delivery) dynamic dispatching method focuses on the due date and the target cycle time under the environment of integrated circuit manufacturing. SLACK policy controls the long term due date and the OTD policy reflects the short term stage queue time. Through fuzzy theory, SLACK and OTD policies are combined as a dispatching controller to control the lot priority of the entire production line. The work piece, with either a long stage queue time, or with an urgent due date is pushed through the overall production line instead of jamming the front end of the process. A demand pull system satisfies the due date and the quantity of monthly demand.

Claims

1. A method of manufacturing control system by computer control of work flow in automatic control of a manufacturing production line,

providing comparison from positive data and negative feedback data,

providing input TTDD data and TSSC data as a positive input,

providing comparison output from said TTDD data, said TSSC data and from said negative feedback data,

providing a SLACK &

OTD control processing in response to the output from said comparison output, said SLACK &

OTD control processing providing FFOT and QT output data,

said FFOT and QT output data being provided to said feedback input for said comparison,

whereby automation of production control of a manufacturing process is provided by improved automation of work scheduling.

2. A method of manufacturing in accordance with claim 1 wherein

quantity control is provided based upon said FFOT and QT output data.

3. A method of manufacturing in accordance with claim 2 wherein

said quantity control provided based upon said FFOT and QT output data is provided by reviewing product to determine whether product is adequate or inadequate, and resetting as first priority in the case of inadequate product.

4. A method of manufacturing in accordance with claim 1 wherein

quantity control is provided based upon said FFOT and QT output data by reviewing product to determine whether product is adequate or inadequate, and resetting as first priority in the case of inadequate product.

5. A method of manufacturing in accordance with claim 1 wherein

6. A method of manufacturing in accordance with claim 2 wherein

7. A method of manufacturing in accordance with claim 3 wherein

8. A method of manufacturing in accordance with claim 4 wherein

9. A method of manufacturing in accordance with claim 1 wherein

10. A method of manufacturing in accordance with claim 2 wherein

11. A method of manufacturing in accordance with claim 3 wherein

12. A method of manufacturing in accordance with claim 4 wherein

13. A method of manufacturing in accordance with claim 5 wherein

14. A method of manufacturing in accordance with claim 6 wherein

15. A method of manufacturing in accordance with claim 7 wherein

16. A method of manufacturing in accordance with claim 8 wherein

17. A manufacturing control system including computer control of work flow in automatic control of a manufacturing production line,

a comparator having a positive input and a negative input,

an input line providing TTDD data to said positive input,

an input line providing TSSC data to said positive input,

an output line from said comparator,

a SLACK &

OTD controller having an input connected to the output line from said comparator and having an FFOT and QT output line,

said FFOT and QT output line being coupled to said negative input of said comparator,

whereby automation of production control of a manufacturing process is provided by automation of scheduling of work.

18. A manufacturing system in accordance with claim 17 wherein

quantity control is provided based upon said FFOT and QT output data.

19. A manufacturing system in accordance with claim 18 wherein

said quantity control provided based upon said FFOT and QT output data is provided by reviewing product to determine whether product is adequate or inadequate, and resetting as first priority in the case of inadequate product.

20. A manufacturing system in accordance with claim 17 wherein

quantity control is provided based upon said FFOT and QT output data by reviewing product to determine whether product is adequate or inadequate, and resetting as first priority in the case of inadequate product.

21. A manufacturing system in accordance with claim 17 wherein

22. A manufacturing system in accordance with claim 18 wherein

23. A manufacturing system in accordance with claim 19 wherein

24. A manufacturing system in accordance with claim 20 wherein

25. A manufacturing system in accordance with claim 17 wherein

26. A manufacturing system in accordance with claim 18 wherein

27. A manufacturing system in accordance with claim 19 wherein

28. A manufacturing system in accordance with claim 20 wherein

29. A manufacturing system in accordance with claim 21 wherein

30. A manufacturing system in accordance with claim 22 wherein

31. A manufacturing system in accordance with claim 23 wherein

32. A manufacturing system in accordance with claim 24 wherein