Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays
First Claim
1. A method of making and configuring a mask-configured logic cell array configured to emulate the logical operations of a user-configured logic cell array during normal mode operations, comprising the steps of:
- providing a netlist describing the configuration of the user-configured logic cell array, the netlist including a plurality of logic blocks each including a plurality of logic gates present on the user-configured logic cell array; and
configuring the mask-configured logic cell array according to the netlist without a logic simulation to verifying functionality of the configured mask-configured logic cell array, the mask configured logic cell array including a plurality of logic gate clusters placed and routed to correspond one-to-one to used logic blocks of the user-configured logic cell array, each cluster being a plurality of logic gates having physical proximity, but not including at least some logic gate clusters corresponding to unused logic blocks on the user configured logic cell array.
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Accused Products
Abstract
Method and apparatus for producing mask-configured integrated circuits which are pin, logic, and timing compatible substitutes for user-configured logic arrays, without the need for logic or timing simulations of the mask-configured circuit design. Scan testing networks of test blocks and modified flip flops are included in the mask-configured substitutes to test functionality. Logic compatibility to the user-configured logic array (an FPGA) is preserved by clustering together in the mask-configured integrated circuit (a gate array) all of the logic gates which perform the functions of a particular FPGA logic block. Moreover, only those FPGA logic gates or functions which are used are replicated in the gate array, to conserve chip area. Test blocks are inserted in the gate array only where needed, i.e. at the output of any function generator that has connections external to the configurable logic block, and all flip flops are modified to also function as test blocks in a test mode. All logic blocks along asynchronous data paths in the FPGA are timing matched by delay elements in the mask-programmed substitute to preserve timing compatibility to the FPGA.
120 Citations
12 Claims
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1. A method of making and configuring a mask-configured logic cell array configured to emulate the logical operations of a user-configured logic cell array during normal mode operations, comprising the steps of:
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providing a netlist describing the configuration of the user-configured logic cell array, the netlist including a plurality of logic blocks each including a plurality of logic gates present on the user-configured logic cell array; and configuring the mask-configured logic cell array according to the netlist without a logic simulation to verifying functionality of the configured mask-configured logic cell array, the mask configured logic cell array including a plurality of logic gate clusters placed and routed to correspond one-to-one to used logic blocks of the user-configured logic cell array, each cluster being a plurality of logic gates having physical proximity, but not including at least some logic gate clusters corresponding to unused logic blocks on the user configured logic cell array. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A mask-configured integrated circuit chip in its configured state to be substituted for a user-configured integrated circuit chip, the mask-configured integrated circuit chip in its configured state being pin compatible with the user configured integrated circuit chip, and comprising:
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a plurality of configured mask-configured routing lines for routing signals previously routed by pass transistors and line segments of the user-configured integrated circuit chip; and a plurality of cluster groups of logic elements, each cluster group of elements corresponding to a user-configured logic block in the user-configured integrated circuit chip, wherein the functions of each logic block in the user-configured integrated circuit chip are carried out in a corresponding configured clustered group of logic elements in the mask-configured integrated circuit, each gate in each clustered group being placed and routed to have physical proximity to all other gates in the clustered group, and at least one unused logic gate in a logic block of the user-configured integrated circuit chip not being replicated in the corresponding clustered group. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification