Micro-machined accelerometer array with shield plane

• US 5,551,293 A
• Filed: 06/07/1995
• Issued: 09/03/1996
• Est. Priority Date: 10/12/1990
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Sampsell, Jeffrey B., Boysel, Robert M.
• Primary Examiner(s): Williams, Hezron E.
• Assistant Examiner(s): Oda, Christine K.
• Application Number:
  US08/485,170
• Time in Patent Office: 454 Days
• Field of Search: 200/61.45 R, 200/61.48, 200/61.49, 200/61.51, 200/61.53, 73/651, 73/652, 73/514.14, 73/514.01, 73/514.16, 73/514.36, 73/514.37, 73/514.38
• US Class Current: 73/514.14
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/135 by making use of contacts which are actuated by a movable inertial mass

Abstract

An accelerative force may be measured using a plurality of deflection elements (102), each deflection element (102) comprising an inertial mass (104), and at least one hinge (104) supporting the inertial mass (104) in a normal position. Application of a force to inertial mass (104) will result in the deflection of the inertial mass (104) in a first direction out of the normal position. The movement of the inertial mass (104) from the normal position stores energy in the hinges (108) which tends to move the inertial mass (104) in a second direction back to its normal position. Either the mass of the inertial mass (104), or the compliance of the hinges (108) is varied from one deflection element (102) in the array to another so that the force applied to the inertial masses (104) by simultaneous acceleration of the deflection elements (102) deflects some of the inertial masses (104). A detection means (112) senses if inertial masses (104) have deflected and produces an output representative of the applied force.

Claims

1. An accelerometer array comprising:

a plurality of deflection elements, each one of said deflection elements comprising

an inertial mass, and

at least one hinge supporting said inertial mass in a normal position, deflection of said inertial mass occurring as movement of said inertial mass in a first direction out of said normal position by a force applied thereto, said movement storing energy in said at least one hinge,

at least one component selected from the group consisting of said inertial mass and said at least one hinge being different from one of said deflection elements to another in said accelerometer array so that said force applied to said inertial masses by simultaneous acceleration of said plurality of deflection elements deflects some of said inertial masses, respective discrete ranges of acceleration causing the deflection of different respective combinations of said inertial masses;

an electrical circuit for detecting which combinations of said inertial masses deflect and for producing a sensible output representative thereof; and

a shield plane between said electrical circuit and said plurality of deflection elements.

2. The accelerometer array of claim 1 wherein said electrical circuit is a CMOS circuit.

3. The accelerometer array of claim 1 wherein said electrical circuit comprises a contact electrode associated with each one of said deflection elements, said electrical circuit detecting contact between said inertial mass and said associated contact electrode.

4. The accelerometer array of claim 3 wherein said contact electrode is an aluminum alloy.

5. The accelerometer array of claim 1 wherein said at least one hinge is an aluminum alloy.

6. The accelerometer array of claim 1 wherein said at least one hinge is a tungsten alloy.

7. The accelerometer array of claim 1 wherein said inertial mass is an aluminum alloy.

8. The accelerometer array of claim 1 wherein said inertial mass is a tungsten alloy.