×

Method of calibrating a three-dimensional optical measurement system

  • US 5,557,410 A
  • Filed: 06/06/1995
  • Issued: 09/17/1996
  • Est. Priority Date: 05/26/1994
  • Status: Expired due to Term
First Claim
Patent Images

1. A method for calibrating a three-dimensional optical measurement system, said method comprising the steps of:

  • mechanically measuring three-dimensional coordinates at each of a plurality of points on a surface of a three-dimensional test calibration fixture;

    placing said test calibration fixture into the field of view of said optical measurement system;

    optically acquiring a set of data representing the phase at each of a plurality of pixels corresponding to said optical measurement system'"'"'s view of the surface of said test calibration fixture;

    for both the mechanically measuring step and the optically acquiring step, calculating the intersection point of three faces on said surface to uniquely define an accurate correlation between three-dimensional coordinate position and measured phase at that location; and

    using an optimization procedure, calculating parameters of said three-dimensional optical measurement system, so as to minimize the difference between intersection point coordinates calculated from the mechanically measuring step and intersection point coordinates calculated from the optically acquiring step; and

    fixing said parameters based upon the results of the optimization procedure.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×