Method and apparatus for inspecting electrical connections

• US 5,561,696 A
• Filed: 05/02/1995
• Issued: 10/01/1996
• Est. Priority Date: 10/30/1987
• Status: Expired due to Term

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Baker, Bruce D., Adams, John A., Corey, Robert L., Ross, Edward W.
• Primary Examiner(s): WONG, DON KITSUN
• Application Number:
  US08/433,230
• Time in Patent Office: 518 Days
• Field of Search: 378/98.2, 378/98, 378/98.3, 378/9, 378/11, 378/10, 378/21, 378/25, 378/24, 378/146, 378/58, 378/57, 378/62, 378/901
• US Class Current: 378/58
• CPC Class Codes: G01N 23/043 using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
• CPC Class Codes: G01N 23/044 using laminography or tomosynthesis
• CPC Class Codes: G01R 31/302 Contactless testing G01R31/66 takes precedence
• CPC Class Codes: G01R 31/304 of printed or hybrid circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence

Abstract

A method and apparatus which incorporate self learning techniques for the detection of solder defects and for statistical process control of solding operations on printed circuit board assemblies (PCBA) are disclosed. The invention includes learning techniques which are used during the inspection of cross-sectional X-ray images of solder joints. These learning techniques improve measurement accuracy by accounting for localized shading effects, which can occur when inspecting double-sided printed circuit board assemblies. Two specific examples are discussed. The first is a method for detection of solder short defects. The second method utilizes learning to improve the accuracy of statistical process control (SPC) measurements.

Claims

1. An electrical connection inspection device comprising:

a source of x-rays which emits x-rays through an electrical connection from a plurality of positions;

an x-ray detector system positioned to receive x-rays produced by said source of x-rays which have penetrated the electrical connection, said x-ray detector system further comprising an output which emits data signals corresponding to an x-ray image of the electrical connection produced by the x-rays received and detected by said x-ray detector after penetrating the electrical connection; and

an analysis system comprising;

an image memory which combines said detector data signals to form an image database which contains information sufficient to form a cross-sectional image of a cutting plane of said electrical connection; and

an image processor which analyzes said image database to determine a measure of the quality of the electrical connection.

2. A device as defined in claim 1 wherein said source of x-rays comprises a plurality of x-ray sources.

3. A device as defined in claim 1 wherein said x-ray detector system comprises a plurality of x-ray detectors.

4. A device as defined in claim 1 wherein said analysis system further comprises an image section which produces said cross-sectional image of a cutting plane of said electrical connection from said image database.

5. A method of determining the quality of an electrical connection comprising the steps of:

directing x-rays through said electrical connection from a plurality of positions;

detecting x-rays transmitted through said electrical connection from said plurality of positions with an x-ray detector system having an output which emits data signals corresponding to an x-ray image of the electrical connection produced by x-rays received and detected by said x-ray detector after penetrating the electrical connection;

storing said x-ray detector data signals corresponding to said x-ray image of the electrical connection;

creating a database of information from said x-ray detector data signals which contains information sufficient to form a cross-sectional image of a cutting plane of the electrical connection; and

performing predetermined analytical tests on said database of information to determine a measure of the quality of the electrical connection.