Electrical contact to the common electrode of an infrared detector array

• US 5,565,682 A
• Filed: 06/07/1995
• Issued: 10/15/1996
• Est. Priority Date: 03/01/1995
• Status: Expired due to Term

• Current Assignee: L-3 Communications Corporation (L3Harris Technologies, Inc.)
• Original Assignee: Texas Instruments, Inc.
• Inventors: Owen, Robert A., Belcher, James F., Kyle, Robert J. S., Frank, Steven N., Stanford, Charles E.
• Primary Examiner(s): Fields, Carolyn E.
• Assistant Examiner(s): Glick, Edward J.
• Application Number:
  US08/475,959
• Time in Patent Office: 496 Days
• Field of Search: 250/338.1, 250/338.3, 250/332, 250/349
• US Class Current: 250/338.1
• CPC Class Codes: G01J 5/34 using capacitors, e.g. pyroelectric capacitors
• CPC Class Codes: H10N 15/10 Thermoelectric devices using thermal change of the dielectric constant, e.g. working above and below the Curie point
• CPC Class Codes: Y10S 438/928 Front and rear surface processing
• CPC Class Codes: Y10T 29/435 Solid dielectric type
• CPC Class Codes: Y10T 29/49155 Manufacturing circuit on or in base

Abstract

A system for infrared sensing has thermally sensitive picture elements within a substrate; bias contact areas within the substrate and around a periphery of the thermally sensitive picture elements; a common electrode on a front side of the thermally sensitive picture elements and the bias contact areas; an optical coating on top of the common electrode; a first electrical contact metal on a backside of the thermally sensitive picture elements; and a second electrical contact metal connected to the bias contact areas on a backside of the bias contact areas and electrically connected to the common electrode. The bias contact areas may include a conductive substrate area. In addition, the device may be connected to an integrated circuit by an ohmic connection to the first and/or the second electrical contact metal.

Claims

1. An infrared sensing device, said device comprising:

thermally sensitive picture elements within a substrate;

bias contact areas within said substrate and around a periphery of said thermally sensitive picture elements;

a common electrode on a front side of said thermally sensitive picture elements and said bias contact areas;

an optical coating on top of said common electrode;

a first electrical contact metal on a backside of said;

thermally sensitive picture elements; and

a second electrical contact metal connected to said bias contact areas on a backside of said bias contact areas and electrically connected to said common electrode.

2. The device of claim 1, wherein said bias contact areas include a conductive substrate area.

3. The device of claim 1, wherein said device is connected to an integrated circuit by an ohmic connection to said second electrical contact metal.

4. The device of claim 1, wherein said device is connected to an integrated circuit by an ohmic connection to said first electrical contact metal.

5. An infrared detector, said detector comprising:

thermally sensitive picture elements within a substrate;

bias contact areas within said substrate and around a periphery of said thermally sensitive picture elements wherein said bias contact areas include a conductive substrate area;

a common electrode on a front side of said thermally sensitive picture elements and said bias contact areas;

an optical coating on top of said common electrode;

a first electrical contact metal on a backside of said thermally sensitive picture elements and

a second electrical contact metal connected to exposed portions of said bias contact areas on a backside of said bias contact areas and electrically connected to said common electrode.

6. The detector of claim 5, wherein said detector is connected to an integrated circuit by an ohmic connection to said first electrical contact metal.

7. The detector of claim 5, wherein said detector is connected to an integrated circuit by ohmic connection to said second electrical contact metal.