Probe apparatus having burn-in test function
First Claim
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1. A probe apparatus having a burn-in test function, comprising:
- an apparatus body;
probe card means, having a plurality of probes, for causing said plurality of probes to directly electrically contact a plurality of electrode pads of at least one semiconductor chip included in a semiconductor wafer before cutting into semiconductor chips;
means for measuring electrical characteristics of the at least one semiconductor chip of the semiconductor wafer;
thermal stress means for applying a thermal stress to the wafer;
electrical stress means for applying an electrical stress to a test target chip through corresponding probes of said probe card means; and
measuring means for measuring an electrical parameter of the test target chip on the wafer to which a predetermined thermal and electrical stress is applied.
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Abstract
A probe apparatus having a burn-in test function includes an apparatus body, a probe card, having a plurality of probes, for causing the plurality of probes to electrically contact a semiconductor wafer, a tester for measuring the electrical characteristics of the semiconductor wafer, heating and cooling mechanisms for applying a thermal stress to test target chips, as targets of the burn-in test, of the semiconductor wafer, and an electrical mechanism for applying an electrical stress to the chips.
122 Citations
22 Claims
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1. A probe apparatus having a burn-in test function, comprising:
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an apparatus body; probe card means, having a plurality of probes, for causing said plurality of probes to directly electrically contact a plurality of electrode pads of at least one semiconductor chip included in a semiconductor wafer before cutting into semiconductor chips; means for measuring electrical characteristics of the at least one semiconductor chip of the semiconductor wafer; thermal stress means for applying a thermal stress to the wafer; electrical stress means for applying an electrical stress to a test target chip through corresponding probes of said probe card means; and measuring means for measuring an electrical parameter of the test target chip on the wafer to which a predetermined thermal and electrical stress is applied. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A probe apparatus having a burn-in test function, comprising:
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an apparatus body; probe card means, having a plurality of probes, for causing said plurality of probes to directly electrically contact a plurality of electrode pads of at least one semiconductor chip included in a semiconductor wafer before cutting into semiconductor chips; means for measuring electrical characteristics of the at least one semiconductor chip of the semiconductor wafer; thermal stress means for applying a thermal stress to the wafer; electrical stress means for applying an electrical stress to a test target chip through corresponding probes of said probe card means; power supply means for applying a power supply voltage to the test target chip; measuring means for measuring an electrical parameter of the test target chip on the wafer to which a predetermined thermal and electrical stress is applied; current monitor means for measuring a current flowing from said power supply means to the burn-in test target chip and outputting one of a current cutoff signal and a current decrease signal when a current measurement value exceeds a preset value; and current control means for one of cutting off and decreasing the current flowing in the test target chip by the current cutoff signal sent from said current monitor means. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification