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System for automatically testing an electronic device during quiescent periods

  • US 5,579,234 A
  • Filed: 03/11/1994
  • Issued: 11/26/1996
  • Est. Priority Date: 03/11/1994
  • Status: Expired due to Term
First Claim
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1. A method of testing a plurality of circuits in an electronic system having an active mode of operation and a quiescent mode of operation, comprising the steps of:

  • determining if the electronic system is in a quiescent mode of operation;

    testing an operation of at least a first circuit if the electronic system is in the quiescent mode of operation, the testing of the first circuit being impractical during a non-quiescent mode of operation of the electronic system;

    storing the results of the tested operation of the first circuit; and

    providing a first indication to an operator of the electronic system if the tested operation of the first circuit is unacceptable.

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