Digital magnetoresistive sensor based on the giant magnetoresistance effect

• US 5,585,986 A
• Filed: 05/15/1995
• Issued: 12/17/1996
• Est. Priority Date: 05/15/1995
• Status: Expired due to Term

• Current Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Original Assignee: International Business Machines Corporation
• Inventors: Parkin, Stuart S. P.
• Primary Examiner(s): EVANS, JEFFERSON A
• Application Number:
  US08/441,133
• Time in Patent Office: 582 Days
• Field of Search: 360/110, 360/113, 360/126, 324/252, 338/32 R, 428/212, 428/213, 428/611, 428/693
• US Class Current: 428/811.3
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: B82Y 25/00 Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
• CPC Class Codes: G11B 19/02 Control of operating function, e.g. switching from recording to reproducing
• CPC Class Codes: G11B 2005/3996 large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
• CPC Class Codes: G11B 5/00 Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor G11B11/00 and G11B13/00 take precedence
• CPC Class Codes: G11B 5/012 Recording on, or reproducing or erasing from, magnetic disks G11B17/00, G11B19/00 take precedence
• CPC Class Codes: G11B 5/09 Digital recording
• CPC Class Codes: G11B 5/3903 using magnetic thin film layers or their effects, the films being part of integrated structures
• CPC Class Codes: G11B 5/4886 relative to rotating disc
• CPC Class Codes: G11B 5/596 for track following on disks G11B5/5526, G11B5/5552, G11B5/5565, G11B5/5582 take precedence
• CPC Class Codes: G11C 11/5607 using magnetic storage elements
• CPC Class Codes: H01F 10/3281 only by use of asymmetry of the magnetic film pair itself, i.e. so-called pseudospin valve [PSV] structure, e.g. NiFe/Cu/Co
• CPC Class Codes: H10N 50/85 Magnetic active materials
• CPC Class Codes: Y10T 428/1129 Super lattice [e.g., giant magneto resistance [GMR] or colossal magneto resistance [CMR], etc.]
• CPC Class Codes: Y10T 428/12465 having magnetic properties, or preformed fiber orientation coordinate with shape
• CPC Class Codes: Y10T 428/24942 including components having same physical characteristic in differing degree
• CPC Class Codes: Y10T 428/2495 Thickness [relative or absolute]

Abstract

A magnetoresistive (MR) sensor based on the giant magnetoresistance (GMR) effect provides a digital output signal. The multilayer stack of alternating ferromagnetic layers and nonferromagnetic metal spacer layers in the GMR sensor has an essentially single crystalline structure so that each of the ferromagnetic layers exhibits uniaxial magnetic anisotropy, i.e. the magnetic moments of the ferromagnetic layers can lie only parallel or antiparallel to a single axis. Unlike GMR multilayers where all of the magnetic moments are affected simultaneously by the external magnetic field, in the present GMR sensor each ferromagnetic layer has its magnetic moment responsive to an external magnetic field strength that is different from the magnetic field strengths at which the magnetic moments of the other ferromagnetic layers are responsive. This allows each ferromagnetic layer to switch its magnetization direction from parallel to antiparallel, or vice versa, independently of the other ferromagnetic layers. This unique property of each ferromagnetic layer is accomplished by either selecting each ferromagnetic layer to have a different uniaxial magnetic anisotropy energy, such as by varying the strain during crystalline growth, or by subjecting each ferromagnetic layer to a different value of antiferromagnetic exchange coupling energy, such as by varying the thicknesses of the nonferromagnetic metal spacer layers. As a result, the resistance of the GMR sensor changes in stepped increments as the external magnetic field is varied, thereby providing a digital signal output. The digital GMR sensor can be used as a read head in a multiple data layer magnetic recording data storage system. In one disk drive embodiment, the magnetic recording disk has two magnetically isolated and decoupled magnetic data layers. The digital GMR sensor reads the written data bits from both data layers simultaneously, and it'"'"'s digital output signal is then decoded by conventional logic circuitry to provide the separate data recorded in each of the data layers.

Claims

1. A magnetoresistive sensor comprising:

a substrate; and

a multilayer stack of alternating ferromagnetic layers and nonferromagnetic metal spacer layers formed on the substrate, the stack having at least three of the ferromagnetic layers,

wherein each of the ferromagnetic layers is antiferromagnetically coupled to a neighboring ferromagnetic layer across an adjacent spacer layer and has its magnetization aligned antiparallel to the magnetization of a neighboring ferromagnetic layer in the absence of an external magnetic field, and

wherein each of the ferromagnetic layers exhibits substantially uniaxial magnetic anisotropy and has its magnetization switchable from said antiparallel alignment to parallel alignment at an external magnetic field strength that is different from the magnetic field strength at which the magnetizations of the other ferromagnetic layers are switchable;

whereby the sensor exhibits discrete steps of decreasing electrical resistance in response to an increasing external magnetic field.

2. A magnetoresistive sensor as in claim 1 wherein the substrate has an essentially 110 crystalline face onto which the multilayer stack is formed.

3. A magnetoresistive sensor as in claim 2 wherein the substrate is MgO.

4. A magnetoresistive sensor as in claim 1 further comprising a seed layer formed directly on the substrate between the substrate and the multilayer stack.

5. A magnetoresistive sensor as in claim 4 wherein the seed layer comprises a first film of iron formed directly on the substrate and a second film of platinum formed directly on the iron film.

6. A magnetoresistive sensor as in claim 1 wherein the ferromagnetic layers consist essentially of permalloy.

7. A magnetoresistive sensor as in claim 1 wherein the spacer layers consist essentially of copper.

8. A magnetoresistive sensor as in claim 1 wherein each of the ferromagnetic layers has a magnetic anisotropy different from the magnetic anisotropies of the other ferromagnetic layers.

9. A magnetoresistive sensor as in claim 1 wherein the antiferromagnetic coupling field strength of any pair of neighboring ferromagnetic layers is different from the antiferromagnetic coupling field strength of all other pairs of neighboring ferromagnetic layers.

10. A magnetoresistive sensor as in claim 1 wherein each of the spacer layers has a thickness different from the thicknesses of the other spacer layers.

11. A magnetoresistive sensor as in claim 1 further comprising a bias layer in contact with the ferromagnetic layer nearest or farthest from the substrate for fixing the magnetization of said nearest or farthest ferromagnetic layer.

12. A magnetoresistive sensor as in claim 1 further comprising a sensing circuit for converting the electrical resistance of the sensor to a voltage signal.

13. A magnetoresistive sensor comprising:

a substrate having an essentially single crystalline face;

a seed layer formed on the crystalline face of the substrate; and

a multilayer stack of alternating permalloy layers and copper spacer layers formed on the seed layer, the stack having at least three of the permalloy layers and two of the copper spacer layers with neighboring permalloy layers being antiferromagnetically coupled to one another across an intermediate copper spacer layer,

wherein each of the permalloy layers has its magnetic moment aligned antiparallel to the magnetic moment of a neighboring permalloy layer in the absence of an external magnetic field, and

wherein each of the permalloy layers has a substantially uniaxial magnetic anisotropy different from the magnetic anisotropies of the other permalloy layers;

whereby the magnetic moment of each permalloy layer is switchable from said antiparallel alignment to parallel alignment at an external magnetic field strength that is different from the magnetic field strength at which the magnetic moments of the other permalloy layers are switchable, the sensor thereby exhibiting discrete steps of decreasing electrical resistance in response to an increasing external magnetic field.

14. A magnetoresistive sensor as in claim 13 wherein the substrate has a 110 crystalline face.

15. A magnetoresistive sensor as in claim 14 wherein the substrate is MgO.

16. A magnetoresistive sensor as in claim 13 wherein the seed layer comprises a first film of iron formed directly on the substrate and a second film of platinum formed directly on the iron film.

17. A magnetoresistive sensor as in claim 13 further comprising a bias layer in contact with the ferromagnetic layer either nearest or farthest from the substrate for fixing the magnetization of said nearest or farthest ferromagnetic layer.

18. A magnetoresistive sensor as in claim 13 further comprising a sensing circuit for converting the electrical resistance of the sensor to a voltage signal.