Fault diagnosis device

• US 5,587,930 A
• Filed: 07/24/1991
• Issued: 12/24/1996
• Est. Priority Date: 07/24/1990
• Status: Expired due to Fees

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Inventors: Hori, Satoshi, Sakagami, Makoto, Omori, Teruyo
• Primary Examiner(s): Trammell, James P.
• Assistant Examiner(s): Wachsman, Hal D.
• Application Number:
  US07/739,591
• Time in Patent Office: 1,980 Days
• Field of Search: 364/550, 364/551.01, 364/580, 395/911-918, 371/15.1, 371/25.1, 371/20.1, 371/11.3
• US Class Current: 702/185
• CPC Class Codes: G01M 99/00 Subject matter not provided for in other groups of this subclass
• CPC Class Codes: G07C 3/00 Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
• CPC Class Codes: Y10S 706/911 Nonmedical diagnostics
• CPC Class Codes: Y10S 706/912 Manufacturing or machine, e.g. agricultural machinery, machine tool
• CPC Class Codes: Y10S 706/914 Process plant
• CPC Class Codes: Y10S 706/915 Power plant

Abstract

A fault diagnosis device searches for causes of fault of a device under test via a fault tree having a tree structure corresponding to the hardware organization of the device under test, where the nodes of the fault tree correspond to the units of the device under test. Some of the nodes including the root node have three or more child nodes. A test table associated with each node other than a leaf includes: a description of parameters to be detected by detector units; test conditions with respect to the parameters detected by the detector units; and fault probability table representing the fault probability values and the child node names corresponding to the respective patterns of results of the tests. The whole fault tree may be divided into a main fault tree stored in the main memory and fault branch trees stored in auxiliary memory. Then, the fault branch trees are loaded into the main memory when needed.

Claims

1. A fault diagnosis device for determining a cause of fault of a device under test, comprising:

detector means for detecting parameters of a device under test;

memory means;

a fault tree stored in said memory means and having nodes corresponding to respective sub-units of said device under test, whereby said fault tree has a tree structure corresponding to a hardware organization of said device under test;

test tables stored in said memory and associated with respective nodes of said fault tree, each test table including;

a description of at least one parameter to be detected by said detector means;

at least one test condition with respect to the parameter detected by said detector means; and

a fault probability table representing fault probabilities and names of child nodes corresponding to respective results of said test condition; and

search/inference means for searching for and determining a cause of fault of said device under test in accordance with said fault tree and said test tables;

wherein at least one of said nodes has at least three child nodes and the test table associated with the node having at least three child nodes includes;

a description of at least two parameters to be detected by said detector means;

at least two test conditions with respect to the two parameters detected by said detector means; and

a fault probability table representing fault probabilities and names of child nodes corresponding to respective patterns of results of said test conditions.

2. A fault diagnosis device as claimed in claim 1, wherein a root node of said fault tree has at least three child nodes.

3. A fault diagnosis device as claimed in claim 1, wherein said memory means comprises a main memory and a auxiliary memory, and said fault tree is divided into a main fault tree stored in said main memory and fault branch trees stored in the auxiliary memory, said search/inference means loading a fault branch tree into the main memory when necessary.