Circuit and method for testing a disk drive head assembly without probing

• US 5,589,777 A
• Filed: 06/21/1995
• Issued: 12/31/1996
• Est. Priority Date: 06/21/1995
• Status: Expired due to Term

• Current Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.), Philips Electronics NV (Koninklijke Philips N.V.)
• Original Assignee: Hewlett-Packard Company (HP Inc.), Philips Electronics NV (Koninklijke Philips N.V.)
• Inventors: Gamand, Patrice, Voorman, Johannes O., Davis, Bradley K., Ramalho, Joao N. V. L.
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US08/493,384
• Time in Patent Office: 559 Days
• Field of Search: 324/210, 324/212, 324/537, 324/538, 324/546, 324/763, 324/764, 324/691, 324/713, 360/46, 360/67, 369/53, 369/55, 371/22.5, 371/22.6, 29/593, 364/481-483, 364/580
• US Class Current: 324/537
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58
• CPC Class Codes: G06F 11/2221 to test input/output devices or peripheral units
• CPC Class Codes: G11B 2005/0016 of magnetoresistive transducers
• CPC Class Codes: G11B 5/40 Protective measures on heads, e.g. against excessive temperature G11B5/31 takes precedence; protection against wear G11B5/255 ; protective structure of the head: see under structures, e.g. G11B5/3106
• CPC Class Codes: G11B 5/455 Arrangements for functional testing of heads; Measuring arrangements for heads
• CPC Class Codes: G11B 5/4806 specially adapted for disk drive assemblies, e.g. assembly prior to operation, hard or flexible disk drives G11B5/488 - G11B5/54 take precedence

Abstract

A preamplifier circuit for a computer data storage system disk drive read/write head (or HSA) includes multiple test modes to enable electrical testing of the preamplifier, the read/write heads, and associated circuitry without physically probing the components or circuitry. Communication between the preamplifier and a host controller provides for test mode selection and test mode enablement within the preamplifier. Testing occurs using only the normal interface connector to the head disk assembly (HDA) in which the preamplifier and HSA are embodied. Properties such as electrical resistance, ESD, preamplifier bond wire connection integrity, head bond wire and solder joint integrity, and connections from the head slider to the preamplifier leads are all tested. Testing occurs without probing to provide efficient, reliable, and cost effective manufacturing and testing benefits of the read/write heads, flex assembly, HSA, and HDA.

Claims

1. A preamplifier circuit for a data storage system, the data storage system including at least one read head element and at least one write head element, the preamplifier circuit comprising:

(a) means for forcing a write current generated by preamplifier circuit through the at least one write head element, the write current being responsive to a write data signal received and processed by the preamplifier circuit;

(b) means for presenting a read data signal at an output means of the preamplifier circuit, the read data signal being responsive to a read current generated by the preamplifier circuit through the at least one read head element;

(c) input means for receiving a test mode signal indicative of a test mode for identifying and initiating testing of selected circuitry associate with the preamplifier circuit or the data storage system;

(d) means, electrically connected to the input means, responsive to the test mode signal for initiating a controlled test current in the identified selected circuitry; and

,

(e) means for presenting an output signal at the output means of the preamplifier circuit, the output signal being responsive to the controlled test current and indicative of electrical properties, including resistance, of the identified selected circuitry.

2. The preamplifier circuit of claim 1 wherein the selected circuitry is selected from the group consisting of the at least one read head element, the at least one write head element, and peripheral circuitry associated with either head element.

3. The preamplifier circuit of claim 2 wherein the at least one read head element is a dual magnetoresistive (MR) head element, and wherein the preamplifier circuit further includes means for initiating, selectively:

(a) equal, controlled test currents in the dual MR elements; and

,

(b) unequal, controlled test currents in the dual MR elements.

4. The preamplifier circuit of claim 1 wherein the input means includes at least one memory register, for receiving and storing the test mode signal, the register being connected to a communication interface terminal.

5. The preamplifier circuit of claim 1 wherein the means for initiating the controlled test current includes:

(a) at least one memory register for storing a control word indicative of a digital test current signal;

(b) at least one digital to analog converter for converting the digital test current signal to the controlled test current; and

,

(c) at least one multiplexor for multiplexing the controlled test current to the selected circuitry.

6. The preamplifier circuit of claim 1 wherein the means for presenting an output signal at the output means includes circuitry connecting at least one signal line associated with the selected circuitry to the output means, and wherein the output means includes an electrical contact terminal for each signal line respectively.

7. The preamplifier circuit of claim 1 wherein the output signal is selected from the group consisting of a current, a voltage, and a representation of a current or voltage.

8. A system for electrically testing selected circuitry in a data storage system having a preamplifier circuit, the system comprising:

(a) means for forcing a write current through at least one write head element of the data storage system, the write current being generated by the preamplifier circuit in response to a write data signal received and processed by the preamplifier circuit;

(b) means for sensing a read data signal responsive to a read current generated by the preamplifier circuit through at least one read head element of the data storage system;

(c) input means electrically connected to the preamplifier circuit for receiving a test mode signal indicative of a test mode for identifying and initiating testing of the selected circuitry;

(d) means, electrically connected to the input means, responsive to the test mode signal for initiating a first controlled test current in the identified selected circuitry;

(e) means for sensing a first output signal responsive to the first controlled test current initiated in the identified selected circuitry; and

,

(f) means for determining an electrical property, including resistance, of the identified selected circuitry based on the first output signal sensed.

9. The system of claim 8 wherein the selected circuitry is selected from the group consisting of the at least one read head element, the at least one write head element, and peripheral circuitry associated with either head element.

10. The system of claim 9 wherein the at least one read head element is a dual magnetoresistive (MR) head element, and wherein the system further includes means for initiating, selectively:

(a) equal, controlled test currents in the dual MR elements; and

,

(b) unequal, controlled test currents in the dual MR elements.

11. The system of claim 10 further including compare means for comparing a referenced output signal resulting from the equal, controlled test currents, with a referenced output signal resulting from the unequal, controlled test currents.

12. The system of claim 8 wherein the input means includes at least one memory register for receiving and storing the test mode signal, the register being connected to a communication interface terminal.

13. The system of claim 8 wherein the means for initiating the controlled test current includes:

(a) at least one memory register for storing a control word indicative of a digital test current signal;

(b) at least one digital to analog converter for converting the digital test current signal to the controlled test current; and

,

(c) at least one multiplexor for multiplexing the controlled test current to the selected circuitry.

14. The system of claim 8 wherein the means for sensing a first output signal includes voltmeter or multimeter circuitry means for sensing at least one signal lines associated with the first selected circuitry being tested.

15. The system of claim 8 wherein the electrical property determined further includes a property selected from the group consisting of continuity, electrostatic discharge damage, bond wire connection integrity, solder joint integrity, and peripheral circuitry connection integrity.

16. The system of claim 8 further including:

(a) means for initiating a second controlled test current in the selected circuitry; and

(b) compare means for comparing a first resultant electrical property determined from the output signal of the first controlled current with a second resultant electrical property determined from an output signal of the second controlled current.

17. A method for electrically testing selected circuitry in a component of a data storage system, the data storage system having a preamplifier circuit electrically connected to the selected circuitry in the component of the data storage system, and wherein the preamplifier circuit includes input and output signal interface means, the method comprising:

(a) receiving a test mode signal through the input signal interface means of the preamplifier circuit for activating a test mode and for identifying the selected circuitry to be tested;

(b) initiating in response to said test mode signal a first controlled test current in the identified selected circuitry; and

,

(c) presenting a first output signal at the output signal interface means of the preamplifier circuit for evaluation of an electrical property of the identified selected circuitry, including resistance, the first output signal being responsive to the first controlled test current initiated in the identified selected circuitry, wherein the component of the data storage system is, selectively, a flex assembly, head stack assembly, or head disk assembly.

18. The method of claim 17 wherein the selected circuitry is selected from the group consisting of a disk drive read head element, a write head element, and peripheral circuitry associated with either head element.

19. The method of claim 18 wherein the read head element is a dual magnetoresistive (MR) head element, and wherein the method further includes initiating, selectively:

(a) equal, controlled test currents in the dual MR elements; and

,

(b) unequal, controlled test currents in the dual MR elements; and

further including comparing a first referenced output signal resulting from the equal, controlled test currents, with a second referenced output signal resulting from the unequal, controlled test currents.

20. The method of claim 17 further including initiating a second controlled test current in the selected circuitry, and comparing a first resultant electrical property determined from the first output signal associated with the first controlled test current, with a resultant electrical property determined from a second output signal associated with the second controlled test current.