Method for creating an in-circuit test for an electronic device

• US 5,590,136 A
• Filed: 01/25/1995
• Issued: 12/31/1996
• Est. Priority Date: 01/25/1995
• Status: Expired due to Term

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Firooz, Kamran
• Primary Examiner(s): Beausoliel, Jr., Robert W.
• Assistant Examiner(s): TU, CHRISTINE TRINH LE
• Application Number:
  US08/378,224
• Time in Patent Office: 706 Days
• Field of Search: 371/25.1, 371/22.5, 371/22.6, 371/27, 371/24, 371/22.4, 371/22.1
• US Class Current: 714/736
• CPC Class Codes: G01R 31/2843 In-circuit-testing

Abstract

In an automated test equipment system for testing a circuit board containing a plurality of interconnected digital devices, an in-circuit test is created for a device under test based on stimuli used to test devices which drive the device under test. The method includes the steps of determining, from the electrical interconnect data for the devices on the circuit board, which devices have an output driving an input of the device under test; testing each of the driving devices; observing the response of the device under test during testing of the driving devices; and using the test stimuli for the driving devices and the observed response of the device under test as an in-circuit test for the device under test.

Claims

1. In an automated test equipment system for testing a circuit board containing a plurality of interconnected digital devices, a method for generating an in-circuit test for a device under test, the method comprising the steps of:

(a) determining, from electrical interconnect data for the devices on the circuit board, each device that has an output driving an input of the device under test;

(b) conducting an in-circuit test for each of said driving devices using test stimuli;

(c) observing a first response of said device under test during said in-circuit test of said driving devices; and

(d) using said test stimuli used for said driving devices and said first observed response of said device under test as an in-circuit test for said device under test.

2. The method of claim 1, wherein said in-circuit test of said step (b) comprises the steps of:

(1) applying said test stimuli to inputs of each driving device;

(2) observing outputs of each driving device; and

(3) comparing, for each driving device, said observed outputs of said driving device to expected outputs.

3. The method of claim 1, wherein said step (d) of using comprises the steps:

(1) applying said test stimuli to inputs of each driving device;

(2) observing a second response of said device under test; and

(3) comparing said second observed response of said device under test from step (2) to said first observed response of said device under test from step (c).

4. A method for generating an in-circuit test for a plurality of digital devices on a printed circuit board using an automated test equipment system, the method comprising the steps of:

(a) retrieving a test routine from a device models library for as many digital devices on the printed circuit board as possible; and

(b) for a remaining device on the circuit board for which no test model is present in said device models library

(1) determining from electrical interconnect data for the devices on the circuit board each device that has an output driving an input of said remaining device,

(2) conducting an in-circuit test for each of said driving devices using test stimuli;

(3) observing a first response of said remaining device during said in-circuit test of said driving devices, and

(4) using said test stimuli used for said drying devices and said first observed response of said remaining device as an in-circuit test for said remaining device.

5. The method of claim 4, wherein said in-circuit test of said step (b)(2) comprises the steps of:

i) applying said test stimuli to inputs of each driving device;

ii) observing outputs of each drying device; and

iii) comparing, for each driving device, said observed outputs of said driving device to expected outputs.

6. The method of claim 4, wherein said step (b)(4) of using comprises the steps of:

i) applying said test stimuli to inputs of each driving device;

ii) observing a second response of said remaining device; and

iii) comparing said second observed response of said remaining device from step (ii) to said first observed response of said remaining device from step (b)(3).