Diagnosing problems in an electrical system by monitoring changes in nonlinear characteristics

• US 5,594,439 A
• Filed: 08/24/1994
• Issued: 01/14/1997
• Est. Priority Date: 08/24/1994
• Status: Expired due to Term

• Current Assignee: Cirrus Logic Incorporated
• Original Assignee: Crystal Semiconductor Corporation (Cirrus Logic Incorporated)
• Inventors: Swanson, Eric J.
• Primary Examiner(s): DeBoer, Todd
• Application Number:
  US08/295,451
• Time in Patent Office: 874 Days
• Field of Search: 341/94, 341/118, 341/120, 341/121, 341/115, 341/140, 324/626, 324/601, 324/624, 324/620
• US Class Current: 341/118
• CPC Class Codes: H03M 1/1076 Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit

Abstract

Abnormal changes in the non-linear characteristics of electronic components are an indication of abnormal conditions such as impending component or system failure. To detect such abnormal changes in nonlinearity, an electronic circuit is subjected to a calibration signal including at least one frequency component. Nonlinearity in the electronic circuit causes distortion components to be generated from the calibration signal. Preferably the nonlinearity is characterized by compensation coefficients that digitally compensate the nonlinearity. The compensation coefficients are adjusted in a feedback loop in response to measured values of the distortion components, so that the distortion components are minimized. At the end of the adjustment process, the transfer function of the electronic circuit is specified by the compensation coefficients, which are stored in memory. The compensation coefficients are compared to respective limits to detect abnormal nonlinearity, and any abnormal nonlinearity is reported to a human operator or to a diagnostic computer. At various times, the measurement process is repeated, and the new values of the compensation coefficients are again compared to their respective limits as well as to their previous values stored in memory. Changes in the compensation coefficients with respect to their previous values are computed and compared to respective "drift" limits, so that abnormal conditions are also detected from abnormal changes in the nonlinearity over intervals of time.

Claims

1. A method of sensing and indicating an abnormal condition in an electrical circuit, said method comprising the steps of:

a) measuring nonlinearity of a transfer characteristic of the electrical circuit to determine a limit value for the nonlinearity of the transfer characteristic of the electrical circuit, and at a later time, again measuring the nonlinearity of the transfer characteristic to determine a coefficient indicating the nonlinearity of the transfer characteristic;

b) comparing said coefficient to said limit value to determine whether the nonlinearity of the transfer characteristic has become abnormal; and

c) indicating a presence of said abnormal condition when said comparing of said coefficient to said limit value determines that the nonlinearity of the transfer characteristic has become abnormal.

2. The method as claimed in claim 1, wherein said step of indicating includes reporting said abnormal condition to a human operator.

3. The method as claimed in claim 1, wherein said step of indicating includes reporting said abnormal condition to a digital computer that is included in an electrical system that also includes said electrical circuit.

4. The method as claimed in claim 1, which further includes the step of repairing said electrical circuit in response to the presence of said abnormal condition being indicated in said step (c).

5. A method of sensing and indicating an abnormal condition in an electrical circuit, said method comprising the steps of:

a) measuring nonlinearity of said electrical circuit to obtain a first measurement of the nonlinearity of said electrical circuit, and at a later time, again measuring said nonlinearity of said electrical circuit to obtain a second measurement of said nonlinearity of said electrical circuit; and

b) comparing said second measurement to said first measurement to detect an abnormal change in said nonlinearity; and

c) indicating a presence of said abnormal condition when said comparing detects said abnormal change in said nonlinearity.

6. The method as claimed in claim 5, wherein said step of measuring includes exciting said electrical circuit with a signal having a frequency component, and measuring distortion generated from said frequency component by nonlinearity in said electrical circuit.

7. The method as claimed in claim 5, wherein said step b) of comparing includes computing a difference between said second measurement and said first measurement, and comparing said difference to a limit value to detect said abnormal change in nonlinearity.

8. The method as claimed in claim 5, wherein said step of indicating includes reporting said abnormal condition to a human operator.

9. The method as claimed in claim 5, wherein said step of indicating includes reporting said abnormal condition to a digital computer that is included in an electrical system that also includes said electrical circuit.

10. A method of sensing and indicating an abnormal condition in an electrical circuit, said method comprising the steps of:

a) measuring nonlinearity of said electrical circuit to obtain a first measurement of the nonlinearity of said electrical circuit, and at a later time, again measuring said nonlinearity of said electrical circuit to obtain a second measurement of said nonlinearity of said electrical circuit; and

b) comparing said second measurement to said first measurement to detect an abnormal change in said nonlinearity; and

c) indicating a presence of said abnormal condition when said comparing detects said abnormal change in said nonlinearity,

wherein said first and second measurements are each obtained by determining a coefficient indicating nonlinearity of a transfer characteristic of said electrical circuit, and said method further includes using said coefficient for compensating said nonlinearity of said transfer characteristic.

11. An electronic system comprising, in combination:

a) a signal processing circuit;

b) digital circuitry connected to said signal processing circuit for measuring nonlinearity in a transfer characteristic of said signal processing circuit; and

c) a programmed controller connected to said digital circuitry for controlling said digital circuitry and receiving from said digital circuitry a coefficient indicating nonlinearity of the transfer characteristic of said signal processing circuit;

said programmed controller being programmed for comparing said coefficient to a limit value to determine whether said nonlinearity is abnormal,

wherein said electronic system includes a digital oscillator connected to said signal processing circuit for exciting said signal processing circuit with a signal having a frequency component, and said digital circuitry includes a detector for detecting distortion generated from said frequency component by said nonlinearity of said transfer characteristic of said signal processing circuit.

12. The electronic system as claimed in claim 11, which includes a digital compensation circuit connected to said digital circuitry for receiving said coefficient indicating nonlinearity of the transfer characteristic of said signal processing circuit, said digital compensation circuit being connected to said signal processing circuit for compensating said nonlinearity of said transfer characteristic of said signal processing circuit.

13. An electronic system comprising, in combination:

a) a signal processing circuit;

b) digital circuitry connected to said signal processing circuit for measuring nonlinearity of a transfer characteristic of said signal processing circuit; and

c) a programmed controller connected to said digital circuitry for controlling said digital circuitry and receiving from said digital circuitry measurements of said nonlinearity of said transfer characteristic of said signal processing circuit;

said programmed controller being programmed for obtaining from said digital circuitry a first measurement of said nonlinearity of said transfer characteristic of said signal processing circuit, and at a later time, obtaining from said digital circuitry a second measurement of said nonlinearity of said transfer characteristic of said signal processing circuit, and comparing said second measurement to said first measurement to detect an abnormal change in said nonlinearity of said transfer characteristic of said electrical circuit.

14. The electronic system as claimed in claim 13, wherein said programmed controller is programmed for computing a difference between said second measurement and said first measurement, and comparing said difference to a limit value to detect said abnormal change in said nonlinearity of said transfer characteristic of said signal processing circuit.

15. The electronic system as claimed in claim 13, which includes a digital oscillator connected to said signal processing circuit for exciting said signal processing circuit with a signal having a frequency component, and said digital circuitry includes a detector for detecting distortion generated from said frequency component by nonlinearity in said transfer characteristic of said signal processing circuit in order to measure said nonlinearity of said transfer characteristic of said signal processing circuit.

16. The electronic system as claimed in claim 15, which includes a digital compensation circuit connected to said digital circuitry for receiving said first measurement and said second measurement of said nonlinearity of said transfer characteristic of said signal processing circuit, said digital compensation circuit being connected to said signal processing circuit for compensating said nonlinearity of said transfer characteristic of said signal processing circuit.

17. A method of sensing and indicating an abnormal condition in an electrical system including a plurality of signal processing circuits, said method comprising the steps of:

a) measuring nonlinearity of a first one of said signal processing circuits to obtain a first measurement of nonlinearity, and measuring nonlinearity of a combination of said first one of said signal processing circuits and a second one of said signal processing circuits to obtain a second measurement of nonlinearity;

b) computing nonlinearity of said second one of said signal processing circuits from said first measurement of nonlinearity and said second measurement of nonlinearity; and

c) indicating that said second one of said signal processing circuits has an abnormal condition when said nonlinearity computed in step b) is abnormal,

wherein said first one of said signal processing circuits and said second one of said signal processing circuits are connected in series, and said step a) of measuring includes passing a first signal through said first one of said signal processing circuits to obtain said first measurement of nonlinearity, and passing a second signal through both of said first one of said signal processing circuits and said second one of said signal processing circuits to obtain said second measurement of nonlinearity.

18. The method as claimed in claim 17, wherein said first signal has a first frequency component, and step a) includes measuring distortion generated from said first frequency component by said nonlinearity of said first one of said signal processing circuits to obtain said first measurement of nonlinearity;

and said second signal has a second frequency component, and said step a) includes measuring distortion generated from said second frequency component by said nonlinearity of said combination of said first one of said signal processing circuits and said second one of said signal processing circuits to obtain said second measurement of nonlinearity.

19. The method as claimed in claim 18, wherein said step b) of computing includes computing a difference between said second measurement and said first measurement.

20. The method as claimed in claim 18, wherein said first one of said signal processing circuits is an analog-to-digital converter, said step a) includes calibrating said analog-to-digital converter to obtain said first measurement of nonlinearity, and said step a) includes passing said second signal through said second one of said signal processing circuits and from said second one of said signal processing circuits to said analog-to-digital converter to obtain said second measurement of nonlinearity.

21. The method as claimed in claim 18, wherein said step a) further includes converting said first signal from analog form to digital form and digitally processing said digital form of said first signal to measure said distortion generated from said first frequency component by said nonlinearity of said first one of said signal processing circuits to obtain said first measurement of nonlinearity, and wherein said step a) further includes converting said second signal from analog form to digital form and digitally processing said digital form of said second signal to measure said distortion generated from said second frequency component by said nonlinearity of said combination of said first one of said signal processing circuits and said second one of said signal processing circuits to obtain said second measurement of nonlinearity.

22. An electronic system comprising, in combination:

a) an analog signal generator for generating an analog signal;

b) a signal processing circuit having a signal input connected to said analog signal generator for receiving said analog signal and a signal output;

c) an analog multiplexer connected to said analog signal generator and to said signal output of said signal processing circuit for selecting said analog signal either before or after processing by said signal processing circuit;

d) an analog-to-digital converter connected to said analog multiplexer for digitizing the signal selected by said analog multiplexer and asserting the digitized signal on a digital output;

e) digital circuitry connected to said digital output of said analog-to-digital converter for analyzing said digitized signal to produce measurements of nonlinearity of a transfer characteristic from said analog signal generator to said digital output; and

f) a programmed controller connected to digital circuitry for receiving said measurements of said nonlinearity of said transfer characteristic from said digital circuitry and connected to said multiplexer for operating said multiplexer so that one of said measurements indicates nonlinearity of said analog-to-digital converter and another of said measurements indicates nonlinearity of a combination of said signal processing circuit and said analog-to-digital converter, said programmed controller being programmed to compute an indication of nonlinearity of said signal processing circuit from said one of said measurements and said another of said measurements.

23. The electronic system as claimed in claim 22, wherein said signal processing circuit includes a plurality of cascaded signal conditioning circuits, said analog multiplexer has a respective analog input connected to a signal output of each of the cascaded signal conditioning circuits for receiving said analog signal after conditioning by a respective one of said signal conditioning circuits, and wherein said programmed controller is programmed to compute an indication of nonlinearity of each of said signal conditioning circuits from said measurements received from said digital circuitry.

24. The electronic system as claimed in claim 23, wherein said programmed controller is further programmed to indicate that a respective one of said signal conditioning circuits has a linearity problem when said indication of nonlinearity of said respective one of said signal conditioning circuits is abnormal.

25. An electronic system comprising, in combination:

a) an analog signal generator for generating an analog signal;

b) a signal processing circuit having a signal input connected to said analog signal generator for receiving said analog signal, said signal processing circuit including a plurality of cascaded signal conditioning circuits, each of said signal conditioning circuits having a respective signal output;

c) an analog multiplexer having a respective analog input connected to each signal output for selecting said analog signal after conditioning by a respective one of said signal conditioning circuits;

d) an analog-to-digital converter connected to said analog multiplexer for digitizing the analog signal selected by said analog multiplexer and asserting the digitized signal on a digital output;

e) digital circuitry connected to said digital output of said analog-to-digital converter for analyzing said digitized signal to produce measurements of nonlinearity of a transfer characteristic from said analog signal generator to said digital output; and

f) a programmed controller connected to digital circuitry for receiving said measurements of said nonlinearity of said transfer characteristic from said digital circuitry and connected to said multiplexer for operating said multiplexer, said programmed controller being programmed to operate said multiplexer to select a respective analog signal from each signal output and to receive from said digital circuitry a measurement representing nonlinearity of a respective transfer function from each signal output, and for computing from said measurements a respective indication of nonlinearity of each of said signal conditioning circuits.

26. The electronic system as claimed in claim 25, wherein said programmed controller is further programmed to indicate that a respective one of said signal conditioning circuits has a linearity problem when said indication of nonlinearity of said respective one of said signal conditioning circuits is abnormal.