Apparatus and method for testing circuits by the response of a phase-locked loop

• US 5,596,280 A
• Filed: 06/15/1995
• Issued: 01/21/1997
• Est. Priority Date: 06/15/1995
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Riggio, Salvatore R. Jr.
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US08/491,020
• Time in Patent Office: 586 Days
• Field of Search: 324/158.1, 324/521, 324/537, 324/606, 324/607, 324/667, 324/683, 324/707, 324/709
• US Class Current: 324/606
• CPC Class Codes: G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements testing printed circuit boards G01R31/2801
• CPC Class Codes: H03L 7/08 Details of the phase-locked loop

Abstract

A PLL (phase-locked loop) circuit is used in apparatus for testing individual circuits in circuit devices. The PLL circuit operates at an input frequency provided by the output of an input oscillator when this oscillator is connected to one of the inputs of a phase comparator within the PLL circuit. When this connection is not made, the PLL circuit operates at a freerunning frequency, which is varied by connecting a circuit under test with a frequency controlling node present within a voltage-controlled oscillator in the PLL circuit. In a first mode of operation, the circuit under test is initially connected to the frequency controlling node, but the input oscillator is not connected to the phase comparator. When the input oscillator is so connected, the frequency of oscillations moves from a freerunning frequency associated with the circuit under test to the input frequency. During this transient behavior, the output of a loop filter within the PLL circuit is periodically sampled and encoded using an ADC (analog to digital converter) circuit. In a second mode of operation, the circuit under test is initially not connected to the PLL circuit, but the input oscillator is initially so connected. When the circuit under test is connected, transient behavior is caused, which is again recorded using the ADC. In either case, codes generated by the ADC circuit are read by the processor of a computing system for comparison with codes similarly generated using a circuit known not to have fault conditions.

Claims

1. Apparatus for determining electrical characteristics of a circuit under test, wherein said apparatus comprises:

a computing system;

an input oscillator providing an output at an input frequency of oscillation;

a phase-locked loop including a phase comparator, a loop filter, and a voltage controlled oscillator, wherein said phase comparator has first and second inputs, with said first input being connected to an output of said voltage controlled oscillator, wherein said voltage controlled oscillator has a freerunning frequency of oscillation at which said phase-locked loop operates when said input oscillator is not connected to said phase comparator, wherein said phase-locked loop oscillates at said input frequency when said input oscillator is connected to said phase comparator, wherein said voltage controlled oscillator includes a frequency control node at which said freerunning frequency of oscillation is varied by attaching an electrical impedance extending to electrical ground;

first connection means connecting said input oscillator with said second input of said phase comparator;

second connection means connecting a node of said circuit under test with said frequency control node;

detection means measuring an output signal of said loop filter;

switching means, operable by said computing system, for closing an electrical connection to said phase-locked loop to begin generating data relative to said circuit under test; and

an analog to digital converter responding to an output signal from said detection means, wherein said analog to digital converter produces coded signals indicating levels of said output signal of said loop filter at sampling times synchronized with operation of said switching means, so that said sampling times occur when said electrical connection to said phase lock loop is closed and at a plurality of equal time intervals thereafter.

2. The apparatus of claim 1:

wherein said computing system comprises a processor, an address bus, and a data bus; and

wherein said apparatus additionally comprises a decoder providing a first decoder output signal when a first address is sent along said address bus and a second decoder output signal when a second address is sent along said address bus, data latch means for storing said coded signals, first control means operating said switching means in response to said first decoder output signal, and second control means driving contents of said data latch means onto said data bus in response to said second decoder output signal.

3. The apparatus of claim 1, wherein said switching means includes first switching means for opening and closing said first connection means.

4. The apparatus of claim 1, wherein said switching means includes second switching means for opening and closing said second connection means.

5. The apparatus of claim 4, wherein said first switching means includes a movable probe contacting said node of said circuit under test.

6. The apparatus of claim 4, wherein said switching means includes first switching means for opening and closing said first connection means.

7. The apparatus of claim 6:

wherein said apparatus is operable in a first mode of operation, in which said second switching means holds said second connection means closed while said first switching means closes and opens said first connection means, with said sampling times occurring when said first connection means is closed and at a plurality of equal intervals thereafter; and

wherein said apparatus is additionally operable in a second mode of operation, in which said first switching means holds said first connection means closed while said second switching means closes and opens said second connection means, with said sampling times occurring when said second connection means is closed and at a plurality of equal intervals thereafter.

8. The apparatus of claim 7, comprising in addition mode control means, responsive to said computing system, for determining whether said apparatus operates in said first mode of operation or in said second mode of operation.

9. The apparatus of claim 7:

wherein said computing system comprises a processor, an address bus, and a data bus; and

wherein said apparatus additionally comprises a decoder providing a first decoder output signal when a first address is sent along said address bus, a second decoder output signal when a second address is sent along said address bus, a third decoder output signal when a third address is sent along said address bus, and a fourth decoder output signal when a fourth address is sent along said address bus, with said apparatus additionally comprising data latch means for storing said coded signals, first control means operating said switching means in response to said first decoder output signal, second control means driving contents of said data latch means onto said data bus in response to said second decoder output signal, and mode control means set for operation of said apparatus in said first mode of operation in response to said third decoder output signal and reset for operation of said apparatus in said second mode of operation in response to said fourth decoder output signal.