Flux focusing eddy current probe

• US 5,617,024 A
• Filed: 05/08/1996
• Issued: 04/01/1997
• Est. Priority Date: 10/12/1993
• Status: Expired due to Fees

• Current Assignee: United States Administrator of National Aeronautics and Space Administration
• Original Assignee: United States Administrator of National Aeronautics and Space Administration
• Inventors: Clendenin, C. Gerald, Wincheski, Russell A., Simpson, John W., Namkung, Min, Fulton, James P., Nath, Shridhar C., Todhunter, Ronald G.
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US08/649,851
• Time in Patent Office: 328 Days
• Field of Search: 324/209, 324/225, 324/226, 324/229, 324/239-243, 324/262
• US Class Current: 324/209
• CPC Class Codes: G01N 27/9006 Details, e.g. in the structure or functioning of sensors
• CPC Class Codes: G01N 27/902 by moving the sensors

Abstract

A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil. The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.

The maximum sensor output is obtained when positioned symmetrically above the crack. Hence, by obtaining the position of the maximum sensor output, it is possible to track the fault and locate the area surrounding its tip. The accuracy of tip location is enhanced by two unique features of the sensor; a very high signal-to-noise ratio of the probe'"'"'s output which results in an extremely smooth signal peak across the fault, and a rapidly decaying sensor output outside a small area surrounding the crack tip which enables the region for searching to be clearly defined. Under low frequency operation, material thinning due to corrosion damage causes an incomplete shielding of the pick-up coil. The low frequency output voltage of the probe is therefore a direct indicator of the thickness of the test sample.

Claims

1. A flux-focusing eddy current probe for non-destructive evaluation of an electrically conductive material comprising:

(a) an excitation coil for inducing eddy currents within the electrically conductive material, the excitation coil having windings wherein the excitation coil'"'"'s longitudinal axis is perpendicular to the surface of the electrically conductive material;

(b) a pick-up coil having an outer edge and having windings which are surrounded by the windings of the excitation coil; and

(c) a tubular flux focusing lens disposed between the excitation coil and the pick-up coil, composed of a conductive material having a high magnetic permeability, having a first opening opposite the surface of the electrically conductive material and having a second opening adjacent to the surface of the electrically conductive material and which prevents magnetic coupling between the excitation coil and the pick-up coil when said probe is placed above an unflawed electrically conductive material and which produces high flux density at the outer edge of the pick-up coil.

2. The flux-focusing eddy current probe as recited in claim 1, wherein the windings of the excitation and pick-up coils are substantially circular.

3. The flux-focusing eddy current probe as recited in claim 2, wherein the excitation coil is substantially concentrically disposed around the pick-up coil.

4. A flux-focusing eddy current probe as recited in claim 1, additionally comprising means for applying a current to the windings of the excitation coil, the current having a frequency range whose high frequency detects flaws on the surface of conducting material and whose low frequency detects flaws occurring within the conducting material and thickness variations of the conducting material.

5. The flux-focusing eddy current probe as recited in claim 4, wherein the high frequency is a frequency at which an opposing secondary magnetic field created by the eddy currents within the electrically conductive material overcomes a magnetic field produced by the excitation coil, and the lowest frequency is greater than a frequency at which the magnetic field produced by the excitation coil is directly detected by the pick-up coil when in contact with non-flawed electrically conductive material.

6. A flux-focusing eddy current probe as recited in claim 1, wherein the flux focusing lens has a substantially circular top composed of a conducting material of high magnetic permeability attached to the first opening of the flux focusing lens and which top encloses and magnetically isolates the first opening.

7. A flux-focusing eddy current probe as recited in claim 4, wherein the thickness of the flux focusing lens is greater than three skin depths of a magnetic flux generated by the current applied to the excitation coil.

8. The flux-focusing eddy current probe as recited in claim 3, wherein the flux focusing lens is substantially cylindrical and the excitation coil is concentrically disposed around the flux focusing lens.

9. The flux-focusing eddy current probe as recited in claim 8, wherein the height of the excitation coil is substantially equal to the height of the flux focusing lens.

10. The flux-focusing eddy current probe as recited in claim 9, wherein the height of the pick-up coil is less than one half the height of the excitation coil.

11. The flux-focusing eddy current probe as recited in claim 10, wherein the bottom edge of the pick-up coil is co-planar with the bottom edge of the excitation coil and the second opening of the flux focusing lens.

12. The flux-focusing eddy current probe as recited in claim 11, wherein the diameter of the flux focusing lens is no more than two times the size of a minimally detectable conductive material flaw.

13. An eddy current probe system for fatigue evaluation of electrically conductive material comprising a flux-focusing eddy current probe as recited in claim 1 that provides an output signal dependant upon a fault detected within the conducting material, additionally comprising;

(a) an signal interpretation means to interpret and record the output signal of the eddy current probe;

(b) a position recording means to record the x-axis and y-axis position of the probe over the electrially conductive material;

(c) a controlling means to provide automated system control;

(d) a positioning means for x-axis and y-axis positioning of the eddy current probe over the surface of the electrically conductive material; and

(e) an automated loading means for applying tension and compression loads to opposite ends of the electrically conductive material causing the electrically conductive material to experience a fatigue crack having a tip.

14. A flux-focusing eddy current probe system as recited in claim 13, wherein the controlling means controls the positioning means based on the output signal of the eddy current probe.

15. A flux-focusing eddy current probe system as recited in claim 13, wherein the controlling means controls the automated loading means based on the output signal of the eddy current probe.

16. A flux-focusing eddy current probe resistant to conductive material edge effects for non-destructive evaluation of an electrically conductive material comprising:

(a) an excitation coil for inducing eddy currents within a conducting material, the excitation coil having windings wherein the excitation coil'"'"'s longitudinal axis is perpendicular to the conducting material;

(b) a pick-up coil having an outer edge and having windings which are surrounded by the windings of the excitation coil;

(c) a tubular flux focusing lens disposed between the exciation coil and the pick-up coil, composed of a conductive material having a high magnetic permeability, having an opening at opposite ends of its longitudinal axis and which prevents magnetic coupling between the excitation coil and the pick-up coil when said probe is placed above an unflawed electrically conductive material and which produces high flux density at the outer edge of the pick-up coil; and

(d) a flux focusing shield which surrounds the excitation coil.

17. A flux-focusing eddy current probe highly resistant to lift off conditions for non-destructive evaluation of electrically conductive material comprising:

(a) an excitation coil for inducing eddy currents within a conducting material, the excitation coil having windings wherein the excitation coil'"'"'s longitudinal axis is perpendicular to the conducting material;

(b) a plurality of pick-up coils each having windings which are surrounded by the windings of the excitation coil; and

(c) a tubular flux focusing lens disposed between the excitation coil and the plurality of pick-up coils, composed of a conductive material having a high magnetic permeability, having an opening at opposite ends of its longitudinal axis, which prevents magnetic coupling between the excitation coil and the pick-up coils when said probe is placed above an unflawed electrically conductive material and which produces high flux density.