Spectral measuring method and spectral measuring apparatus
First Claim
1. A spectral measuring method comprising steps of:
- dividing excitation light of a single wavelength into a sample beam and a correction beam;
irradiating a sample with said sample beam;
selectively receiving at least either fluorescence or Raman scattered light as target light from light being obtained from said sample by said irradiation with said sample beam after removing the same wavelength component as said excitation light;
simultaneously introducing received said target light and said correction beam into a single spectroscope as a single light beam and separating the light beam into spectral components thereby obtaining a spectrum;
finding a spectral intensity at a prescribed wavelength or an integral value in a proper wavelength range from said spectrum as a measured value; and
correcting said measured value on the basis of a detected intensity of an excitation light component in said spectrum.
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Accused Products
Abstract
Excitation light from a light source is divided into a sample beam and a correction beam by a half mirror, so that the sample beam is converged on a sample in a sample part by convergent lenses. Condenser lenses are provided in order to converge scattered light from the sample on an inlet slit of a spectroscope, and a holographic notch filter which is set to include the wavelength of the excitation light in its notch region is arranged in order to remove the same wavelength component as the excitation light from the scattered light for selecting target light. The target light and the correction beam are guided onto the same optical axis by a half mirror, to be incident upon a polychrometer through the inlet slit and simultaneously detected. The detected value of the target light is corrected by a simultaneously detected intensity of the correction beam.
18 Citations
10 Claims
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1. A spectral measuring method comprising steps of:
- dividing excitation light of a single wavelength into a sample beam and a correction beam;
irradiating a sample with said sample beam; selectively receiving at least either fluorescence or Raman scattered light as target light from light being obtained from said sample by said irradiation with said sample beam after removing the same wavelength component as said excitation light; simultaneously introducing received said target light and said correction beam into a single spectroscope as a single light beam and separating the light beam into spectral components thereby obtaining a spectrum; finding a spectral intensity at a prescribed wavelength or an integral value in a proper wavelength range from said spectrum as a measured value; and correcting said measured value on the basis of a detected intensity of an excitation light component in said spectrum.
- dividing excitation light of a single wavelength into a sample beam and a correction beam;
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2. A spectral measuring apparatus comprising:
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an excitation light source part being provided with a light source and a beam splitter for dividing a excitation light beam being obtained from said excitation light source into a sample beam and a correction beam; a sample part for irradiating a sample with said sample beam; an optical target adjusting part being provided with filter means for removing the same wavelength component as excitation light from light being generated from said sample being irradiated with said sample beam and selecting at least either fluorescence or Raman scattered light as target light and an optical system for adjusting beams; a beam combining means for placing a beam outgoing from said optical target adjusting part and said correction beam on the same optical axis; a spectral processing part being provided with a spectroscope for separating a beam outgoing from said beam combining means into its spectral components and a detector for detecting said spectral components being separated by said spectroscope; and a data processing part having functions of finding a spectral intensity at a prescribed wavelength or an integral value in a proper wavelength range from a spectrum being detected by said detector of said spectral processing part as a measured value and correcting said measured value on the basis of a detected intensity of an excitation light component in said spectrum. - View Dependent Claims (3, 4, 5, 6, 7, 8, 9, 10)
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Specification