×

Integrated circuit device and test method therefor

  • US 5,619,463 A
  • Filed: 08/24/1995
  • Issued: 04/08/1997
  • Est. Priority Date: 08/26/1994
  • Status: Expired due to Term
First Claim
Patent Images

1. An integrated circuit device, operable in a normal mode and a test mode, the device being testable in association with a tester, including:

  • an oscillator arranged to produce a periodic output signal for controlling operations of the device, during the normal mode of operation;

    a counter having an input for receiving a timing signal representing operations of the device, during the normal mode of operation, and arranged to count transitions in said periodic output signal to generate an output count during the test mode of operation;

    switch circuitry for selectively connecting said periodic output signal of the oscillator to the input of the counter in the test mode of operation, said test mode being implemented for a predetermined time; and

    an output circuit for providing the output count generated by said counter after said predetermined time to the tester so that the tester can derive the frequency of the oscillator from said output count and said predetermined time.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×