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Microscope for force and tunneling microscopy in liquids

  • US 5,621,210 A
  • Filed: 06/07/1995
  • Issued: 04/15/1997
  • Est. Priority Date: 02/10/1995
  • Status: Expired due to Term
First Claim
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1. A scanning probe microscope for examining the properties of a sample surface, said microscope comprising:

  • a body block;

    an x-y scanner attached to said body block;

    a sample stage;

    means for adjustably suspending said sample stage from said body block;

    means for translating said sample stage relative to said scanner;

    at least one STM probe attached to said scanner;

    at least one AFM probe attached to said scanner; and

    means for scanning a selected area of a sample firstly with one of said STM probe or said AFM probe and secondly with the other of said STM probe or said AFM probe.

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