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Automatic impedance matching apparatus and method

  • US 5,621,331 A
  • Filed: 07/10/1995
  • Issued: 04/15/1997
  • Est. Priority Date: 07/10/1995
  • Status: Expired due to Term
First Claim
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1. A method of impedance matching a source to a load using a multi-stub tuner positioned between the source and the load comprising:

  • a) determine a reflection coefficient associated with the load;

    b) determining scattering parameters of the multi-stub tuner;

    c) determining scattering parameters of the multi-stub tuner that theoretically match the source impedance to the load impedance;

    d) determining stub displacements from current stub positions of the multi-stub tuner to positions corresponding to the scattering parameters of the multi-stub tuner that theoretically match the source impedance to the load impedance provided that the load impedance remains constant as the stub positions are varied;

    e) determining scaled stub displacements by combining the stub displacements with a scaling factor;

    f) moving the stubs a distance corresponding to the scaled stub displacements; and

    g) repeating steps a-f until the magnitude of the reflection coefficient is less than a predetermined value.

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