Optical time domain reflectometer (OTDR) with improved dynamic range and linearity

• US 5,621,518 A
• Filed: 10/10/1995
• Issued: 04/15/1997
• Est. Priority Date: 11/26/1994
• Status: Expired due to Term

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Beller, Josef
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US08/540,903
• Time in Patent Office: 553 Days
• Field of Search: 356/73.1
• US Class Current: 356/73.1
• CPC Class Codes: G01M 11/3109 Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR

Abstract

This invention relates to a method and an apparatus for performing exceptionally linear averaging of digitized signals in an optical time domain reflectometer. Resolutions far below the quantization level of the ADC with improved linearity can be achieved without sacrificing dynamic range. Such method can be used to improve measurement accuracy on optical fibers under test.

Claims

1. An optical time-domain-reflectometer (OTDR), comprising:

a pulse generator for launching optical pulses into an optical component under test, said pulses exhibiting pulse widths in a range of nanoseconds to microseconds and being launched at repetition rates in a range of about 0.1 to 50 kHz,

a receiver, such as an avalanche photodiode detector, with a specific bandwidth, for receiving a backscatter signal of said optical component under test and for generating a first electrical signal representative of said backscatter signal and a first noise signal,

an amplifier for amplifying said first electrical signal and said first noise signal,

noise source means for generating a second noise signal and combining said first electrical signal and first noise signal, after amplification thereof by said amplifier, with said second noise signal, and outputting combined signals,

an analog-digital-converter (ADC) with a sampling frequency f_S for converting the combined signals to first digital data, and

means for averaging said first digital data and for removing digital data corresponding to said second noise signal.

2. An OTDR according to claim 1, comprising a first bandpass filter with a passband to filter said second noise signal and for generating a first filtered signal for combination with the first amplified electrical signal and the first amplified noise signal.

3. An OTDR according to claim 2, wherein said first bandpass filter has a center frequency around f_c =f_s/2.

4. An OTDR according to claim 2, wherein said first filtered signal exhibits a gaussian distribution and/or is a bandlimited signal.

5. An OTDR according to claim 1, further comprising a lowpass filter for removing digital data corresponding to said second noise signal.

6. An OTDR according to claim 5, wherein said lowpass filter is a software implemented lowpass filter.

7. An OTDR according to claim 1, wherein said sampling frequency f_S of said ADC is significantly higher than said bandwidth of said receiver in order to remove the second noise signal after A/D conversion and without affecting said first electrical signal.

8. An OTDR according to claim 1, wherein said noise source has an independently adjustable amplitude level.

9. An OTDR according to claim 5, further comprising:

a first bandpass filter with a passband to filter said second noise signal and for generating a first filtered signal for combination with the first amplified electrical signal and the first amplified noise signal; and

wherein said lowpass filter manifests a corner frequency positioned above said bandwidth of said receiver and below said passband of said first bandpass filter.

10. An OTDR according to claim 8, wherein said independently adjustable amplitude level of said noise source is set to a level that the total amplitude level of said first and said second noise signal at the input of said ADC has a root-mean-square (rms) value of σ

≈

1.

11. Method for time domain reflectometry, comprising:

a first step in which an optical backscatter signal of an optical component under test is received and a first electrical signal representative of said backscatter signal and a first noise signal are generated,

a second step in which said first electrical signal and said first noise signal are amplified,

a third step in which a second noise signal is generated and superposed with the amplified first electrical signal and the amplified first noise signal,

a fourth step in which the superposed signals are sampled at a frequency f_S, and are converted to first digital data,

a fifth step in which said first digital data is averaged, and thereafter

a sixth step in which digital data corresponding to said second noise signal is removed from said first digital data.

12. Method according to claim 11, wherein said second noise signal has a center frequency f_C around f_C =f_S/2.