Method and dichrograph for measurement of circular dichroism, optical rotation and absorption spectra

• US 5,621,528 A
• Filed: 07/26/1995
• Issued: 04/15/1997
• Est. Priority Date: 11/26/1993
• Status: Expired due to Term

• Current Assignee: Rokos & Co., Ltd.
• Original Assignee: Rokos & Co., Ltd.
• Inventors: Rokos, Jiri
• Primary Examiner(s): Pham, Hoa Q.
• Application Number:
  US08/495,468
• Time in Patent Office: 629 Days
• Field of Search: 356/364-369, 356/370, 356/319, 356/432-442, 356/326, 356/322, 356/327, 250/225, 128/633-634, 128/664-665
• US Class Current: 356/364
• CPC Class Codes: G01N 21/19 Dichroism

Abstract

The dichrograph and accompanying method are usable for parallel measurement of circular dichroism according to the first harmonic of photoelectric current of the detector, optical rotation according to the second harmonic and transparency according to the null harmonic. It contains the switch (3) of ray, from which alternatively exit two parallel rays--measurement ray (4) and reference ray (5), going through one mutual modulator of ellipticity (6), achromatic phase element (9) which is during calibration of circular unit situated in the reference ray (5). Moreover it contains two analyzers--the measurement analyzer (8) in the measurement ray (4) behind the couvette (7) and the reference analyzer (10) in the reference ray (5). The measurement analyzer (8) has the optical axis turned for 45° same as the modulator (6). The reference analyzer (10) is during measurement turned for unit angle, e.g. for 1°, to the measurement analyzer (8).

Claims

1. A method for measuring transmittance, circular dichroism and optical rotation of an optical active substance, for a predetermined wavelength, comprising the steps of:

calibrating a measurement system which produces a measurement ray, by performing harmonic analysis of a polarization state of said measurement ray to determine unit values;

performing ellipticity modulation on the measurement ray to create an ellipticity modulated ray;

directing the ellipticity modulated ray through said optical active substance and into an analyzer;

transforming changes in amplitude of said ellipticity modulated ray into changes in electrical signals at said analyzer;

assorting a null harmonic component, a first harmonic component, and a second harmonic component to respectively correspond to transmittance, circular dichroism and optical rotation of the optical active substance, wherein a frequency of said first harmonic component corresponds to a modulation frequency; and

comparing amplitudes of said null, first and second harmonic components to said unit values.

2. The method of claim 1, and further comprising the steps of:

forming a reference ray distinct from said measurement ray;

calibrating said reference ray and elliptically modulating said reference ray in the same manner that the measurement ray is calibrated and elliptically modulated to thereby create an ellipticity modulated reference ray;

transforming changes in amplitude of said elliptically modulated reference ray into changes in said electrical signals, alternatingly with said step of transforming changes in amplitude of said ellipticity modulated ray into changes in said electrical signals, said steps of transforming being carried out with alternations at an alternation frequency which is at least ten times smaller than the modulation frequency.

3. A dichrograph for measuring transmittance, circular dichroism and optical rotation of an optical active substance, for a predetermined wavelength, said dichrograph comprising:

a light source capable of producing a ray of light having said predetermined wavelength;

a linear polarizer arranged for placement in a path of said ray of light;

a ray switch for splitting said ray of light into a measurement ray and a reference ray;

a ray interruptor located in the path of said measurement ray and in the path of said reference ray, for interrupting said measurement ray and reference ray;

at least one ellipticity modulator responsive to a modulation voltage, for modulating an ellipticity of said measurement ray and for modulating an ellipticity of said reference ray in accordance with said modulation voltage, to generate an ellipticity modulated measurement ray and an ellipticity modulated reference ray;

a measurement ray analyzer disposed in the path of said ellipticity modulated measurement ray, said measurement ray analyzer having an optical axis oriented at an angle of less than 45 degrees with respect to an optical axis of said linear polarizer, said measurement ray analyzer and said at least one ellipticity modulator being sufficiently spaced apart from one another that said optical active substance can be accommodated therebetween;

a reference ray analyzer disposed in the path of said ellipticity modulated reference ray, said reference ray analyzer having an optical axis oriented at an angle of less than 45 degrees ±

a unit angle (α

) with respect to said optical axis of said linear polarizer;

a mutual detector of electromagnetic radiation responsive to said ellipticity modulated reference ray and ellipticity modulated measurement ray so as to produce electrical output signals;

an AC amplifier electrically connected to a first of said electrical output signals;

a first short range amplifier electrically connected to a second of said electrical output signals, said first short range amplifier having a working frequency corresponding to a frequency of said at least one ellipticity modulator; and

a second short range amplifier electrically connected to a third of said electrical output signals, said second short range amplifier having a working frequency which is double said frequency of said at least one ellipticity modulator; and

at least one optical element for directing at least one of said ellipticity modulated reference ray and ellipticity modulated measurement ray toward said mutual detector of electromagnetic radiation.

4. The dichrograph according to claim 3, wherein said unit angle (α

) has a value of ±

0.1 degrees to ±

40 degrees.

5. The dichrograph according to claim 3, wherein said ray interruptor is part of said ray switch.

6. The dichrograph according to claim 3, wherein said at least one ellipticity modulator comprises a single mutual ellipticity modulator for modulating an ellipticity of said measurement ray and of said reference ray.

7. The dichrograph according to claim 3, wherein said source comprises a monochromator.