Image recognition apparatus capable of inspecting height and method for inspecting height by using two slit incident beams of light
First Claim
1. An image recognition apparatus having a coordinate system associated therewith, the apparatus comprising:
- illuminant means for emitting a flux of rays of light;
slit means for converting the flux of rays of light into a combination of first and second slits of light parallel to each other and incident on an inspection object at a variable oblique angle, the first and second slits of light scanning the inspection object;
image pickup means for picking up an image of first and second bright lines made by the first and second slits of light, respectively, on a surface region which the inspection object has in a local domain of the coordinate system; and
image processing means for comparing and collating the picked-up image with a stored image representative of a pattern showing a presence and an absence of the first and second bright lines on the surface region of the inspection object in the local domain of the coordinate system so that, for a height of a convex shape on the surface region, a conformity is determined based on a broken one of the first and second bright lines and a discrimination is made between a first non-conformity due to the height of the convex shape being greater than a first height and a second non-conformity due to the height of the convex shape being less than a second height, based on an order in which the first and second bright lines are broken, as the first and second slits of light correspond to upper and lower limits of the conformity, respectively.
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Accused Products
Abstract
An image recognition apparatus with which rapid height discrimination can be performed for a large number of small protrudent objects disposed on a substrate, and further a height inspecting method with the use of the image recognition apparatus, are disclosed. Two slit incident beams having been emitted from an illuminant and passed through slits fall on an object to be inspected each at an incident angle from the direction perpendicular to the surface of the object to be inspected. There are irregularities of objects to be detected on the object to be inspected. The slit beams are intercepted by protrudent parts of the objects to be detected, so that the morphologies of bright lines produced on the surface of the object to be inspected are changed depending on the heights of the objects to be detected. An image of the bright lines is picked up by a television camera, and the resultant signal is compared with an image signal previously stored. Thus, whether or not the heights of the objects to be detected fall within a given range can be discriminated.
13 Citations
4 Claims
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1. An image recognition apparatus having a coordinate system associated therewith, the apparatus comprising:
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illuminant means for emitting a flux of rays of light; slit means for converting the flux of rays of light into a combination of first and second slits of light parallel to each other and incident on an inspection object at a variable oblique angle, the first and second slits of light scanning the inspection object; image pickup means for picking up an image of first and second bright lines made by the first and second slits of light, respectively, on a surface region which the inspection object has in a local domain of the coordinate system; and image processing means for comparing and collating the picked-up image with a stored image representative of a pattern showing a presence and an absence of the first and second bright lines on the surface region of the inspection object in the local domain of the coordinate system so that, for a height of a convex shape on the surface region, a conformity is determined based on a broken one of the first and second bright lines and a discrimination is made between a first non-conformity due to the height of the convex shape being greater than a first height and a second non-conformity due to the height of the convex shape being less than a second height, based on an order in which the first and second bright lines are broken, as the first and second slits of light correspond to upper and lower limits of the conformity, respectively. - View Dependent Claims (2, 3, 4)
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Specification