System for measuring the integrity of an electrical contact

• US 5,625,292 A
• Filed: 10/19/1993
• Issued: 04/29/1997
• Est. Priority Date: 12/20/1990
• Status: Expired due to Term

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Crook, David T., Keirn, Kevin W., Cilingiroglu, Ugur
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): BROWN, GLENN WARNER
• Application Number:
  US08/139,362
• Time in Patent Office: 1,288 Days
• Field of Search: 324/537, 324/538, 324/555, 324/658, 324/750, 324/765
• US Class Current: 324/538
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: G01R 31/66 Testing of connections, e.g. of plugs or non-disconnectable joints testing for incorrect line connections G01R31/55
• CPC Class Codes: G01R 31/68 Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
• CPC Class Codes: G01R 31/69 of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
• CPC Class Codes: G01R 31/70 Testing of connections between components and printed circuit boards G01R31/68 takes precedence
• CPC Class Codes: G01R 31/71 Testing of solder joints

Abstract

Disclosed is a system that determines whether pins of electrical components such as connectors, switches, and sockets are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component. The electrode is connected to a current measuring device. Another pin of the component is connected to a common signal return.

Claims

1. A system for measuring the integrity of an electrical contact between an electrical connection pin of an electrical component comprising a plurality of connection pins and a circuit assembly, said system comprising:

(a) a signal supply, comprising an output and a common signal return, supplying an electrical signal via said output to a first pin of said electrical component;

(b) an electrical connection between a second pin of said electrical component and said common signal return of said signal supply;

(c) a conductive electrode comprising a surface placed in a fixed position in proximity to said first and second pins; and

(d) measuring means, operatively coupled to said conductive electrode, for determining a parameter indicative of the integrity of the electrical connection between said first pin and said circuit assembly.

2. A system as recited in claim 1, wherein said measuring means comprises means for comparing a measured quantity associated with each of said plurality of pins to a pre-established threshold for each pin and determining the integrity of the electrical connections between said plurality of pins and said circuit assembly on a pin by pin basis.

3. A system as recited in claim 1, further comprising error indicating means for indicating an error condition whenever said parameter is not within predetermined limits.

4. A system as recited in claim 1, further comprising means for connecting at least one other node of said circuit assembly to said common signal return.

5. A system as recited in claim 1, wherein said measuring means comprises means for measuring an electrical current.

6. A system as recited in claim 1, wherein said measuring means comprises means for measuring an electrical voltage.

7. A system as recited in claim 1, wherein said measuring means is connected between said common signal return and said conductive electrode.

8. A system as recited in claim 1, wherein the electrical signal supplied by the signal supply oscillates at a frequency of approximately 8-10 kHz.

9. A system for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component comprising a plurality of connection pins and a circuit assembly, said system comprising:

(a) a signal supply, comprising an output and a common signal return, for supplying an electrical signal via said output;

(b) an electrical connection between a second pin of said electrical component and said common signal return of said signal supply;

(c) a conductive electrode, coupled to said output of said signal supply, comprising a surface placed in a fixed position in proximity to said pins; and

(d) measuring means, operatively coupled to said first pin, for determining a parameter indicative of the integrity of the electrical connection between said second pin and said circuit assembly.

10. A system as recited in claim 9, wherein said measuring means comprises means for comparing a measured quantity associated with each of said plurality of pins to a pre-established threshold for each pin and determining the integrity of the electrical connections between said plurality of pins and said circuit assembly on a pin by pin basis.

11. A system as recited in claim 9, further comprising error indicating means for indicating an error condition whenever said parameter is not within predetermined limits.

12. A system as recited in claim 9, further comprising means for connecting at least one other node of said circuit assembly to said common signal return.

13. A system as recited in claim 9, wherein said measuring means comprises means for measuring an electrical current.

14. A system as recited in claim 9, wherein said measuring means comprises means for measuring an electrical voltage.

15. A system as recited in claim 9, wherein said measuring means is connected between said common signal return and said second pin.

16. A system as recited in claim 9, wherein the electrical signal supplied by the signal supply oscillates at a frequency of approximately 8-10 kHz.

17. A method for measuring the integrity of an electrical contact between an electrical connection pin of an electrical component comprising a plurality of connection pins and a circuit assembly, said method comprising the steps of:

(a) placing a conductive electrode in a fixed position in proximity to a surface of said pins;

(b) supplying an electrical signal from a signal generator to one of either said conductive electrode or a first pin;

(c) electrically connecting a second pin to a common signal return of said signal generator; and

(d) measuring a parameter indicative of the integrity of the connection of said first pin to said circuit assembly;

wherein said electrical component comprises one member of the group;

connector, push button switch, DIP switch, socket, and integrated circuit.

18. A method as recited in claim 17, further comprising the step of comparing a measured quantity associated with each of said plurality of pins to a pre-established threshold for each pin and determining the integrity of the electrical connections between said plurality of pins and said circuit assembly on a pin by pin basis.

19. A method as recited in claim 17, further comprising the step of indicating an error condition whenever said parameter is not within predetermined limits.

20. A method as recited in claim 17, further comprising the step of connecting at least one other pin of said component to said common signal return.

21. A method as recited in claim 17, wherein the measuring step (d) comprises measuring an electrical current.

22. A method as recited in claim 17, wherein the measuring step (d) comprises measuring an electrical voltage.

23. A method as recited in claim 17, wherein the measuring step (d) comprises measuring said parameter between said common signal return and said electrical component.

24. A method as recited in claim 17, wherein the measuring step (d) comprises measuring the parameter between said conductive electrode and said common signal return.

25. A method as recited in claim 17, wherein the electrical signal supplied by the signal generator oscillates at a frequency of approximately 8-10 kHz.

26. A method for measuring the integrity of an electrical contact between a first electrical connection pin of an electrical component and a circuit assembly, said method comprising the steps of:

(a) supplying, with a signal supply, an electrical signal to said circuit assembly;

(b) positioning a conductive electrode in a fixed position in proximity to a surface of said first pin;

(c) measuring a parameter indicative of the integrity of the electrical contact between said first pin and said circuit assembly; and

(d) attenuating spurious electrical signals which may inject capacitively into the conductive electrode through pins of said electrical component other than said first pin.

27. The method of claim 26 wherein said step of attenuating spurious electrical signals comprises electrically connecting at least one other connection pin of said electrical component to a common signal return of the signal supply.

28. The method of claim 26 further comprising the step of indicating an error condition whenever said parameter is lower than a predetermined threshold.