×

High speed crystallography detector

  • US 5,629,524 A
  • Filed: 02/21/1995
  • Issued: 05/13/1997
  • Est. Priority Date: 02/21/1995
  • Status: Expired due to Term
First Claim
Patent Images

1. A device for analysis of x-ray data from an x-ray source, said device comprisingone or more hybrid area sensor means for detecting x-rays, each of said hybrid area sensor means comprisingdetector array chip means for conversion of said x-rays to electron-hole pairs, said detector array chip means comprising a plurality of detectors,readout array chip means electrically connected to said detector array chip means, said readout array chip means comprisinga plurality of unit cells each unit cell comprising two or more storage means, including a last storage means, for receiving electrical signals from a corresponding one of said detectors during a sequence of time intervals,said unit cell comprising readout circuitry means for continuous integration of the signals received by said storage means and for read out after integration of the last storage means,drive electronics means on said readout array chip means for providing timing pulses and biases for signals from said storage means to output electronics means, said drive electronics means providing an integration cycle for each unit cell readout circuitry means,wherein the integration cycle of each unit cell readout circuitry means is offset in time so that integration proceeds on all unit cells except one being read out,said output electronics means comprising means for converting analog signals stored on said storage means to digital signals and for storing said digital signals, anddata processor means for accessing said digital signals from the output electronics.

View all claims
  • 4 Assignments
Timeline View
Assignment View
    ×
    ×