X-ray computed tomography apparatus of the electron beam type with electron beam intensity measuring capacity

• US 5,633,906 A
• Filed: 04/10/1996
• Issued: 05/27/1997
• Est. Priority Date: 04/18/1995
• Status: Expired due to Fees

• Current Assignee: Siemens AG
• Original Assignee: Siemens AG
• Inventors: Hell, Erich, Fuchs, Manfred
• Primary Examiner(s): WONG, DON KITSUN
• Application Number:
  US08/632,385
• Time in Patent Office: 412 Days
• Field of Search: 378/4, 378/10, 378/12, 378/119, 378/121, 378/137, 378/138, 378/145
• US Class Current: 378/10
• CPC Class Codes: A61B 6/032 Transmission computed tomography [CT]
• CPC Class Codes: A61B 6/4028 resulting in acquisition of views from substantially different positions, e.g. EBCT
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01N 23/046 using tomography, e.g. computed tomography [CT]
• CPC Class Codes: H01J 35/30 by deflection of the cathode ray

Abstract

In an x-ray beam computed tomography apparatus having a ring anode scanned by an electron beam for producing an x-ray beam which rotates around an examination region, measurement of the intensity distribution in the electron beam is enabled at various locations of the ring anode during operation. For this purpose, the ring anode can have at a number of locations around its circumferential direction, insulated sub-anodes with an insulating interspace therebetween, to which a measuring arrangement for measuring the charge distribution, and thus the intensity distribution, in the electron beam is connected. The charge distribution is measured when the electron beam sweeps the interspace between two sub-anodes.

Claims

1. In an x-ray computed tomography apparatus having an annular x-ray source surrounding an examination field, said x-ray source including a ring anode scanned by an electron beam generated by an electron gun for producing an x-ray beam rotating around said examination field, the improvement comprising:

said ring anode having, at least one location, at least two neighboring sub-anodes insulated from each other and separated by an insulating interspace; and

measuring means connected to said sub-anodes for measuring a charge distribution in said electron beam as said electron beam sweeps said interspace between said two sub-anodes.

2. The improvement of claim 1 wherein said ring anode has a circumferential direction, and wherein said sub-anodes are disposed successively in said circumferential direction.

3. The improvement of claim 2 wherein said sub-anodes have respective edges adjacent said interspace, said edges extending obliquely relative to said circumferential direction.

4. The improvement of claim 1 wherein said ring anode has two meshed sub-anodes.

5. The improvement of claim 4 wherein said sub-anodes are meshed in sawtooth fashion.

6. The improvement of claim 4 wherein said sub-anodes are meshed in serpentine fashion.