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Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer

  • US 5,635,846 A
  • Filed: 04/30/1993
  • Issued: 06/03/1997
  • Est. Priority Date: 10/19/1992
  • Status: Expired due to Term
First Claim
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1. An electronic device probe for probing an electronic device comprising:

  • a first space transformer having a first surface;

    said first surface having a first plurality of contact locations;

    a first plurality of elongated electrical conductors each having a protuberance at one end thereof;

    said protuberance of each of said plurality of elongated conductors is bonded to one of said plurality of contact locations;

    each of said plurality of elongated conductors extends outwardly away from said surface to form an array of elongated conductors;

    said array of elongated conductors being embedded in a material;

    said elongated conductors having exposed probe tip ends at an exposed surface of said material;

    said first space transformer has a second surface with a second plurality of contact locations thereon and further including a second space transformer which has a surface with a plurality of third contact thereonsaid first plurality of contact locations are in electrical combination with said second plurality of contact locations by electrically conductive paths through said first space transformer, said second plurality of contact locations on said first space transformer is electrically connected to said third plurality of contact locations on said second space transformer.

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