Radiation dosimetry method and apparatus

• US 5,637,876 A
• Filed: 11/07/1995
• Issued: 06/10/1997
• Est. Priority Date: 11/07/1995
• Status: Expired due to Term

• Current Assignee: ISP Capital, Inc. (Ashland Global Holdings, Inc.)
• Original Assignee: ISP Investments, Inc. (Ashland Global Holdings, Inc.)
• Inventors: Lewis, David F., Listl, Carl A., Donahue, J. Michael, Seiwatz, Henry
• Primary Examiner(s): Porta, David P.
• Assistant Examiner(s): HANIG, RICHARD E
• Application Number:
  US08/554,540
• Time in Patent Office: 581 Days
• Field of Search: 250/474.1, 250/473.1, 250/472.1, 250/580, 250/484.3, 250/484.4, 250/252.1
• US Class Current: 250/474.1
• CPC Class Codes: A61N 5/1048 Monitoring, verifying, controlling systems and methods
• CPC Class Codes: A61N 5/1071 for verifying the dose delivered by the treatment plan
• CPC Class Codes: G01T 1/02 Dosimeters G01T1/15 takes precedence
• CPC Class Codes: G01T 1/08 Photographic dosimeters photometry G01J1/52
• CPC Class Codes: G01T 1/105 Read-out devices G01T1/115 takes precedence

Abstract

A method for determining a level of exposure to radiation utilizes a radiation dosimeter comprising a substrate provided with a radiation sensitive layer or patch having an optical density which varies in accordance with the degree of radiation exposure. In addition, the substrate is provided with optically readable coding which identifies encoded mathematical parameters for enabling an automated calculation of dosage from a detected post-exposure optical density of the radiation sensitive material. The method comprises the step of optically measuring the optical density of the layer of radiation sensitive material prior to exposure thereof to radiation. In addition, the coding on the dosimeter substrate is scanned to automatically determine the encoded mathematical parameters. The method further comprises the steps of exposing the radiation sensitive layer to radiation and optically measuring a post-exposure optical density of the layer of radiation sensitive material. Subsequently, from the pre-exposure optical density, the post-exposure optical density, and the mathematical parameters and in accordance with a predetermined mathematical algorithm, a quantitative radiation dose to which the layer of radiation sensitive material was exposed is automatically computed. Preferably, the computed quantitative radiation dose is automatically indicated on a display. Each dosimeter may be provided with a unique identification code encoded in the bar coding on the dosimeter substrate, to enable memory storage of pre-exposure optical densities for multiple dosimeters. A look-up table may be stored in memory for enabling correction of computed optical densities where the post-exposure densities are measured at different times intervals after exposure.

Claims

1. A radiation dosimeter, comprising:

a substrate;

a layer of radiation sensitive material on said substrate, said radiation sensitive material having an optical density which varies in accordance with a degree of radiation exposure of said radiation sensitive material;

optically readable first coding disposed on said substrate, said coding identifying encoded mathematical parameters for enabling an automated calculation of radiation dosage from a detected change in optical density of said radiation sensitive material; and

additional optically readable second coding on said substrate for uniquely identifying the dosimeter.

2. The dosimeter defined in claim 1, wherein said first coding is a bar coding.

3. The dosimeter defined in claim 2, wherein the mathematical parameters encoded in said first coding include a slope parameter.

4. The dosimeter defined in claim 3, wherein the mathematical parameters encoded in said first coding further include a y-intercept parameter.

5. A dose reader instrument comprising:

optical sensing means for sensing a range of variable optical densities on a substrate;

measuring means operatively connected to said optical sensing means for determining an optical density of a layer of radiation sensitive material on said substrate;

decoding means operatively connected to said optical sensing means for decoding mathematical parameters encoded in an optically readable coding on said substrate;

computing means operatively connected to said measuring means and said decoding means for computing, according to a predetermined mathematical function including a measured post-exposure value of said optical density and parameters determined from said coding by said decoding means, a quantitative radiation dose to which said layer of radiation sensitive material was exposed;

communicating means operatively connected to said computing means for communicating the computed quantitative radiation dose to an operator; and

timing means operatively coupled to said computing means for enabling said computing means to compute said quantitative radiation dose only upon the lapse of a preset interval after exposure of said layer of radiation sensitive material to radiation.

6. The instrument defined in claim 5, further comprising a frame with a slot for enabling a sliding of said substrate past said optical sensing means at a pre-established distance from said optical sensing means.

7. The instrument defined in claim 6, wherein said optical sensing means includes a light source and a photocell fixed to said frame.

8. The instrument defined in claim 5 wherein said communicating means includes an optical display.

9. The instrument defined in claim 5 wherein said mathematical parameters include a slope parameter and a y-intercept parameter.

10. The instrument defined in claim 5 wherein said predetermined mathematical function is [log[I(0)-D]-log[I(s)-D]-b]/m where D is a premeasured background intensity determined for the instrument during production and assembly, m is the slope parameter, b is the y-intercept parameter, I(0) is a pre-exposure intensity of light emanating from said layer of radiation sensitive material prior to exposure thereof to radiation, I(s) is a post-exposure intensity of light emanating from said layer of radiation sensitive material after exposure thereof to radiation, log[I(0)-D] is proportional to a pre-exposure optical density of said layer of radiation sensitive material, and log[I(s)-D] is proportional to said post-exposure optical density of said layer of radiation sensitive material.

11. The instrument defined in claim 5, further comprising (a) additional decoding means operatively connected to said optical sensing means for decoding a dosimeter identification code on said substrate and (b) memory means operatively connected to said additional decoding means and to said measuring means for storing a decoded dosimeter identification code for a selected dosimeter and a measured pre-exposure optical density of said selected dosimeter, said memory means being operatively connected to said computing means for providing said measured pre-exposure optical density to said computing means.

12. A method for determining a level of exposure to radiation, comprising:

providing a radiation dosimeter including a layer of radiation sensitive material on a substrate, said radiation sensitive material having an optical density which varies in accordance with a degree of radiation exposure, the radiation dosimeter also including an optically readable first coding disposed on said substrate, said first coding identifying encoded mathematical parameters, the radiation dosimeter being additionally provided with optically readable second coding uniquely identifying the dosimeter;

prior to exposure of said radiation sensitive material to radiation, optically measuring a first optical density of said layer of radiation sensitive material;

automatically reading said second coding to determine the identity of the dosimeter; and

automatically storing said first optical density in electronically encoded form in a memory location associated with the determined identity of the dosimeter;

optically scanning said first coding to automatically determine said mathematical parameters;

after measuring said first optical density, exposing said layer of radiation sensitive material to radiation;

after exposure of said layer of sensitive material to radiation, optically measuring a second optical density of said layer of radiation sensitive material; and

automatically computing, from said first optical density, said second optical density, and said mathematical parameters and in accordance with a predetermined mathematical algorithm, a quantitative radiation dose to which said layer of radiation sensitive material was exposed.

13. The method defined in claim 12 wherein the scanning of at least said first coding is performed prior to exposure of said layer of radiation sensitive material to radiation.

14. The method defined in claim 12 wherein measuring the optical density of said layer of radiation sensitive material includes operating a reflection densitometer apparatus to sense a reflection intensity.

15. The method defined in claim 14 wherein the scanning of at least said first coding is performed upon a passing of the dosimeter through a reader slot of a dose reader instrument.

16. The method defined in claim 12, further comprising the step, performed prior to the optical measuring of said first optical density, of at least temporarily positioning said substrate at a pre-established location in a dose reader instrument.

17. The method defined in claim 16 wherein said substrate is removed from said dose reader instrument and then placed on a subject prior to the exposure of said radiation sensitive material to radiation, said substrate being placed again at least temporarily at said pre-established location after exposure of said radiation sensitive material to radiation and prior to optical measuring of said second optical density.

18. The method defined in claim 12, further comprising automatically displaying the computed quantitative radiation dose.

19. The method defined in claim 12 wherein the step of measuring said first optical density includes the step of sensing a pre-exposure intensity of light emanating from said layer of radiation sensitive material, the step of measuring said second optical density including the step of sensing a post-exposure intensity of light emanating from said layer of radiation sensitive material, said predetermined mathematical function being [log[I(0)-D]-log[I(s)-D]-b]/m where D is a premeasured background intensity, m is a slope parameter included in said mathematical parameters, b is a y-intercept parameter included in said mathematical parameters, I(0) is said pre-exposure intensity, I(s) is said post-exposure intensity, log[I(0)-D] is proportional to said first optical density, and log[I(s)-D] is proportional to said second optical density.

20. A method for determining a level of exposure to radiation, comprising:

providing a radiation dosimeter including a layer of radiation sensitive material on a substrate, said radiation sensitive material having an optical density which varies in accordance with a degree of radiation exposure of the radiation sensitive material;

scanning said substrate to determine calibration information relating to said layer of radiation sensitive material;

exposing said layer of radiation sensitive material to radiation;

after exposure of said layer to radiation, optically measuring a post-exposure optical density of said layer of radiation sensitive material;

automatically computing from said calibration information and said optical density and in accordance with a predetermined mathematical algorithm, a quantitative radiation dose to which said layer of radiation sensitive material was exposed;

measuring a time interval between exposing said layer of radiation sensitive material to radiation and measuring the post-exposure optical density of said radiation sensitive layer; and

automatically modifying the computed quantitative radiation dose in accordance with a difference between the measured time interval and a preset interval.

21. The method defined in claim 20 wherein the radiation dosimeter also includes an optically readable coding disposed on said substrate, said coding identifying encoded mathematical parameters, the scanning of said substrate including a reading of said mathematical parameters from said coding, further comprising the step of optically measuring a pre-exposure optical density of said layer of radiation sensitive material, said pre-exposure optical density being used in the computation of said quantitative radiation dose in accordance with said predetermined mathematical algorithm.

22. The method defined in claim 21 wherein the step of measuring said pre-exposure optical density includes the step of sensing a pre-exposure reflection intensity of said layer of radiation sensitive material, the step of measuring said post-exposure optical density including the step of sensing a post-exposure reflection intensity of said layer of radiation sensitive material, said predetermined mathematical function being [log[I(0)-D]-log[I(s)-D]-b]/m where D is a premeasured background intensity, m is a slope parameter included in said mathematical parameters, b is a y-intercept parameter included in said mathematical parameters, I(0) is said pre-exposure reflection intensity, I(s) is said post-exposure reflection intensity, log[I(0)-D] is proportional to said pre-exposure optical density, and log[I(s)-D] is proportional to said post-exposure optical density.

23. The method defined in claim 21 wherein the radiation dosimeter is provided with optically readable coding uniquely identifying the dosimeter, further comprising the steps of automatically reading said coding to determine the identity of the dosimeter and automatically storing said pre-exposure optical density in electronically encoded form in a memory location associated with the determined identity of the dosimeter.

24. A dose reader instrument comprising:

optical sensing means for sensing a range of variable optical densities on a substrate;

measuring means operatively connected to said optical sensing means for determining an optical density of a layer of radiation sensitive material on said substrate;

decoding means operatively connected to said optical sensing means for decoding mathematical parameters encoded in an optically readable coding on said substrate;

computing means operatively connected to said measuring means and said decoding means for computing, according to a predetermined mathematical function including a measured post-exposure value of said optical density and parameters determined from said coding by said decoding means, a quantitative radiation dose to which said layer of radiation sensitive material was exposed;

communicating means operatively connected to said computing means for communicating the computed quantitative radiation dose to an operator;

timing means operatively coupled to said computing means for measuring a time interval between exposure of said layer of radiation sensitive material to radiation and an operation of said measuring means to determine said post-exposure value of said optical density; and

means operatively connected to said computing means for enabling a modification of the computed radiation dose in accordance with a difference between said interval and a preset interval.

25. The instrument defined in claim 24 wherein said means for enabling a modification of the computed radiation dose includes a table of modification values.