Advanced integrated avionics testing system
First Claim
1. A built-in testing architecture providing on-equipment fault detection and isolation capability, for complex integrated electronic systems having multiple components assembled onto at least one module, the built-in testing architecture comprising:
- built-in component test means incorporated into multiple components of a complex electronic system, for performing physical tests on the components;
built-in module test means incorporated into each module of a complex electronic system, wherein each module includes multiple components, and wherein the built-in module test means on a module coordinates operations of built-in component test means for components on the same module;
built-in maintenance processor means, for coordinating testing operations of multiple built-in module test means; and
built-in maintenance executive test means, for coordinating operations of the maintenance processor means.
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Accused Products
Abstract
Apparatus, and a related method, for testing complex integrated systems, such as avionics systems. A unified approach to the testing architecture provides for a selection of on-line and off-line tests to be run on a complex system, at selected hierarchical levels. Built-in test logic is provided on each component or chip to be tested, and additional built-in test logic is provided at a module level, where a module includes multiple chips or components of various types. Module testing is, in turn, controlled in part by a maintenance processor responsible for multiple modules, and the maintenance processor is controlled in part by a maintenance executive. The testing architecture can be configured to provide a desired mix of performance testing, processor testing and physical testing of components.
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Citations
11 Claims
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1. A built-in testing architecture providing on-equipment fault detection and isolation capability, for complex integrated electronic systems having multiple components assembled onto at least one module, the built-in testing architecture comprising:
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built-in component test means incorporated into multiple components of a complex electronic system, for performing physical tests on the components; built-in module test means incorporated into each module of a complex electronic system, wherein each module includes multiple components, and wherein the built-in module test means on a module coordinates operations of built-in component test means for components on the same module; built-in maintenance processor means, for coordinating testing operations of multiple built-in module test means; and built-in maintenance executive test means, for coordinating operations of the maintenance processor means. - View Dependent Claims (2, 3, 4, 5)
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6. A method of operation of a built-in testing architecture, for testing complex integrated electronic systems having multiple components assembled onto at least one module, the method comprising the steps of:
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performing physical tests on multiple components with built-in component testing logic incorporated into components of a complex electronic system; coordinating, in built-in module testing logic incorporated into a module, the operations of built-in component testing logic incorporated into components of the complex system; coordinating, in a built-in maintenance processor, the testing operations of built-in module testing logic; and coordinating, in a built-in maintenance executive test processor, overall operations of at least one maintenance processor. - View Dependent Claims (7, 8, 9, 10)
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11. For use in a built-in testing architecture for testing complex integrated electronic systems having multiple components assembled onto at least one module, a module maintenance node for coordinating testing at a module level, the module maintenance node comprising:
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means integrated with the module, for switching operation of the module to a functional mode in which the module performs its normal functions; means integrated with the module, for switching operation of the module to a test mode in which data signals are transmitted to and received from the module maintenance node; built-in means for generating test signals for transmission to the module operating in the test mode; means for receiving and analyzing test signals received from the module operating in the test mode; and built-in processor means for controlling all the aforementioned means in the module maintenance node.
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Specification