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Advanced integrated avionics testing system

  • US 5,638,383 A
  • Filed: 07/24/1992
  • Issued: 06/10/1997
  • Est. Priority Date: 07/24/1992
  • Status: Expired due to Term
First Claim
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1. A built-in testing architecture providing on-equipment fault detection and isolation capability, for complex integrated electronic systems having multiple components assembled onto at least one module, the built-in testing architecture comprising:

  • built-in component test means incorporated into multiple components of a complex electronic system, for performing physical tests on the components;

    built-in module test means incorporated into each module of a complex electronic system, wherein each module includes multiple components, and wherein the built-in module test means on a module coordinates operations of built-in component test means for components on the same module;

    built-in maintenance processor means, for coordinating testing operations of multiple built-in module test means; and

    built-in maintenance executive test means, for coordinating operations of the maintenance processor means.

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