Electrical interconnect using particle enhanced joining of metal surfaces
First Claim
1. An apparatus for testing a package containing at least one electronic component, comprising:
- a load board terminal array for contacting package terminals at corresponding interconnect elements on said terminal array, said interconnect elements each having a metal contact layer, including associated particles having a hardness greater than that of said metal; and
means for applying compressive force normal to said electronic circuit and said load board;
whereby a conductive metal matrix is formed between each of said package terminals and a corresponding terminal array interconnect element when said particles pierce a terminal surface.
2 Assignments
0 Petitions
Accused Products
Abstract
A method and apparatus for electrically interconnecting various electronic elements, including circuit components, assemblies, and subassemblies. A particle enhanced material metal contact layer, having a surface, formed on the electronic elements, includes particles of greater hardness disposed on and/or within the metal contact layer, which particles form protuberances that concentrate stress when said contact surface is brought into contact with an opposing surface under pressure, to thereby penetrate the opposing surface and form a metal matrix between the two surfaces. The invention includes preferred and alternative embodiments incorporating particle enhanced material that provide a semiconductor test array which may be patterned as desired to receive an integrated circuit die and/or packaged components to facilitate integrated circuit and packaged electronic component testing; a probing device for testing integrated circuit die in situ on a semiconductor wafer; connectors for coupling discontinuous circuit element substrates; an interposer for interconnecting conventional components, circuit boards, and assemblies; and connectors for single and multiple layer circuit boards.
117 Citations
1 Claim
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1. An apparatus for testing a package containing at least one electronic component, comprising:
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a load board terminal array for contacting package terminals at corresponding interconnect elements on said terminal array, said interconnect elements each having a metal contact layer, including associated particles having a hardness greater than that of said metal; and means for applying compressive force normal to said electronic circuit and said load board; whereby a conductive metal matrix is formed between each of said package terminals and a corresponding terminal array interconnect element when said particles pierce a terminal surface.
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Specification