Sidescatter X-ray detection system

• US 5,642,394 A
• Filed: 04/03/1996
• Issued: 06/24/1997
• Est. Priority Date: 04/03/1996
• Status: Expired due to Fees

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Rothschild, Peter John
• Primary Examiner(s): WONG, DON KITSUN
• Application Number:
  US08/627,007
• Time in Patent Office: 447 Days
• Field of Search: 378/51, 378/53, 378/57, 378/86, 378/87, 378/88, 378/62
• US Class Current: 378/57
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

An edge enhancement X-ray imaging system inspects an object for detecting an illegal component. The system illuminates the object with penetrating radiation which is sidescattered from the object and captured by a pair of radiant detectors. The detectors are symmetrically positioned opposite each other, being adjacent the two sides of the object. Each detector has a detecting surface substantially parallel to the beam for converting sidescattered radiation into a pair of electrical signals which define a location of an edge of the illegal component. In response to the electrical signals, a video display produces a visual image of the edge. In another embodiment of the invention, the system further comprises a pair of backscatter detectors which convert the backscattered radiation into a second pair of electrical signals producing a second visual image on the video display. As a result of superimposing the second image onto the first image associated with the sidescatter detectors, the detection of components of the object is greatly improved.

Claims

1. An edge enhancement X-ray imaging system for inspecting an object, comprising:

a source of penetrating radiation;

means for forming radiation emitted by said source into a beam of predetermined cross-section;

means for scanning said beam across said object to be inspected;

responsive to radiation sidescattered by said object, a first pair of radiant detectors symmetrically positioned opposite each other and being adjacent two sides of said object for converting sidescattered radiation into a first pair of electrical signals including information defining a location of an edge of a component of said object;

processing means responsive to said first pair of electrical signals for determining a difference in magnitude therebetween, said difference being dependent on a position of said beam during the scanning of said object; and

display means responsive to said processing means for producing a first visual image which includes a representation of said edge of a component located on said object.

2. The system according to claim 1, further comprising storage means for storing information representative of atomic numbers of components in correspondence with said difference in magnitude, wherein said processing means access said storage means for determining an approximate atomic number of said component based on said difference in magnitude between electrical signals of said first pair.

3. The system according to claim 1, wherein each detector of said first pair of radiant detectors has an effective detecting surface substantially parallel to said beam.

4. The system according to claim 1, wherein said processing means include means for calculating said difference in magnitude between electrical signals in said first pair of electrical signals.

5. The system according to claim 1, further comprising a second pair of detectors located closer to said source than said first pair of detectors, said second pair of detectors having an effective detecting surface substantially perpendicular to said beam and being responsive to radiation backscattered by said object, wherein said second pair of detectors converts said backscattered radiation into a second pair of electrical signals including information for generating a second visual image superimposed onto said first visual image on said display means, thereby providing an enhanced detection of said component.

6. The system according to claim 1, wherein each detector of said first pair of detectors is positioned substantially outside a cross sectional area of said object scanned by said beam.

7. A method of inspecting an object using an edge enhancement X-ray imaging system, said method comprising the steps of:

scanning a beam of penetrating radiation across said object;

moving said object relative to said scanning beam;

detecting radiation sidescattered by said object;

converting sidescattered radiation into a first pair of electrical signals which include information defining a location of an edge of a component of said object;

determining a difference in magnitude between electrical signals of said first pair, said difference being dependent on a position of said beam during the scanning of said object; and

producing a first visual image of said edge in response to said determination.

8. The method according to claim 7, wherein said determination comprises calculating a difference in magnitude between electrical signals of said first pair of electrical signals.

9. The method according to claim 7, further comprising:

detecting radiation backscattered by said object;

converting said backscattered radiation into a second pair of electrical signals representative of said component;

producing a second visual image of said component in response to said conversion; and

superimposing said second visual image onto said first visual image to provide an enhanced detection of said component.

10. The method according to claim 7, further comprising:

providing storage means for storing information representative of atomic numbers of components in correspondence with said difference in magnitude;

accessing said storage means; and

determining an approximate atomic number of said component based on said difference in magnitude between electrical signals of said first pair.