Method and apparatus for generating instructions for use in testing a microprocessor

• US 5,646,949 A
• Filed: 06/04/1996
• Issued: 07/08/1997
• Est. Priority Date: 06/04/1996
• Status: Expired due to Term

• Current Assignee: Freescale Semiconductor, Inc. (NXP Semiconductors NV)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Laurens, Judith Elizabeth, Rudnick, Elizabeth Marie, Law, Wai-On, Bruce, William C. Jr.
• Primary Examiner(s): Canney, Vincent P.
• Application Number:
  US08/658,185
• Time in Patent Office: 399 Days
• Field of Search: 371/27, 371/26, 371/25.1, 395/183.01, 395/183.06, 395/183.08, 395/183.09
• US Class Current: 714/739
• CPC Class Codes: G01R 31/318385 Random or pseudo-random test pattern
• CPC Class Codes: G06F 11/2236 to test CPU or processors
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Abstract

An apparatus and method for generating pseudo-random test instructions for testing a microprocessor begins by providing an array of list structures (502 through 508). Each list structure (502 through 508) contains a list of instructions, a discipline field (34), a pick field (42) and a biasing field (36). A random list of instructions is created by using a list selection discipline field to determine which list (502 through 508) is selected. The discipline field in the particular list (502 through 508) is then used to determine a manner in which instructions are selected from a list of instructions contained within the list structure. The pick field indicates how many instructions are to be selected from each selected list structure using a method determined via the discipline field. Once a number of instructions equal to the pick value has been selected, another list structure is selected as determined in the list selection discipline field until an entire test file of computer instructions is fully generated.

Claims

1. A method for selecting instructions for use in a process for generating dynamically-biased pseudo-random test patterns, the method comprising:

providing an instruction list having a list identifier, an instruction set having at least one instruction, a pick value, and an instruction selection discipline value;

selecting an instruction from the instruction set based on the selection discipline value, wherein the discipline value specifies a manner of selecting; and

repeating the step of selecting based on the pick value.

2. The method of claim 1, further including the step of:

storing the instruction in an intermediate file, wherein the intermediate file contains a sequence of instructions to be processed for execution, wherein the sequence of instructions contains at least one instruction.

3. The method of claim 1, wherein:

the step of providing includes providing a plurality of instruction lists; and

the step of selecting includes selecting the instruction from the instruction set of one of the plurality of instruction lists.

4. The method of claim 3, further including the step of:

repeating the steps of providing, selecting, and repeating based on a desired number of instructions and other biasing information which effects the instruction.

5. The method of claim 1, further including the steps of:

loading a set of user preferences; and

generating a computer instruction based on the set of user preferences.

6. A method for generating test instructions, the method comprising the steps of:

(a) forming a plurality of instruction list structures in computer memory, each instruction list structure in the plurality of instruction list structures having a name field, a list containing at least one computer instruction, a discipline field for determining a manner for selecting computer instructions from the list containing at least one computer instruction, a pick field which indicates the number of instructions which are to be chosen from the list containing at least one computer instruction, and a bias field which defines a manner in which operands are to be generated for the computer instructions selected from the list containing at least one computer instruction;

(b) selecting one list structure among the plurality of instruction list structures as a selected list structure;

(c) selecting a selected computer instruction from the list containing at least one computer instruction which is within the selected list structure, the selecting being performed in accordance with the discipline field of the selected list structure;

(d) determining additional information for the selected computer instruction in accordance with the bias field of the selected list structure;

(e) repeating steps (c) through (e) until a proper number of selected instructions are processed in accordance with the pick field of the selected list structure; and

(f) repeating steps (b) through (f) for another selected list structure until a termination condition is determined.

7. The method of claim 6, including the step of:

(g) writing the selected computer instruction to an instruction output file.

8. The method of claim 6, wherein the discipline field comprises a designator for a random selection, and a designator for a sequential selection.

9. The method of claim 6, including the step of:

(g) executing the selected computer instruction to keep track of a state of the system.

10. The method of claim 6, wherein step (b) comprises:

(b) selecting one list structure among the plurality of instruction list structures as a selected list structure based on a discipline field for the plurality of list structures.

11. The method of claim 6, wherein the termination condition of step (f) comprises determining when a user-specified number of instructions has been processed.

12. The method of claim 6, wherein the step (b) further comprises:

choosing an instruction list structure out of the plurality of instruction list structures in a pseudo-random manner.

13. The method of claim 7, wherein the method includes the step of:

(h) testing a device under test based on the instruction output file.

14. The method of claim 13, wherein the device under test is a microprocessor.

15. The method of claim 13, wherein the device under test is a simulation model.

16. The method of claim 7 having an input file having the list containing at least one computer instruction, the discipline field, the pick field, and a bias field, wherein the method includes the step of:

(h) resubmitting the instruction output file as the input file.

17. A method for generating dynamically-biased pseudo-random test patterns for execution by an execution device, the method comprising:

(a) creating a plurality of instruction lists in computer memory, each instruction list in the plurality of instruction lists having a list identifier, an instruction set listing at least one computer instruction, a pick value, and an instruction selection discipline value;

(b) selecting a selected instruction list from the plurality of instruction lists;

(c) selecting an instruction from the instruction set of the selected instruction list based on the selection discipline value of the selected instruction list, wherein the discipline value specifies a manner of selecting;

(d) repeating the steps (c)-(d) a number of times determined by the pick value of the selected instruction list to create a list of selected instructions in computer memory; and

(e) repeating the steps (b)-(e) until a complete computer file of selected instructions exists in computer memory.

18. The method of claim 17 further comprising:

(f) altering the complete computer file to obtain an executable file of test instructions;

(g) applying the test instructions from the executable file to the execution device for execution to determine if the execution device is properly operating.

19. The method of claim 18 further comprising:

(h) determining an expected output which is believed to be the correct output from the execution device due to execution of the test instructions from the executable file;

(i) capturing the actual output of the execution device from executing the test instructions from the executable file;

(j) comparing the actual output and the expected output to determine if the correct output was achieved as the actual output.

20. A data processor for generating test instructions used for testing a device under test, the data processor comprising:

a central processing unit (CPU); and

computer memory coupled to the central processing unit (CPU), the computer memory containing;

an array of instruction list structures wherein each instruction list structure in the array of instruction list structures contains a list of instructions;

a verification test generator which accesses the array of instruction list structures using a process defined by a list discipline field, the verification test generator choosing a plurality of instructions from at least one of the instruction list structures as a portion of the test instructions before another instruction list structure is chosen for processing; and

an output test instruction file which is used to store the plurality of instructions chosen by the verification test generator.

21. The data processor of claim 20 wherein the test instruction file is fixed in size to a limited number of instructions.

22. The data processor of claim 20, wherein each instruction list structure in the array of instruction list structures contains a discipline field which indicates whether the test instructions are chosen from the list of instructions in a random manner or in a sequential manner.

23. The data processor of claim 20 wherein computer code executes each test instruction as each test instruction is chosen in order to maintain an execution state so that subsequently chosen test instructions can be properly created.

24. The data processor of claim 20, wherein each instruction list structure in the array of instruction list structures contains a pick field which indicates how many test instructions are chosen from the list of instructions before another instruction list structure is selected.

25. The data processor of claim 20, wherein each instruction list structure in the array of instruction list structures contains a bias field which indicates how operands are determined for each test instruction.

26. The data processor of claim 20, wherein the output test instruction file is assembled into executable code and applied to a device under test to test an operation of the device under test.

27. The data processor of claim 20, wherein the output test instruction file is assembled into executable code and applied to a model under test to test an operation of the model under test.

28. A verification test generator comprising:

means for creating a plurality of list structures;

means for selecting a selected list structure from the plurality of list structures; and

means for selecting two or more test instructions from the selected list structure and writing the two or more test instructions to a test instruction file before selecting another selected list structure to continue test instruction generation; and

means for determining a discipline for selecting test instructions for each list structure in the plurality of list structures.

29. A test instruction generator stored on computer readable medium, the test instruction generator comprising:

a first plurality of computer instructions for creating a plurality of list structures, each list structure comprising a list containing at least one computer instruction, a discipline field for determining a manner for selecting computer instructions from the list containing at least one computer instruction, a pick field which indicates the number of instructions to be chosen from the list containing at least one computer instruction, and a bias field which is used to define a manner in which operands are to be generated for the computer instructions selected from the list containing at least one computer instruction;

a second plurality of computer instructions for selecting a selected list structure from the plurality of list structures using a global discipline methodology;

a third plurality of computer instructions for selecting two or more test instructions from the list of at least one computer instruction and writing the two or more test instructions to a test instruction file before selecting another selected list structure to continue test instruction generation; and

a fourth plurality of computer instructions for applying assembled test instructions from the test instruction file to a device under test to test the device under test for proper operation.

30. A data structure for allowing the creation of a data file containing test instructions for testing a CPU, the data structure comprising:

at least one list structure formed in computer memory wherein each list structure in the at least one list structures comprises;

a list identifier field;

a list of at least one test instruction which is selectable by an algorithm for inclusion in a test file used for testing an electrical device;

a discipline field which indicates a manner in which the test instructions are to be selected from the list of at least one test instructions;

a pick field which is used to indicate a number of test instructions to be sequentially selected from the list structure before another list structure is selected; and

a bias field which indicates a manner in which operands are to be created for use in each test instructions selected from the list of at least one test instructions.

31. A method for testing a microprocessor by generating and utilizing a sequence of pseudo random test instructions, the method comprising:

providing an instruction list having a list identifier, an instruction set having at least one instruction, a pick value, a bias field, and a selection discipline value;

selecting a number of selected instructions from the instruction set equal to the pick value, wherein the discipline value specifies a manner of selecting;

generating operands for the selected instructions using the bias field;

storing the selected instructions in a test file and storing the expected test results in a result file;

executing of the number of instructions using an integrated circuit design file stored in memory to maintain a state of the machine for generating proper operands of subsequent test instructions;

manufacturing a plurality of integrated circuits in accordance with the integrated circuit design file; and

applying an executable embodiment of the test file to the plurality of integrated circuits to test the plurality of integrate circuit for proper operation by comparing actual test results to contents of the result file.