Flying spot optical scanner with a high speed dithering motion

• US 5,648,649 A
• Filed: 07/28/1995
• Issued: 07/15/1997
• Est. Priority Date: 07/28/1995
• Status: Expired due to Fees

• Current Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Original Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Inventors: Bridgelall, Raj, Katz, Joseph
• Primary Examiner(s): Hajec, Donald T.
• Assistant Examiner(s): FILIPEK, JEFFER
• Application Number:
  US08/508,628
• Time in Patent Office: 718 Days
• Field of Search: 235/462, 235/467
• US Class Current: 235/462.36
• CPC Class Codes: G06K 2207/1018 Source control
• CPC Class Codes: G06K 7/10851 Circuits for pulse shaping, amplifying, eliminating noise signals, checking the function of the sensing device basic electronic circuitry H03

Abstract

An optical scanner includes a light source for producing a light beam for scanning a target wherein the light beam scans a target at a first low frequency and the beam also dithers in a direction orthogonal to the scanning direction at a second, high frequency. The dithering motion can be imparted by a oscillating mirror and allows improved reading of, for example, bar code symbols. In addition an optical scanner includes a laser light source producing a laser light beam into which a time-varying phase is introduced in order to reduce laser speckle noise.

Claims

1. In a scanner for electro-optically reading indicia by sweeping a scan spot of light along a longitudinal axis in a sweeping movement across the indicia, and by detecting light reflected off the indicia to generate an electrical signal indicative of the detected light,

an arrangement for compensating for defects in the indicia that cause reading errors, the arrangement comprising:

means for dithering the scan spot during said sweeping movement by oscillating the scan spot back and forth in opposite directions across said longitudinal axis in a transverse direction generally orthogonal to said longitudinal axis to generate a dithered scan spot that creates high frequency signal components corresponding to said defects in said electrical signal.

2. The arrangement as recited in claim 1, wherein the scanner sweeps the dithered scan spot across the indicia at a predetermined sweep frequency that is a plurality of times per second, and wherein the dithering means oscillates the dithered scan spot at a dithering frequency that is greater than said predetermined sweep frequency.

3. The arrangement as recited in claim 2, wherein the dithering means sinusoidally oscillates the dithered scan spot.

4. The arrangement as recited in claim 2, wherein the dithering means includes means for adjusting the dithering frequency.

5. The arrangement as recited in claim 2, wherein the dithering means includes means for adjusting the amplitude of the oscillations of the dithered scan spot.

6. The arrangement as recited in claim 1, and further comprising a filter for removing the high frequency signal components from said electrical signal.

7. The arrangement as recited in claim 1, wherein the dithering means includes an oscillatable reflecting mirror.

8. In a method of electro-optically reading indicia by sweeping a scan spot of light along a longitudinal axis in a sweeping movement across the indicia, and by detecting light reflected off the indicia to generate an electrical signal indicative of the detected light,

a method of compensating for defects in the indicia that cause reading errors, the method comprising the step of:

dithering the scan spot during said sweeping movement by oscillating the scan spot back and forth in opposite directions across said longitudinal axis in a transverse direction generally orthogonal to said longitudinal axis to generate a dithered scan spot that creates high frequency signal components corresponding to said defects in said electrical signal.

9. The method as recited in claim 8, wherein the dithered scan spot is swept across the indicia at a predetermined sweep frequency that is a plurality of times per second, and wherein the dithering step oscillates the dithered scan spot at a dithering frequency that is greater than said predetermined sweep frequency.

10. The method as recited in claim 9, wherein the dithering step sinusoidally oscillates the dithered scan spot.

11. The method as recited in claim 9, wherein the dithering step includes the step of adjusting the dithering frequency.

12. The method as recited in claim 9, wherein the dithering step includes the step of adjusting the amplitude of the oscillations of the dithered scan spot.

13. The method as recited in claim 8, and further comprising the step of removing the high frequency signal components from said electrical signal.

14. The method as recited in claim 8, wherein the dithering step is performed by oscillating a reflecting mirror.