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Learning system with prototype replacement

  • US 5,649,070 A
  • Filed: 02/17/1995
  • Issued: 07/15/1997
  • Est. Priority Date: 02/17/1995
  • Status: Expired due to Term
First Claim
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1. An adaptive classifier apparatus comprising:

  • means for scanning a test object and outputting a parameter signal representing a scanned physical parameter of the test object;

    means for receiving said parameter signal and for generating a test feature data based on said parameter signal;

    means for retrievably storing a first plurality of a prototype feature data and a second plurality of a prototype feature data;

    classifying means for comparing said test feature data to each of said first plurality and to each of said second plurality of prototype feature data and for generating a classifier data indicating which of said first plurality and said second plurality has a prototype feature data comparing closest to said test feature data;

    means for generating an event signal associated with said generating a classifier data;

    means for generating a usefulness data corresponding to each of said first plurality and said second plurality of prototype feature data, said usefulness data representing a frequency and recency relative to said event signal that its associated prototype feature datum is the prototype feature datum comparing closest with the test feature;

    means for modifying said stored first plurality of prototype feature data and said stored second plurality of prototype feature data based on said usefulness data.

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