Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object

• US 5,659,397 A
• Filed: 06/08/1995
• Issued: 08/19/1997
• Est. Priority Date: 06/08/1995
• Status: Expired due to Fees

• Current Assignee: AZ Technology, Inc.
• Original Assignee: AZ Technology, Inc.
• Inventors: Miller, Edgar R., Mell, Richard J.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Vierra Eisenberg, Jason D.
• Application Number:
  US08/488,996
• Time in Patent Office: 803 Days
• Field of Search: 356/445-446, 250/559.16, 250/341.8, 250/458.1
• US Class Current: 356/446
• CPC Class Codes: G01N 21/4738 Diffuse reflection precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration, e.g. also for testing fluids, fibrous materials

Abstract

A portable device for measuring total reflectance from the surface of an object by means of electromagnetic radiation has a housing defining an ellipsoidal chamber having a reflective interior surface, a first focus, an opposite second focus. The chamber defines a first aperture at the first focus, the first aperture being adapted for placement against the surface of the object so that a portion of the surface is in optical communication with the chamber. A light source illuminates the portion of the surface of the object through the first aperture with the electromagnetic radiation of a predetermined waveband, such as infrared. A means for measuring the radiation is disposed adjacent the second focus, so that when the first aperture is placed against the object, the electromagnetic radiation illuminates the object in an area adjacent the first focus. The reflected radiation, both specular and scattered, is directed by the interior reflective surface to the radiation measuring means. Disposed between the first focus and the second focus is a means for reflecting substantially all of the electromagnetic radiation from the source of focused radiation to the radiation measuring means, thereby providing a reference beam to the radiation measuring means. The ratio of the intensity of the light reflected off of the surface of the object to the intensity of the reference beam provides an indication of the absolute reflectance of the object. Also disclosed is a coating for transducing light into infrared light.

Claims

1. A device for measuring total specular and diffuse optical properties from the surface of an object by means of electromagnetic radiation, comprising:

a. a housing defining an ellipsoidal chamber having a reflective interior surface, a first focus, an opposite second focus and the chamber defining a first aperture at the first focus, the first aperture being adapted for placement against the surface of the object so that a portion of the surface is in optical communication with the chamber;

b. means for illuminating the portion of the surface of the object with the electromagnetic radiation of a predetermined waveband; and

c. means for measuring the radiation, disposed adjacent the second focus, so that when the first aperture is placed against the object, the electromagnetic radiation illuminates the object in an area adjacent the first focus with the reflected radiation, both specular and scattered, being directed by the reflective interior surface to the radiation measuring means.

2. The device of claim 1, wherein the predetermined waveband of electromagnetic radiation is in the infrared range.

3. The device of claim 1, wherein the predetermined waveband of electromagnetic radiation is in the near-infrared range.

4. The device of claim 1, wherein the predetermined waveband of electromagnetic radiation is in the visible range.

5. The device of claim 1, wherein the predetermined waveband of electromagnetic radiation is in the ultraviolet range.

6. The device of claim 1, wherein the illuminating means comprises a source of focused electromagnetic radiation of the predetermined waveband.

7. The device of claim 6 wherein the source of focused electromagnetic radiation comprises a lamp having a surface coated with a material that absorbs light emitted by the lamp and emits electromagnetic radiation of the predetermined waveband.

8. The device of claim 6 further comprising means, disposed between the first focus and the second focus, for reflecting substantially all of the electromagnetic radiation from the source of focused radiation to the radiation measuring means, thereby providing a reference beam to the radiation measuring means.

9. The device of claim 8 wherein the reflecting means comprises:

a. a mirror having a first end disposed outside the chamber, an opposite second end disposed inside the chamber, a reflective top surface and an opposite bottom surface, the mirror being movable between a first position and a second position; and

b. means for moving the mirror between the first position and the second position,

so that when the mirror is in the first position, a portion of the reflective top surface is disposed within the chamber thereby reflecting substantially all of the electromagnetic radiation toward the second focus and when the mirror is in the second position, substantially all of the reflective top surface is disposed outside of the path of the electromagnetic radiation from the illuminating means, thereby allowing the focused electromagnetic radiation to illuminate the object unimpeded by the mirror.

10. The device of claim 6, wherein the housing defines a second aperture passing therethrough and wherein the source of electromagnetic radiation is external to the chamber and comprises:

a. means for generating electromagnetic radiation of the predetermined waveband;

b. means for focusing the electromagnetic radiation into a beam; and

c. means for directing the beam through the second aperture onto the portion of the surface of the object.

11. The device of claim 10 further comprising means for periodically interrupting the beam of electromagnetic radiation.

12. The device of claim 11 wherein the interrupting means comprises:

a. a rotatable disk disposed between the source of electromagnetic radiation and the surface of the object and having an opening passing therethrough; and

b. means for rotating the disk at a predetermined period of rotation, the beam of electromagnetic radiation directed so that the beam of electromagnetic radiation passes through the opening for a portion of the period of rotation and is blocked by the disk for a portion of the period of rotation.

13. The device of claim 1, wherein the housing comprises an aluminum ellipsoid having a polished interior surface.

14. The device of claim 1, wherein the housing comprises gold coated nickel.

15. The device of claim 1, wherein the housing comprises aluminum coated nickel.

16. The device of claim 1, wherein the housing comprises two hemi-ellipsoids each having a wide end, a more narrow end and a polished interior surface, the wide ends of the hemi-ellipsoids in an abutting relationship with each other.

17. A portable device for measuring the total specular and diffuse reflectance from a surface of an object, comprising:

a. a frame having a bottom side;

b. a housing disposed within the frame and defining an ellipsoidal reflector, the reflector comprising a reflective inside surface, a major axis, a first focus and an opposite second focus disposed along the major axis, the reflector truncated by a plane perpendicular to the major axis at the first focus and defining an aperture therethrough, the reflector disposed so that the aperture is adjacent the bottom side of the frame so that when the bottom side of the frame is placed against the surface of the object, a portion of the surface is adjacent the first focus and in optical communication with the inside of the reflector;

c. means, disposed within the frame, for illuminating a portion of the surface with electromagnetic radiation having a predetermined wave band;

d. means for directing the beam to the portion of the outer surface; and

e. means, disposed along a plane perpendicular to the major axis at the second focus, for measuring the intensity of the reflected electromagnetic radiation reflected off of the portion of the surface and for generating a signal representative of the measured intensity.

18. The device of claim 17 wherein the illuminating means comprises:

a. means, disposed within the frame, for generating a beam of light within the predetermined waveband;

b. means for directing the beam onto the surface portion of the object; and

c. means for limiting the mount of heat transferred from the beam to the object.

19. The device of claim 18 wherein the limiting means comprises means, disposed between the beam generating means and the portion of the outer surface, for periodically interrupting the beam.

20. The device of claim 19 wherein the interrupting means comprises:

a. a rotatable disk, disposed between the source of electromagnetic radiation and the surface of the object, having an opening passing therethrough; and

b. means for rotating the disk at a predetermined period of rotation, the beam of electromagnetic radiation directed so that the beam of electromagnetic radiation passes through the opening for a portion of the period of rotation and is blocked by the disk for a portion of the period of rotation.

21. The device of claim 17 wherein the beam generating means is disposed outside the housing and the housing has a second aperture passing therethrough adapted to allow passage of the beam onto the portion of the outer surface.

22. The device of claim 17 further comprising means, disposed between the first focus and the second focus, for reflecting substantially all of the electromagnetic radiation from the source of focused radiation to the radiation measuring means, thereby providing a reference beam to the radiation measuring means.

23. The device of claim 22 wherein the reflecting means comprises:

a. a mirror having a first end disposed outside the chamber, an opposite second end disposed inside the chamber, a reflective top surface and an opposite bottom surface, the mirror being movable between a first position and a second position; and

b. means for moving the mirror between the first position and the second position,

so that when the mirror is in the first position, a portion of the reflective top surface is disposed within the chamber thereby reflecting substantially all of the electromagnetic radiation toward the second focus and so that when the mirror is in the second position, substantially all of the reflective top surface is disposed outside of the path of the electromagnetic radiation from the illuminating means, thereby allowing the focused electromagnetic radiation to illuminate the object unimpeded by the mirror.

24. The device of claim 23 further comprising calculation means, responsive to the signal representative of the measured intensity, for determining the absolute total hemispheric reflectance of the portion of the surface by calculating the ratio of the measured intensity of the reflected beam when the mirror is in the second position divided by the measured intensity of the reflected beam when the mirror is in the first position.

25. The device of claim 17 further comprising means for holding the frame against the outer surface.

26. The device of claim 25 wherein the holding means comprises a handle removably affixed to the frame.

27. The device of claim 17 further comprising a plate, removably attached to the bottom side of the frame and defining a hole in alignment with the first aperture, comprising a highly reflective material for stabilizing the device when used on non-concave surfaces.

28. The device of claim 17 wherein the housing defines a plurality of spaced apart apertures and the illuminating means is moveable relative to the housing to allow the measurement of angular optical properties.

29. The device of claim 28 wherein the plurality of spaced apart apertures are defined along a line parallel to the major axis of the ellipsoidal chamber.

30. The device of claim 28 wherein the plurality of spaced apart apertures are defined along a line perpendicular to the major axis of the ellipsoidal chamber.

31. The device of claim 17 wherein the housing is rotatable around a minor axis of the ellipsoidal chamber, the housing having a first position and a second position and wherein the housing defines a third aperture, so that when the housing is in the first position, the beam is directed through the third aperture to the measuring means, and so that when the housing is in the second position, the beam is directed through the first aperture.

32. The device of claim 17 wherein the reflected beam has a diffuse component and a specular component, and wherein the housing defines an exit aperture, the exit aperture being disposed so that the specular component of the reflected beam exits through the exit aperture, thereby allowing the device to perform measurements of the optical scatter properties of a surface.

33. A method for measuring total specular and diffuse reflectance from the surface of an object, comprising the steps of:

a. placing against the surface of the object an ellipsoidal reflector, having a reflective interior surface, a first focus, an opposite second focus and defining a first aperture at the first focus, the first aperture being adapted for placement against the surface of the object;

b. illuminating, with a beam of electromagnetic radiation of a predetermined waveband, a portion of the surface through an aperture in the ellipsoidal reflector;

c. reflecting, with the ellipsoidal reflector, a portion of the electromagnetic radiation reflected from the surface of the object, both specular and diffuse, to a detector adjacent the second focus; and

d. measuring a value of the reflected radiation with the detector.

34. The method of claim 33, wherein the predetermined waveband of electromagnetic radiation is in the infrared range.

35. The method of claim 33, wherein the predetermined waveband of electromagnetic radiation is in the near-infrared range.

36. The method of claim 33, wherein the predetermined waveband of electromagnetic radiation is in the visible range.

37. The method of claim 33, wherein the predetermined waveband of electromagnetic radiation is in the ultraviolet range.

38. The method of claim 33 further comprising the step of taking a base-line measurement with the measurement instrument to achieve an absolute measurement of reflectance.

39. The method of claim 38 wherein the base-line measuring step comprises the steps of:

a. placing a reflector, having a reflectance substantially equal to the predetermined reflectance of the ellipsoidal reflector, in the beam of electromagnetic radiation so that substantially all of the electromagnetic radiation is diverted from the portion of the surface of the object to detector;

b. measuring the radiation reflected from the reflector; and

c. storing a value of the measured base-line radiation.

40. The method of claim 39 further comprising determining the reflectance of the surface of the object by dividing the value of the radiation reflected off of the object by the value of the stored base-line radiation reflected from the reflector.