Multiple model supervisor control system and method of operation

• US 5,659,467 A
• Filed: 06/26/1996
• Issued: 08/19/1997
• Est. Priority Date: 06/26/1996
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Vickers, Kenneth G.
• Primary Examiner(s): Elmore, Reba I.
• Assistant Examiner(s): PATEL, RAMESH B
• Application Number:
  US08/672,468
• Time in Patent Office: 419 Days
• Field of Search: 364/130, 364/138, 364/496, 364/189, 364/550, 364/551.01, 364/551.02, 364/552, 364/553, 364/554, 364/180, 395/159, 395/161
• US Class Current: 700/9
• CPC Class Codes: G05B 17/02 electric
• CPC Class Codes: G05B 19/41875 characterised by quality surveillance of production
• CPC Class Codes: G05B 2219/32191 Real time statistical process monitoring
• CPC Class Codes: G05B 2219/32196 Store audit, history of inspection, control and workpiece data into database
• CPC Class Codes: G05B 2219/32201 Build statistical model of past normal proces, compare with actual process
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

A multiple model supervisor control system (24) for use in a manufacturing environment (10) including a plurality of model based statistical process control units (14₁ -14_N) associated with equipment (#1-#N) is provided. The multiple model supervisor control system (24) includes a database (16) storing model coefficient shift data representing statistically significant drifts in output measurables that are associated with the model based statistical process control units (14₁ -14_N). A supervisor control unit (26) is coupled to the database (16) and is operable to access the coefficient shift data stored in the database (16). A multiple model map (30) of coefficient shift history is generated by the supervisor control unit (26) and shows the coefficient shift data against a common domain. A user interface (28) is coupled to the supervisor control unit (26) to provide user access to the multiple model map (30) to allow identification of problems caused by equipment drift and problems caused by environmental change.

Claims

1. A multiple model supervisor control system for use in a manufacturing environment including a plurality of model based statistical process control units associated with equipment, the multiple model supervisor control system comprising:

a database which stores model coefficient shift data received from a plurality of model based statistical process control units, the coefficient shift data representing statistically significant drifts in output measurables that are associated with the model based statistical process control units;

a supervisor control unit coupled to the database, the supervisor control unit operable to access the coefficient shift data stored in the database;

a multiple model map of coefficient shift history generated by the supervisor control unit, the multiple model map showing a history of the coefficient shift data for the equipment against a common domain; and

a user interface coupled to the supervisor control unit, the user interface operable to provide user access to the multiple model map of coefficient shift history to allow identification of problems caused by equipment drift and problems caused by environmental change.

2. The multiple model supervisor control system of claim 1, further comprising an expert system operable to access the multiple model map of coefficient shift history and to automatically identify problems and previously unidentified problems.

3. The multiple model supervisor control system of claim 1, further comprising:

a pattern database comprising patterns identified as indicating specified problems; and

an expert system operable to access pattern database and the multiple model map of coefficient shift history and to automatically identify problems by matching to patterns in the pattern database.

4. The multiple model supervisor control system of claim 1, wherein the common domain comprises time.

5. The multiple model supervisor control system of claim 1, wherein the common domain comprises events.

6. The multiple model supervisor control system of claim 1, wherein the common domain comprises accumulated parameters.

7. The multiple model supervisor control system of claim 1, wherein the supervisor control unit is further operable to generate a multiple model map automatically after coefficient shift data is received by the database.

8. The multiple model supervisor control system of claim 1, wherein the supervisor control unit is further operable to generate a multiple model map automatically at a specified time.

9. A manufacturing environment, comprising:

a plurality of pieces of equipment each operable to produce a product and to provide equipment control settings data;

a plurality of model based statistical process control units, each model based statistical process control unit associated with one of the plurality of pieces of equipment, the model based statistical process control units operable to receive the equipment control settings data and to receive material measurements data and the model based statistical process control units operable to provide control data for associated equipment and to provide coefficient shift data representing statistically significant drifts in associated output measurables;

a database storing model coefficient shift data received from the plurality of model based statistical process control units;

a supervisor control unit coupled to the database, the supervisor control unit operable to access the coefficient shift data stored in the database and to receive domain information;

a multiple model map of coefficient shift history generated by the supervisor control unit, the multiple model map showing a history of the coefficient shift data for each of the plurality of models against a common domain; and

a user interface coupled to the supervisor control unit, the user interface operable to provide user access to the multiple model map of coefficient shift history to allow identification of problems caused by machine drift and problems caused by environmental change.

10. The manufacturing environment of claim 9, further comprising an expert system operable to access the multiple model map of coefficient shift history and to automatically identify problems and prior unknown patterns.

11. The manufacturing environment of claim 9, further comprising:

a pattern database comprising patterns identified as indicating specified problems; and

an expert system operable to access pattern database and the multiple model map of coefficient shift history and to automatically identify problems by matching to patterns in the pattern database.

12. The manufacturing environment of claim 9, wherein the supervisor control unit is further operable to generate a multiple model map automatically after coefficient shift data is received by the database.

13. The manufacturing environment of claim 9, wherein the supervisor control unit is further operable to generate a multiple model map automatically at a specified time.

14. A method for operating a computer system to provide a multiple model supervisor control system for use in a manufacturing environment including a plurality of model based statistical process control units associated with equipment, the method comprising:

creating a database storing model coefficient shift data received from a plurality of model based statistical process control units, the coefficient shift data representing statistically significant drifts in operation parameters of equipment associated with the model based statistical process control units;

generating a multiple model map of coefficient shift history by showing a history of the coefficient shift data for the equipment against a common domain; and

analyzing the multiple model map of coefficient shift history to identify problems caused by machine drift and problems caused by environmental change.

15. The method of claim 14, wherein analyzing the multiple model map of coefficient shift history is accomplished by an expert system to automatically identify problems and new patterns.

16. The method of claim 14, further comprising providing a pattern database comprising patterns identified as indicating specified problems, and wherein analyzing the multiple model map of coefficient shift history is accomplished by an expert system to automatically identify problems by matching to patterns in the pattern database.

17. The method of claim 14, wherein generating a multiple model map uses time as the common domain.

18. The method of claim 14, wherein generating a multiple model map uses events as the common domain.

19. The method of claim 14, wherein generating a multiple model map uses parameter accumulation as the common domain.

20. The method of claim 14, wherein generating the multiple model map is accomplished automatically after coefficient shift data is received in the step of creating.