System and method for executing on board diagnostics and maintaining an event history on a circuit board

• US 5,663,656 A
• Filed: 03/13/1996
• Issued: 09/02/1997
• Est. Priority Date: 06/17/1994
• Status: Expired due to Term

• Current Assignee: EMC Corporation (Dell Technologies Inc.)
• Original Assignee: EMC Corporation (Dell Technologies Inc.)
• Inventors: Wilson, Robert, Pritoni, Harold F. Jr.
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US08/614,620
• Time in Patent Office: 538 Days
• Field of Search: 324/537, 324/763, 324/764, 364/580, 364/579, 364/571.04, 364/571.08, 364/570, 371/22.5, 371/22.6, 437/8, 340/635, 340/653
• US Class Current: 324/763.01
• CPC Class Codes: G06F 11/2205 using arrangements specific to the hardware being tested

Abstract

A system and method for executing on board diagnostics in connection with automated test hardware and maintaining an event history on a circuit board having a microprocessor and diagnostic routines stored in read only memory (ROM). The testing of a circuit board by automated test equipment causes a microprocessor on the circuit board to execute the diagnostic routines stored in read only memory on the circuit board. Upon completion of the diagnostic routines, the results generated by the routines are stored in non-volatile memory (NVRAM) on the circuit board. Upon completion of the remaining circuit board testing, the results of that testing are also written to the non-volatile memory on the circuit board. Other events occurring during in the production and use of the circuit board may also be written to the non-volatile memory on the circuit board to maintain a log for diagnostic and statistical purposes.

Claims

1. A method of maintaining an event history of a circuit board comprising the steps of:

placing said circuit board on a test fixture;

testing said circuit board on said test fixture;

detecting a first event as a result of said testing of said circuit board;

placing said circuit board in a system;

testing said system;

detecting a second event as a result of said testing of said system; and

storing an indication of said first and second events in a non-volatile memory on said circuit board.

2. The method of claim 1 wherein each of said first and second events is indicative of the completion of the execution of a respective diagnostic routine and wherein said method includes the step of storing in said non-volatile memory, data indicative of the result of the execution of said first or second diagnostic routine.

3. The method of claim 2 wherein said storing step includes the step of storing in said non-volatile memory, in the presence of a failure of the execution of said first or second diagnostic routine, data indicative of the reason for said failure to complete said first or second diagnostic routine, respectively.

4. The method of claim 1 wherein said indication includes a timestamp.

5. A method of maintaining an event history of a circuit board during a manufacturing process comprising the steps of:

successively placing said circuit board on each of a plurality of test fixtures during the manufacturing process;

successively testing said circuit board on each of said plurality of test fixtures;

detecting a diagnostic event as a result of at least some of said successive testing; and

storing an indication of said diagnostic event in a non-volatile memory on said circuit board.