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Method and apparatus for testing of semiconductor devices

  • US 5,668,745 A
  • Filed: 10/20/1995
  • Issued: 09/16/1997
  • Est. Priority Date: 10/20/1995
  • Status: Expired due to Term
First Claim
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1. A method useful in a computer system having a data processing unit operative with a memory, data retrieval circuitry and a user interface to determine whether a semiconductor device conforms to design requirements based on data stored in a design database and an automatic test equipment ("ATE") data log, the method comprising:

  • retrieving design database data from the design database;

    retrieving ATE data from the automatic test equipment ("ATE") datalog, the ATE data being generated by a test program executed on the ATE which applies test data to the semiconductor device, the test program being responsive to the design database data;

    generating a standard datalog responsive to the ATE data such that the standard datalog represents actual data produced by the semiconductor device in response to the test data applied to the semiconductor device by the ATE;

    generating a requirements datalog from the design database data such that a one-to-one correspondence exists between each test performed by the ATE and verification data in the requirements datalog whereby the verification data represents data to verify that the actual data produced by the semiconductor device conforms to design requirements;

    comparing the requirements datalog to the standard datalog to determine whether the semiconductor device conforms to design requirements.

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