Method and apparatus for testing of semiconductor devices
First Claim
1. A method useful in a computer system having a data processing unit operative with a memory, data retrieval circuitry and a user interface to determine whether a semiconductor device conforms to design requirements based on data stored in a design database and an automatic test equipment ("ATE") data log, the method comprising:
- retrieving design database data from the design database;
retrieving ATE data from the automatic test equipment ("ATE") datalog, the ATE data being generated by a test program executed on the ATE which applies test data to the semiconductor device, the test program being responsive to the design database data;
generating a standard datalog responsive to the ATE data such that the standard datalog represents actual data produced by the semiconductor device in response to the test data applied to the semiconductor device by the ATE;
generating a requirements datalog from the design database data such that a one-to-one correspondence exists between each test performed by the ATE and verification data in the requirements datalog whereby the verification data represents data to verify that the actual data produced by the semiconductor device conforms to design requirements;
comparing the requirements datalog to the standard datalog to determine whether the semiconductor device conforms to design requirements.
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Accused Products
Abstract
A computer-based method is provided for determining whether a semi-conductor device conforms to design requirements. In one embodiment, the method is based on data stored in a design database, and an automatic test equipment ("ATE") datalog. In a further embodiment, the method includes generating a requirements datalog responsive to the design database, generating a standard datalog responsive to the automatic test equipment datalog, and generating a conformance indication responsive to the requirements datalog and the standard datalog.
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Citations
11 Claims
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1. A method useful in a computer system having a data processing unit operative with a memory, data retrieval circuitry and a user interface to determine whether a semiconductor device conforms to design requirements based on data stored in a design database and an automatic test equipment ("ATE") data log, the method comprising:
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retrieving design database data from the design database; retrieving ATE data from the automatic test equipment ("ATE") datalog, the ATE data being generated by a test program executed on the ATE which applies test data to the semiconductor device, the test program being responsive to the design database data; generating a standard datalog responsive to the ATE data such that the standard datalog represents actual data produced by the semiconductor device in response to the test data applied to the semiconductor device by the ATE; generating a requirements datalog from the design database data such that a one-to-one correspondence exists between each test performed by the ATE and verification data in the requirements datalog whereby the verification data represents data to verify that the actual data produced by the semiconductor device conforms to design requirements; comparing the requirements datalog to the standard datalog to determine whether the semiconductor device conforms to design requirements. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A computer-based system, having a data processing unit operative with a memory, data retrieval circuitry, and a user interface, for testing a semiconductor device, the system being responsive to a design database and an automatic test equipment ("ATE") datalog and comprising:
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a datalog requirements generator responsive to the design database which generates a requirements datalog from the design database such that a one-to-one correspondence exists between each test performed by the ATE and verification data in the requirements datalog, whereby the verification data represents data to verify that actual data produced by the semiconductor device conforms to design requirements; a standard datalog generator responsive to the automatic test equipment datalog which generates a standard datalog such that the standard datalog represents the actual produced by the semiconductor device in response to the test data applied to the semiconductor device by the ATE; a verification circuit which compares the requirements datalog and the standard datalog to produce a device conformance indication. - View Dependent Claims (8, 9, 10, 11)
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Specification