Surface inspection system for detecting various surface faults
First Claim
Patent Images
1. A surface inspection system, comprising:
- detection means for detecting an image of a surface fault in a running sheet material;
fault area judgement means connected to said detection means for receiving said image and for determining a fault area including a cluster fault composed of the same type of fault parts; and
recognition means connected to said detection means for receiving said image, connected to said fault area judgement means for receiving said fault area, and for recognizing a type and a grade of said cluster fault included in said fault area.
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Abstract
A surface inspection system including, a detection circuit for detecting an image of a surface fault in a runing sheet material, a fault area judgement circuit connected to the detection circuit for receiving the image and for determining a fault area including a cluster fault composed of the same type of fault parts, and a recognition circuit connected to the detection circuit for receiving the image, connected to the fault area judgement circuit for receiving the fault area, and for recognizing a type and a grade of the cluster fault included in the fault area.
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Citations
12 Claims
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1. A surface inspection system, comprising:
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detection means for detecting an image of a surface fault in a running sheet material; fault area judgement means connected to said detection means for receiving said image and for determining a fault area including a cluster fault composed of the same type of fault parts; and recognition means connected to said detection means for receiving said image, connected to said fault area judgement means for receiving said fault area, and for recognizing a type and a grade of said cluster fault included in said fault area.
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2. A surface inspection system, comprising:
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detection means for detecting an image of a surface fault in a running sheet material; fault area judgement means connected to said detection means for receiving said image and for determining a fault area including a cluster fault composed of the same type of fault parts; and recognition means connected to said detection means for receiving said image, connected to said fault area judgement means for receiving said fault area, and for recognizing a type and a grade of said cluster fault included in said fault area; wherein said fault are judgement means includes; a binary imaging circuit connected to said detection means for receiving said image and for binary imaging said image to generate binary image patterns; a grouping judgement circuit connected to said binary imaging circuit for receiving said binary image patterns and for judging a fault composed of the same type of said fault parts as said cluster fault from said binary image patterns; and a segmentation circuit connected to said grouping judgement circuit for receiving said cluster fault and for determining said fault area including said cluster fault by judging the separation of said cluster fault. - View Dependent Claims (3, 4, 5, 6)
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7. A surface inspection system, comprising:
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a detector detecting an image of a surface fault in a running sheet material; a fault area judgement circuit connected to said detector and receiving said image and for determining a fault area including a cluster fault composed of the same type of fault parts; and a recognition circuit connected to said detector and receiving said image, connected to said fault area judgement circuit and receiving said fault area, and for recognizing a type and a grade of said cluster fault included in said fault area.
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8. A surface inspection system, comprising:
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a detector detecting an image of a surface fault in a running sheet material; a fault area judgement circuit connected to said detector and receiving said image and for determining a fault area including a cluster fault composed of the same type of fault parts; and a recognition circuit connected to said detector and receiving said image, connected to said fault area judgement circuit and receiving said fault area, and for recognizing a type and a grade of said cluster fault included in said fault area; wherein said fault are judgement circuit includes; a binary imaging circuit connected to said detection means for receiving said image and for binary imaging said image to generate binary image patterns; a grouping judgement circuit connected to said binary imaging circuit for receiving said binary image patterns and for judging a fault composed of the same type of said fault parts as said cluster fault from said binary image patterns; and a segmentation circuit connected to said grouping judgement circuit for receiving said cluster fault and for determining said fault area including said cluster fault by judging the separation of said cluster fault. - View Dependent Claims (9, 10, 11, 12)
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Specification