System level latchup mitigation for single event and transient radiation effects on electronics
First Claim
1. A system for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising:
- a power bus switchably connected to a micro-electronic circuit;
power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit;
ionizing radiation pulse detection means for detecting a pulse of prompt ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of the pulse of prompt ionizing radiation;
current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and
logic means having an input terminal connected to the output terminal of the ionizing radiation pulse detection means and also connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon detection of a pulse of prompt ionizing radiation or occurrence of excess current through the power bus.
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Accused Products
Abstract
A "blink" technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection circuitry, power dump logic circuitry, and energy limiting measures with autonomous recovery. The event detection circuitry includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation. The current sensing circuitry is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The power dump circuitry includes power dump logic circuitry having a first input terminal connected to the output terminal of the ionizing radiation pulse detection circuitry and having a second input terminal connected to the output terminal of the current sensing circuitry. The power dump logic circuitry provides an output signal to the input terminal of the circuitry for opening the power bus and the circuitry for shorting the power bus to a ground potential to remove power from the power bus. The energy limiting circuitry with autonomous recovery includes circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential. The circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential includes a series FET and a shunt FET. The invention provides for self-contained sensing for latchup, first removal of power to protect latched components, and autonomous recovery to enable transparent operation of other system elements.
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Citations
20 Claims
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1. A system for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising:
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a power bus switchably connected to a micro-electronic circuit; power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit; ionizing radiation pulse detection means for detecting a pulse of prompt ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of the pulse of prompt ionizing radiation; current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and logic means having an input terminal connected to the output terminal of the ionizing radiation pulse detection means and also connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon detection of a pulse of prompt ionizing radiation or occurrence of excess current through the power bus. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system for mitigating the effects of destructive radiation on a micro-electronic circuit comprising:
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a power bus switchably connected to a micro-electronic circuit; power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit; current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and logic means having an input terminal connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon occurrence of excess current through the power bus caused by destructive radiation. - View Dependent Claims (11, 12, 13, 14, 15)
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16. A method for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising the steps of:
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providing an output voltage on a power bus for a micro-electronic circuit; detecting a pulse of ionizing radiation and providing a detection signal indicative of the detection of the pulse of ionizing radiation and providing an indicative thereof; determining an occurrence of excess current through said power bus and providing an excess-current alarm signal indicative thereof; and disabling the power bus in response to the ionizing-radiation alarm signal or to the excess-current alarm signal. - View Dependent Claims (17, 18, 19, 20)
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Specification