System level latchup mitigation for single event and transient radiation effects on electronics

• US 5,672,918 A
• Filed: 08/18/1994
• Issued: 09/30/1997
• Est. Priority Date: 08/18/1994
• Status: Expired due to Fees

• Current Assignee: United States Department of Energy (Government of the United States of America)
• Original Assignee: United States Department of Energy (Government of the United States of America)
• Inventors: Kimbrough, Joseph Robert, Colella, Nicholas John
• Primary Examiner(s): Shoop, Jr., William M.
• Assistant Examiner(s): KAPLAN, JONATHAN STUART
• Application Number:
  US08/291,086
• Time in Patent Office: 1,139 Days
• Field of Search: 307/112, 307/113, 307/115, 307/125, 307/126, 307/131, 361/54, 361/55, 361/56, 361/57, 257/428, 257/431, 257/467, 257/472, 363/50, 250/389, 340/600
• US Class Current: 307/126
• CPC Class Codes: H02H 5/005 responsive to ionising radiation; Nuclear-radiation circumvention circuits radiation detectors G01T; nuclear-explosion detection G21J5/00

Abstract

A "blink" technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection circuitry, power dump logic circuitry, and energy limiting measures with autonomous recovery. The event detection circuitry includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation. The current sensing circuitry is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The power dump circuitry includes power dump logic circuitry having a first input terminal connected to the output terminal of the ionizing radiation pulse detection circuitry and having a second input terminal connected to the output terminal of the current sensing circuitry. The power dump logic circuitry provides an output signal to the input terminal of the circuitry for opening the power bus and the circuitry for shorting the power bus to a ground potential to remove power from the power bus. The energy limiting circuitry with autonomous recovery includes circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential. The circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential includes a series FET and a shunt FET. The invention provides for self-contained sensing for latchup, first removal of power to protect latched components, and autonomous recovery to enable transparent operation of other system elements.

Claims

1. A system for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising:

a power bus switchably connected to a micro-electronic circuit;

power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit;

ionizing radiation pulse detection means for detecting a pulse of prompt ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of the pulse of prompt ionizing radiation;

current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and

logic means having an input terminal connected to the output terminal of the ionizing radiation pulse detection means and also connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon detection of a pulse of prompt ionizing radiation or occurrence of excess current through the power bus.

2. The system of claim 1 wherein the power dump means includes means for opening the power bus.

3. The system of claim 2 wherein the power dump means further includes means for shorting the power bus to a ground potential to remove power from the power bus.

4. The system of claim 3 wherein the means for opening the power bus and means for shorting the power bus to a ground potential includes a series FET and a shunt FET.

5. The system of claim 1 including a DC/DC converter for providing power to the power bus wherein the DC/DC converter includes an inhibit input terminal.

6. The system of claim 1 wherein the current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus includes a resistor in series with the power bus across which is developed a sensing voltage and includes a comparator circuit for comparing the sensing voltage with a reference voltage.

7. The system of claim 1 including autonomous recovery means for restoration of power upon time out of the radiation pulse detector.

8. The system of claim 1 wherein the logic means comprises FET switches.

9. The system of claim 1 wherein:

said ionizing radiation pulse detection means also includes a test input terminal which when activated also produces a detection signal at the output terminal; and

said output terminal of said current sensing means is connected to the test input terminal of the ionizing radiation pulse detection means rather than to the input terminal of the logic means, whereby said power dump means switchably disconnects the power bus from the micro-electronic circuit upon receiving said output signal from said logic means, which results from receipt of said detection signal indicative of the detection of the pulse of ionizing radiation, which in turn results from said control signal from said current sensing means that is connected to the test input terminal of the ionizing radiation pulse detection means that indicates an occurrence of excess current through the power bus.

10. A system for mitigating the effects of destructive radiation on a micro-electronic circuit comprising:

a power bus switchably connected to a micro-electronic circuit;

power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit;

current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and

logic means having an input terminal connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon occurrence of excess current through the power bus caused by destructive radiation.

11. The system of claim 10 wherein the logic means comprises FET switches.

12. The system of claim 10 wherein the current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus includes a resistor in series with the power bus across which is developed a sensing voltage and includes a comparator circuit for comparing the sensing voltage with a reference voltage.

13. The system of claim 10 wherein the power dump means includes means for opening the power bus.

14. The system of claim 13 wherein the power dump means further includes means for shorting the power bus to a ground potential to remove power from the power bus.

15. The system of claim 13 wherein the means for opening the power bus and means for shorting the power bus to a ground potential includes a series FET and a shunt FET.

16. A method for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising the steps of:

providing an output voltage on a power bus for a micro-electronic circuit;

detecting a pulse of ionizing radiation and providing a detection signal indicative of the detection of the pulse of ionizing radiation and providing an indicative thereof;

determining an occurrence of excess current through said power bus and providing an excess-current alarm signal indicative thereof; and

disabling the power bus in response to the ionizing-radiation alarm signal or to the excess-current alarm signal.

17. The method of claim 16 wherein the step of disabling the power bus includes opening the power bus and shorting the power bus to a ground potential to quickly remove power from the power bus in response to an ionizing-radiation alarm signal or to an excess-current alarm signal.

18. The method of claim 17 wherein the step of opening the power bus and shorting the power bus to a ground potential includes activating a series FET and a shunt FET.

19. The method of claim 18 wherein the step of determining an occurrence of excess current through said power bus includes sensing a voltage across a resistor in series with the power bus and comparing the sensing voltage with a reference voltage.

20. The method of claim 16 wherein the step of providing an output voltage on a power bus includes providing a DC/DC converter for providing power to the power bus.