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System level latchup mitigation for single event and transient radiation effects on electronics

  • US 5,672,918 A
  • Filed: 08/18/1994
  • Issued: 09/30/1997
  • Est. Priority Date: 08/18/1994
  • Status: Expired due to Fees
First Claim
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1. A system for mitigating the effects of destructive radiation on a micro-electronic circuit, comprising:

  • a power bus switchably connected to a micro-electronic circuit;

    power dump means, having an input terminal and an output terminal, for switchably disconnecting the power bus from the microelectronic circuit;

    ionizing radiation pulse detection means for detecting a pulse of prompt ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of the pulse of prompt ionizing radiation;

    current sensing means coupled to said power bus for determining an occurrence of excess current through said power bus resulting from destructive single-event-phenomena or from prompt ionizing radiation pulses, said current sensing means having an output terminal at which is provided a control signal indicative of the occurrence of excess current through the power bus; and

    logic means having an input terminal connected to the output terminal of the ionizing radiation pulse detection means and also connected to the output terminal of the current sensing means, said logic means providing an output signal to the input terminal of said power dump means, said power dump means switchably disconnecting the power bus from the micro-electronic circuit upon receipt of the output signal from said logic means upon detection of a pulse of prompt ionizing radiation or occurrence of excess current through the power bus.

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