Charge-redistribution analog-to-digital converter with reduced comparator-hysteresis effects

• US 5,675,340 A
• Filed: 04/07/1995
• Issued: 10/07/1997
• Est. Priority Date: 04/07/1995
• Status: Expired due to Term

• Current Assignee: Iowa State University Research Foundation Incorporated (Iowa State University)
• Original Assignee: Iowa State University Research Foundation Incorporated (Iowa State University)
• Inventors: Hester, Richard Knight, Bright, William J.
• Primary Examiner(s): DEBOER, TODD
• Application Number:
  US08/418,767
• Time in Patent Office: 914 Days
• Field of Search: 341/156, 341/118, 341/150, 341/172
• US Class Current: 341/156
• CPC Class Codes: H03M 1/06 Continuously compensating for, or preventing, undesired influence of physical parameters periodically, e.g. by using stored correction values, H03M1/10
• CPC Class Codes: H03M 1/468 in which the input S/H circuit is merged with the feedback DAC array
• CPC Class Codes: H03M 1/804 with charge redistribution

Abstract

Methods and apparatus for an analog-to-digital converter (ADC) with reduced comparator-hysteresis effects. One embodiment uses a charge-redistribution ADC. One method performs an initial coarse analog-to-digital conversion to avoid overdriving an analog voltage comparator. One such method includes a redundant capacitor in an array of charge-redistribution capacitors used in the ADC for sample-and-hold and successive-approximation functions. Another method performs a traditional initial successive-approximation analog-to-digital conversion, and then performs an additional conversion-step test based on the least-significant bit of the initial result to correct for comparator errors in the initial conversion.

Claims

1. A successive-approximation analog-to-digital converter (ADC) circuit comprising:

a comparator having a first input coupled to an analog input signal that is to be converted into an ADC-digital-output value by the ADC circuit, said ADC-digital-output value having a plurality of N bits, a second input, and an output;

a coarse ADC converter having an input coupled to said analog input signal, and an M-bit coarse digital output, wherein said coarse ADC converter generates a plurality of M bits corresponding to M most-significant bits of said ADC-digital-output value on said M-bit coarse digital output, and wherein M is less than N;

successive-approximation logic having a first input connected to said output of said comparator, a second input connected to said M-bit coarse digital output, and an output; and

a digital-to-analog converter having an input connected to said output of said successive-approximation logic and an analog output coupled to said second input of said comparator.

2. The successive-approximation ADC circuit according to claim 1 wherein said M-bit coarse digital output corresponds to an M-bit digital value, corresponding to said analog input signal, decremented by one.

3. The successive-approximation ADC circuit according to claim 1 wherein said successive-approximation ADC circuit operates with a sampling period of time followed by a successive-approximation search, and wherein said coarse ADC converter operates during said sampling period to provide a decremented M-bit coarse digital estimate of said analog input signal to said successive-approximation logic in order that said successive-approximation search begins at a digital value close to a correct result of said ADC-digital-output value, in order to minimize overdriving said comparator.

4. The successive-approximation ADC circuit according to claim 1 wherein said coarse ADC converter comprises a flash converter.

5. The successive-approximation ADC circuit according to claim 3 wherein said coarse ADC converter comprises a flash converter.

6. The successive-approximation ADC circuit according to claim 1, further comprising an incrementor/decrementor capable of selectively incrementing or decrementing said digital output of said successive-approximation logic.

7. The successive-approximation ADC circuit according to claim 6, wherein said ADC-digital-output value is determined as a reslt of:

(a) if at least-significant bit of said digital output of said successive-approximation logic is one, then incrementing said digital output of said successive-approximation logic in order to generate an incremented digital output value, and retesting the output of said comparator by comparing an analog signal corresponding to said incremented digital output value;

else

(b) if said least-significant bit of said digital output of said successive-approximation logic is zero, then retesting the output of said comparator by comparing an analog signal corresponding to said digital output.

8. The successive-approximation ADC circuit according to claim 6, wherein said ADC-digital-output value is determined as a result of:

(a) if a least-significant bit of said digital output of said successive-approximation logic is one, then incrementing said digital output of said successive-approximation logic in order to generate an incremented digital output value, and retesting the output of said comparator by comparing an analog signal corresponding to said incremented digital output value and if the retesting determined that the incremented digital value was not too high, then using the incremented digital output value as said ADC-digital-output value, else using the digital output as said ADC-digital-output value;

else

(b) if said least-significant bit of said digital output of said successive-approximation logic is zero, then retesting the output of said comparator by comparing an analog signal corresponding to said digital output and if the retesting determined that the digital output was not too high, then using the digital output as said ADC-digital-output value, else decrementing the digital output in order to generate a decremented digital output value and using said decremented digital output value as said ADC-digital-output value.

9. A successive-approximation analog-to-digital converter (ADC) circuit for reducing comparator-hysteresis effects while converting an input analog signal into an ADC-digital-output value, said ADC-digital-output value having a plurality of N bits, said circuit comprising:

a comparator having a first input, a second input, and an output;

a coarse ADC converter having an input coupled to said input analog signs, and an M-bit coarse digital output, wherein said coarse ADC converter generates a plurality of M bits corresponding to M most-significant bits of said ADC-digital-output value on said M-bit coarse digital output, and wherein M is less than N;

successive-approximation logic having a first input connected to said output of said comparator, a second input connected to said M-bit coarse digital output, and an output; and

a digital-to-analog converter having an input connected to said output of said successive-approximation logic and an analog output coupled to said second input of said comparator;

wherein said digital-to-analog converter comprises a charge-redistribution converter coupled to said input analog signal, said charge-redistribution converter comprising a capacitor array, said capacitor array comprising a capacitor corresponding to each bit in the output digital value.

10. The successive-approximation ADC circuit according to claim 9 wherein said M-bit coarse digital output corresponds to an M-bit digital value, representative of said analog input signal, decremented by one.

11. The successive-approximation ADC circuit according to claim 10, said capacitor array further comprising a redundant capacitor.

12. The successive-approximation ADC circuit according to claim 11, wherein said redundant capacitor corresponds to an Mth most-significant bit of said output digital value.

13. The successive-approximation ADC circuit according to claim 12, wherein said output digital value is determined by combining said M-bit digital estimate with an ((N-M)+1)-bit successive approximation generated by said successive-approximation logic.

14. The successive-approximation ADC circuit according to claim 11, wherein said redundant capacitor corresponds to a least-significant bit of said output digital value.

15. The successive-approximation ADC circuit according to claim 14, wherein said output digital value is determined by adding one to said output of said successive-approximation logic if a least-significant bit of said output of said successive-approximation logic is one, and retesting the output of said comparator.

16. A method for reducing comparator-hysteresis effects while performing successive-approximation analog-to-digital conversion of an input analog signal into an output digital value, said output digital value having a plurality of N bits, said method comprising the steps of:

(a) performing a coarse analog-to-digital conversion to generate a plurality of M bits corresponding to M most-significant bits of said output digital value, wherein M is less than N, wherein the step of performing a coarse analog-to-digital conversion includes the substantially simultaneous step of sampling said input analog signal to obtain a sampled analog signal;

(b) coupling said M bits to an internal digital approximation value;

(c) converting said internal digital approximation value to a corresponding internal analog signal;

(d) comparing said internal analog signal to said sampled analog signal to obtain a test result;

(e) generating a next-most-significant bit of said internal digital approximation value as a function of said test result;

(f) successively approximating said output digital value by iteratively repeating steps (c), (d), and (e).

17. The method according to claim 16 wherein said plurality of M bits corresponds to an M-bit digital value, corresponding to said analog input signal, decremented by one.

18. The method according to claim 17 wherein said successive-approximation conversion is performed with a sampling period of time followed by a successive-approximation search, and wherein said coarse analog-to-digital conversion operates during said sampling period in order to minimize overdrive during said comparing step.

19. The method according to claim 17 wherein said converting step (c) comprises the step of using a charge-redistribution converter, said charge-redistribution converter comprising a capacitor array, said capacitor array comprising a capacitor corresponding to each bit in the output digital value.

20. The method according to claim 19, said capacitor array further comprising a redundant capacitor.

21. The method according to claim 20, wherein said redundant capacitor corresponds to an Mth most-significant bit of said output digital value.

22. The method according to claim 21, further comprising the step of determining said output digital value by combining said M-bit digital estimate with an ((N-M)+1)-bit successive approximation generated by steps (c)-(f).

23. A method for reducing comparator-hysteresis effects while performing successive-approximation analog-to-digital conversion of an input analog signal into an output digital value, said output digital value having a plurality of N bits, said method comprising the steps of:

(a) generating an initial internal digital approximation value;

(b0) if a least-significant bit of said initial internal digital approximation value is zero, then

(c0) converting said initial internal digital approximation value to a corresponding initial internal analog signal;

(d0) subtracting a decrement value from said initial internal digital approximation value to obtain a decremented internal digital approximation value;

(e0) comparing said initial internal analog signal to said input analog signal to obtain a first test result; and

(f0) generating said output digital value from either said initial internal digital approximation value or said decremented internal digital approximation value, based on said first test result; and

(b1) if said least-significant bit of said initial internal digital approximation value is one, then

(c1) adding an increment value to said initial internal digital approximation value to obtain an incremented internal digital approximation value;

(d1) converting said incremented internal digital approximation value to a corresponding incremented internal analog signal;

(e1) comparing said incremented internal analog signal to said input analog signal to obtain a second test result; and

(f1) generating said output digital value from either said initial internal digital approximation value or said incremented internal digital approximation value, based on said second test result.

24. The method according to claim 23 wherein said converting steps (c0) and (d1) each comprise the step of using a charge-redistribution converter, said charge-redistribution converter comprising a capacitor array, said capacitor array comprising a capacitor corresponding to each bit in the output digital value.

25. The method according to claim 24, said capacitor array further comprising a redundant capacitor.

26. The method according to claim 25, wherein said redundant capacitor corresponds to a least-significant bit of said output digital value.

27. An analog-to-digital converter (ADC) circuit comprising:

a comparator having a first input coupled to a first reference voltage, a second input, and an output;

a coarse ADC converter having an input coupled to an analog input signal that is to be converted into an ADC-digital-output value by the ADC circuit, said ADC-digital-output value having a plurality of N bits, and a coarse digital output, wherein said coarse ADC converter generates an M-bit decremented digital estimate corresponding to said analog input signal, on said coarse digital output, wherein M is less than N;

successive-approximation logic having a first input connected to said output of said comparator, a second input connected to said coarse digital output of said coarse ADC converter, and an output; and

a switched capacitor network having a sampling input, a control input, and an analog output, wherein;

said sampling input is switchably coupled to said input analog signal,

said control input is connected to said output of said successive-approximation logic, and

said analog output is connected to said second input of said comparator.

28. The ADC circuit according to claim 27 wherein said ADC circuit operates with a sampling period of time followed by a successive-approximation search, and wherein said coarse ADC converter operates during said sampling period to provide said M-bit decremented digital estimate to said successive-approximation logic in order that said successive-approximation search can begin at a digital value close to a correct result of said output digital value in order to minimize overdriving said comparator.

29. The ADC circuit according to claim 27 wherein said switched capacitor network comprises a capacitor corresponding to each bit in the output digital value.

30. The ADC circuit according to claim 29, said capacitor array further comprising a redundant capacitor.

31. The ADC circuit according to claim 30, wherein said redundant capacitor corresponds to an Mth most-significant bit of said output digital value.

32. The ADC circuit according to claim 31, wherein said output digital value is determined by combining said M-bit decremented digital estimate with an ((N-M)+1)-bit successive approximation generated by said successive-approximation logic.

33. The successive-approximation ADC circuit according to claim 27, wherein said output digital value is determined by

if a least-significant bit of said output of said successive-approximation logic is one, then adding one to said output of said successive-approximation logic and retesting the output of said comparator;

and

if said least-significant bit of said output of said successive-approximation logic is zero, then retesting the output of said comparator, and subtracting one from said output of said successive-approximation logic.

34. The successive-approximation ADC circuit according to claim 30, wherein said redundant capacitor corresponds to a least-significant bit of said output digital value.

35. The successive-approximation ADC circuit according to claim 34, wherein said output digital value is determined by adding one to said output of said successsive-approximation logic if a least-significant bit of said output of said successive-approximation logic is one and retesting the output of said comparator.

36. A method for reducing comparator-hysteresis effects while performing successive-approximation analog-to-digital conversion of an input analog signal into an output digital value, said output digital value having a plurality of N bits, said method comprising the steps of:

(a) performing a coarse analog-to-digital conversion to generate a plurality of M bits corresponding to M most-significant bits of a digital value corresponding to said analog input signal, decremented by one, wherein M is less than N;

(b) coupling said M bits to an internal digital approximation value;

(c) converting said internal digital approximation value to a corresponding internal analog signal;

(d) comparing said internal analog signal to a reference signal to obtain a test result;

(e) generating a next-most-significant bit of said internal digital approximation value as a function of said test result;

(f) successively approximating said output digital value by iteratively repeating steps (c), (d), and (e).

37. The method according to claim 36 wherein said successive-approximation conversion is performed with a sampling period of time followed by a successive-approximation search period of time, and wherein said coarse analog-to-digital conversion operates during said sampling period.

38. The method according to claim 36 wherein said converting step (c) comprises the step of using a charge-redistribution converter, said charge-redistribution converter comprising a capacitor array, said capacitor array comprising a capacitor corresponding to each bit in the output digital value.

39. The method according to claim 38, said capacitor array further comprising a redundant capacitor.

40. The method according to claim 39, wherein said redundant capacitor corresponds to an Mth most-significant bit of said output digital value.

41. The method according to claim 40, further comprising the step of determining said output digital value by combining said M-bit decremented digital estimate with an ((N-M)+1)-bit successive approximation generated by steps (c)-(f).

42. A charge-redistribution successive-approximation analog-to-digital converter (ADC) circuit for reducing comparator-hysteresis effects while converting an input analog signal into an output digital value, said output digital value having a plurality of N bits, said circuit comprising:

a plurality of capacitors, each one of said plurality of capacitors having a first plate and a second plate;

a comparator having a first input connected to a first reference voltage signal, a second input coupled to said first plate of every one of said plurality of capacitors, and an output;

a plurality of successive-approximation switches, each one of said plurality of successive-approximation switches having a common connection coupled to said second plate of a corresponding one of said plurality of capacitors and switchably coupled either to a second reference voltage or to an internal node;

an input switch having a common connection coupled to said internal node and switchably coupled either to a third reference voltage or to said input analog signal;

a coarse ADC converter having an input coupled to said input analog signal, and a digital output, wherein said coarse ADC converter generates a plurality of M bits corresponding to M most-significant bits of said output digital value on said digital output, wherein M is less than N; and

successive-approximation logic having a first input, a second input, and a digital output, wherein said first input is connected to said output of said comparator, said second input is connected to said digital output of said coarse ADC converter, and said digital output is coupled to control said plurality of successive-approximation switches.