Scattered/transmitted light information system

• US 5,675,419 A
• Filed: 09/25/1995
• Issued: 10/07/1997
• Est. Priority Date: 10/01/1991
• Status: Expired due to Term

• Current Assignee: Odenberg Engineering Limited
• Original Assignee: Herman Van Den Bergh, John Mallon, Marvin Lane
• Inventors: Lane, Marvin, Mallon, John, Van Den Bergh, Herman
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US08/533,019
• Time in Patent Office: 743 Days
• Field of Search: 356/445, 356/446, 356/407, 250/226
• US Class Current: 356/446
• CPC Class Codes: B07C 5/3416 according to radiation transmissivity, e.g. for light, x-rays, particle radiation detecting hidden objects G01V
• CPC Class Codes: B07C 5/342 according to optical properties, e.g. colour according to radiation transmittivity B07C5/3416
• CPC Class Codes: G01N 2021/4709 Backscatter
• CPC Class Codes: G01N 2021/8466 Investigation of vegetal material, e.g. leaves, plants, fruits
• CPC Class Codes: G01N 2021/8845 Multiple wavelengths of illumination or detection
• CPC Class Codes: G01N 21/49 within a body or fluid
• CPC Class Codes: G01N 21/88 Investigating the presence of flaws or contamination

Abstract

In an information gathering system especially suited to the monitoring of vegetable products in sorting apparatus, a light beam (23) is directed by a scanning source such as a laser (11) at the surface of an object (2) such as a tomato moving in the direction x--x through a scanning zone. The scanning operation is conducted in the y--y direction. Directly reflected light returned from the surface of the object (2) along a path (17) extending from light beam target region (12) is sensed by a line detector (14), which provides an output signal indicative of the level, of the directly reflected light. Light entering the material of the organic product (2) is subjected to a light scattering or diffusing process within the material of the product, so that at least a region (13) of the surface of the product (12) surrounding the target zone (12) of light beam (23) becomes lit-up or illuminated from within. Further photosensitive line detectors (15) and (16) located one to each side of reflected light detector (14) monitor the levels of light emanating from this illuminated zone (13) surrounding light beam target zone (12) and reaching the detectors (15) and (16) along paths (18) and (19) respectively. Comparison of the relative levels of the directly reflected light and emanating light signals enables information to be derived as to surface and sub-surface defects on or in the product (2). The use of suitable logic circuitry enables rejection of defective product in response to the information provided by the light signals.

Claims

1. An information gathering system comprising:

(a) means for directing at least one light beam at a surface of a material having internal light-scattering properties for which information is required in respect of at least one specified characteristic of the material, to impinge upon a target region on said surface of said material,

(b) means for effecting scanning displacement of said at least one light beam relative to said surface of said material so that said target region comprises one of a succession of target regions,

(c) means for detecting reflected light returned from said target region,

(d) means for detecting internally-scattered light emanating from a region of said surface of said material other than said target region, said region other than said target region being one of substantially adjacent and or continuous with said target region,

(e) means for deriving a signal indicative of said at least one specified characteristic of the material by analysis of the levels of said reflected light and said emanating light during said scanning displacement, and

(f) means for effecting displacement of said surface of said material relative to said at least one light beam in a direction substantially at right angles to said direction of scanning displacement, wherein

(i) a speed of said scanning displacement is determined in conjunction with a speed of displacement of said surface of said material so that a succession of scanning displacements of said at least one light beam relative to said surface of said material is achieved, and

(ii) said signal deriving means comprises memory means to enable build-up of image data for said surface from the levels of said reflected light and said emanating light during each of said succession of scanning displacements to provide said signal indicative of said at least one specified characteristic of the material by analysis of said image data.

2. An information gathering system according to claim 1, wherein said signal deriving means comprises logic means for effecting said analysis of said image data.

3. An information gathering system according to claim 2, wherein said logic means is adapted to distinguish between a plurality of abnormalities or defects of said material to provide said signal indicative of said at least one specified characteristic of the material.

4. An information gathering system according to claim 3, wherein said signal deriving means is adapted for analysis of said image data for derivation of at least one of size and shape characteristics of said material.

5. An information gathering system according to claim 4, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from one of the intensity of said reflected light and said emanating light, and by comparison of the relative levels of said reflected light and said emanating light at each of said succession of target regions for each of said succession of scanning displacements.

6. An information gathering system according to claim 1, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from one of the intensity of said reflected light and said emanating light, and by comparison of the relative levels of said reflected light and said emanating light at each of said succession of target regions for each of said succession of scanning displacements.

7. An information gathering system according to claim 1, wherein:

(i) said light beam directing means comprises means for directing each of at least two light beams of different wavelengths at said surface to each impinge upon a respective target region on said surface; and

(ii) said scanning displacement effecting means is adapted to effect scanning displacement of each of said at least two light beams relative to said surface so that each said target region comprises one of a respective succession of target regions and at least some of each of said successions of target regions define a common area for inspection by each of said at least two light beams of different wavelengths.

8. An information gathering system according to claims 7, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from the intensity of said reflected light and said emanating light and/or by comparison of the relative levels of said reflected light and said emanating light at each of said successions of target regions defining said common area.

9. An information gathering system according to claim 1, wherein said light detecting means comprises a plurality of linear photosensitive detectors aligned in said scanning direction.

10. An information gathering system according to claim 1, comprising means for providing to said signal deriving means, at least one additional input of information derived from another monitoring technique.

11. An information gathering system comprising:

(a) means for directing at least one light beam at a surface of a material having internal light-scattering properties for which information is required in respect of at least one specified characteristic of the material, to impinge upon a target region on said surface of said material during passage of said material through an inspection zone,

(b) means for effecting scanning displacement of said at least one light beam relative to said surface of said material so that said target region comprises on of a succession of target regions,

(c) means for detecting reflected light returned from said target region,

(d) means for detecting internally-scattered light emanating from a region of said surface of said material other than said target region, said region other than said target region being one of substantially adjacent to and continuous with said target region,

(e) means for deriving a signal indicative of said at least one specified characteristic of the material by analysis of the levels of said reflected light and said emanating light during said scanning displacement, and

(f) means for effecting displacement of said surface of said material through said inspection zone relative to said at least one light beam in a direction substantially at right angles to said direction of scanning displacement, wherein

(i) a speed of said scanning displacement is determined in conjunction with a speed of displacement of said surface of said material so that a succession of scanning displacements of said at least one light beam relative to said surface of said material is achieved,

(ii) said signal deriving means comprises memory means to enable build-up of image data for said surface from the levels of said reflected light and said emanating light during each of said succession of scanning displacements to provide said signal indicative of said at least one specified characteristic of the material by analysis of said image data,

(iii) said means for effecting displacement of said surface of said material comprises a conveyor for advancing said material to an end region of the conveyor at which said material leaves the conveyor in a freefall trajectory, and

(iv) said inspection zone is defined by a portion of said freefall trajectory.

12. An information gathering system according to claim 11, wherein said signal deriving means comprises logic means for effecting said analysis of said image data.

13. An information gathering system according to claim 12, wherein said logic means is adapted to distinguish between a plurality of abnormalities or defects of said material to provide said signal indicative of said at least one specified characteristic of the material.

14. An information gathering system according to claim 13, wherein said signal deriving means is adapted for analysis of said image data for derivation of at least one of size and shape characteristics of said material.

15. An information gathering system according to claim 14, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from one of the intensity of said reflected light and said emanating light, and by comparison of the relative levels of said reflected light and said emanating light at each of said succession of target regions for each of said succession of scanning displacements.

16. An information gathering system according to claim 11, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from one of the intensity of said reflected light and said emanating light, and by comparison of the relative levels of said reflected light and said emanating light at each of said succession of target regions for each of said succession of scanning displacements.

17. An information gathering system according to claim 11, wherein:

(i) said light beam directing means comprises means for directing each of at least two light beams of different wavelengths at said surface to each impinge upon a respective target region on said surface; and

(ii) said scanning displacement effecting means is adapted to effect scanning displacement of each of said at least two light beams relative to said surface so that each said target region comprises one of a respective succession of target regions and at least some of each of said successions of target regions define a common area for inspection by each of said at least two light beams of different wavelengths.

18. An information gathering system according to claim 17, wherein said signal deriving means is adapted to provide said signal indicative of said at least one specified characteristic of the material at least from one of the intensity of said reflected light and said emanating light, and by comparison of the relative levels of said reflected light and said emanating light at each of said successions of target regions defining said common area.

19. An information gathering system according to claim 11, wherein said light detecting means comprises a plurality of linear photosensitive detectors aligned in said scanning direction.

20. An information gathering system according to claim 11, comprising means for providing to said signal deriving means, at least one additional input of information derived from another monitoring technique.

21. An information gathering system according to claim 11, wherein said light-beam directing means, said scanning displacement means, said reflected light-detecting means and said internally-scattered light detecting means are comprised in an inspection device extending transversely substantially across the entire path of advance of said material on said conveyor.