Integrated circuit memory using fusible links in a scan chain
First Claim
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1. An integrated circuit memory implementing a scan test, comprising:
- a plurality of fuse circuits for storing predetermined information concerning the integrated circuit memory; and
a plurality of latch circuits, coupled to the plurality of fuse circuits, each fuse circuit of the plurality of fuse circuit coupled to a corresponding one of the plurality of latch circuits, the plurality of latch circuits serially coupled to form a scan chain for selectively providing the predetermined information when the integrated circuit memory is in a test mode.
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Abstract
An integrated circuit memory (140) includes programmable fuses (20) coupled to scannable flip-flops (25). The programmable fuses (20) and scannable flip-flops (25) are implemented in a scan chain, and are used to program specific information about the integrated circuit memory (140), such as for example, repair (redundancy) information, wafer lot number and wafer number, die position on the wafer, or any other information that would be useful during or after package testing.
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Citations
18 Claims
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1. An integrated circuit memory implementing a scan test, comprising:
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a plurality of fuse circuits for storing predetermined information concerning the integrated circuit memory; and a plurality of latch circuits, coupled to the plurality of fuse circuits, each fuse circuit of the plurality of fuse circuit coupled to a corresponding one of the plurality of latch circuits, the plurality of latch circuits serially coupled to form a scan chain for selectively providing the predetermined information when the integrated circuit memory is in a test mode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An integrated circuit memory with redundancy, comprising:
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a shift register having an input terminal for receiving an input signal, a plurality of serially connected registers, and an output terminal for providing an address signal; a decoder circuit coupled to the shift register, for receiving the address signal, and in response, providing a decoded address signal; a plurality of addressable fuse circuits, for providing stored fuse information in response to the decoded address signal, the stored fuse information including predetermined information concerning the integrated circuit memory; and a plurality of serially connected latch circuits forming a scan chain, each latch circuit correspondingly, coupled to one of the addressable fuse circuits, for providing the stored fuse information in response to the integrated circuit memory being in a test mode. - View Dependent Claims (10, 11, 12, 13)
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14. An integrated circuit memory with redundancy, the integrated circuit memory implementing a boundary-scan test according to a Joint Test Action Group (JTAG) boundary-scan standard, comprising:
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a plurality of memory cells organized in rows and columns; a redundant column of memory cells for replacing a defective column of the plurality of memory cells; a plurality fuse of circuits for storing redundancy information, the redundancy information for addressing the redundant column of memory cells when the redundant column of memory cells replaces the defective column of the plurality of memory cells; and a plurality of serially connected latch circuits to form a scan chain, each latch circuit, coupled to a corresponding one of the fuse circuits for selectively providing the redundancy information when the integrated circuit memory is in a test mode. - View Dependent Claims (15, 16, 17, 18)
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Specification