Optical dirty cell sensor for an electronic air cleaner

• US 5,679,137 A
• Filed: 06/07/1995
• Issued: 10/21/1997
• Est. Priority Date: 06/07/1995
• Status: Expired due to Fees

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Schoeneck, Mark R., Thompson, Maynard L., Erdman, John L., Kemp, Stephen J.
• Primary Examiner(s): Chiesa, Richard L.
• Application Number:
  US08/476,968
• Time in Patent Office: 867 Days
• Field of Search: 96/26, 95/25, 55/274, 250/573, 250/349, 356/72
• US Class Current: 96/26
• CPC Class Codes: B03C 3/08 characterised by presence of stationary flat electrodes arranged with their flat surfaces parallel to the gas stream
• CPC Class Codes: B03C 3/32 Transportable units, e.g. for cleaning room air
• CPC Class Codes: B03C 3/74 Cleaning the electrodes

Abstract

An electrostatic air cleaner has at least one hole in one of the plates over which air with charged dirt particles is passed. A light source is mounted adjacent to the hole so as to direct its light through the hole. A light sensor detects the level of light passing through the hole. As dirt particles deposit on the plate, they fill in the hole over a period of time, reducing the amount of light passing through the hole. It is possible by measuring the amount of light passing through the hole, to determine the amount of dirt deposited on the plate. In a preferred embodiment, each of the plates contain a hole in alignment with each of the other plates'"'"' holes so that light from a single light source can pass through each of the holes. Such a configuration allows both the light source and the light sensor to be located outside of the entire group of plates.

Claims

1. In a electrostatic air filter having a plurality of substantially flat plates including first and second outer plates to be electrically charged and between which air having electrically charged particles may be passed, to thereby cause said particles to deposit themselves on said plates, an improvement for determining when a predetermined amount of said particles have been deposited on said plates, comprising

a) on each of said plates, a test area having an aperture permitting light to pass through said plate from a first side of the plate to a second side of the plate, the aperture in each plate'"'"'s test area in alignment with every other plate'"'"'s aperture, wherein a preselected one of the test areas has a gauge aperture substantially smaller than the aperture in each of the other test areas;

b) a light source mounted adjacent to the outer side of the first outer plate and aligned with the test area to direct at least a portion of light from the light source toward the test area of the first outer plate, wherein the light source is mounted to direct light through the aperture in every test area;

c) a light sensor having a sensor surface and responsive to light falling on said sensor surface, providing a sensing signal whose magnitude is a function of the intensity of the light falling on the sensor surface, said light sensor mounted adjacent to the outer side of the second outer plate with its sensor surface in alignment with the test area of the second outer plate to receive on its sensor surface, light from the light source; and

d) a level detector receiving the sensing signal and providing a status signal having a first level responsive to the level of the sensing signal exceeding a predetermined level, and a second level otherwise.

2. The improvement of claim 1, wherein the sensor surface of the sensor is substantially larger than the aperture in the preselected one of the test areas.

3. The improvement of claim 2, wherein the preselected one of the test areas is on an outside plate.

4. The improvement of claim 3, wherein the plurality of plates has first and second outside plates, wherein the preselected one of the test areas is on the first outside plate, and the light source is mounted adjacent to the outside surface of the second outside plate.

5. The improvement of claim 4, wherein each test area is centrally located in its plate.

6. The improvement of claim 1, wherein each test area is centrally located in its plate.

7. The improvement of claim 6, wherein the light source includes a switching circuit responsive to a predetermined level of an enable signal for gating power to the light source, and wherein the level detector includes a gating circuit responsive to the predetermined level of the enable signal for gating to a memory unit the present level of the sensing signal, and means for providing the enable signal having periodic intervals in which is attained the predetermined level.

8. The improvement of claim 1, wherein the test area includes a plurality of apertures.

9. The improvement of claim 8, wherein the preselected test area includes at least two circular apertures of gauge substantially identical diameter.

10. The improvement of claim 1, wherein the light source includes a switching circuit responsive to a predetermined level of an enable signal for gating power to the light source, and wherein the level detector includes a gating circuit responsive to the predetermined level of the enable signal for gating to a memory unit the present level of the sensing signal, and means for providing the enable signal having periodic intervals in which is attained the predetermined level.