Remote measurement of near-surface physical properties using optically smart surfaces

• US 5,682,236 A
• Filed: 07/02/1993
• Issued: 10/28/1997
• Est. Priority Date: 07/02/1993
• Status: Expired due to Fees

• Current Assignee: MetroLaser, Inc.
• Original Assignee: MetroLaser, Inc.
• Inventors: Trolinger, James Davis, Millerd, James Elstin
• Primary Examiner(s): Turner, Samuel A.
• Application Number:
  US08/087,501
• Time in Patent Office: 1,579 Days
• Field of Search: 356/35.5, 356/28.5, 356/349, 356/356, 356/345, 385/15
• US Class Current: 356/484
• CPC Class Codes: G01B 11/164 by holographic interferometry
• CPC Class Codes: G01P 21/02 of speedometers
• CPC Class Codes: G01P 5/26 by measuring the direct influence of the streaming fluid on the properties of a detecting optical wave

Abstract

A method and apparatus for remotely measuring such physical properties as surface temperature and strain on or near the surface of an object such as an aerodynamic model utilizes a sensor comprising a holographic diffraction grating in a thin film, formed on or affixed to the surface of the test object, thereby forming an "optically smart surface." The sensor is remotely illuminated by one or more optical address beams, which are preferably coherent laser beams. Optical beams diffracted from the surface of the sensor produce interference patterns in a remote photodetection apparatus which permits measurement in changes in grating spatial frequency caused by temperature changes or mechanical deformations of the object surface, or Doppler measurement of particle velocity in a sample volume produced by intersecting beams diffracted from the sensor hologram.

Claims

1. A method for remotely measuring one or more physical characteristics at or near the surface of a curved object, said method comprising;

a. conformally affixing to said surface of said object a thin flexible film, at least a portion of which contains a hologram, said hologram forming in response to illumination by electromagnetic radiation an image which varies in a predetermined way in response to variations in said physical characteristics at or near said surface, said film including a mirrored surface adjacent said hologram,

b. illuminating said film with one or more address beams of coherent light,

c. collecting at least a portion of light emanating from said film in response to said illumination, and

d. analyzing said collected light to determine variations in said physical characteristics at or near said object surface that cause a variation in said collected radiation.

2. A method for remotely measuring one or more physical characteristics at or near the surface of a curved object, said method comprising;

a. conformally affixing to said surface of said object a thin flexible film, at least a portion of which contains a hologram, said hologram forming in response to illumination by electromagnetic radiation an image which varies in a predetermined way in response to variations in said physical characteristics at or near said surface, said hologram being further defined as including an image of two beams intersecting at or above the surface of said film,

b. illuminating said film with one or more address beams of coherent radiation producing at or above said surface a sample volume containing a plurality of interference fringes usable to measure the Laser Doppler Velocity of particles flowing through said volume,

c. collecting at least a portion of radiation diffracted from said film in response to said illumination, and

d. analyzing said collected radiation to determine variations in said physical characteristics at or near said object surface that cause a variation in said collected radiation.

3. The method of claim 2 wherein said hologram is further defined as including a pair of adjacent gratings effective in producing in response to a pair of first and second parallel address beams first and second diffracted beams oblique to another.

4. The method of claims 2 or 3 wherein said coherent light illuminating said film is further defined as comprising two address beams laterally spaced apart from one another, said beams being effective in diffracting from said hologram a pair of diffracted beams intersecting to produce a sample volume spaced above said film a distance proportional to the lateral spacing between said address beams.

5. The method of claim 4 further including the step of adjusting the lateral spacing between said address beams, thereby adjusting the height of said sample volume above said film.

6. A method for remotely measuring one or more physical characteristics at or near the surface of a curved object, said method comprising;

a. conformally affixing to said surface of said object a thin, flexible film elastically deformable in concert with deformations of said surface of said object, at least a portion of said film which contains a hologram, said hologram forming in response to illumination by electromagnetic radiation an image which varies in a predetermined way in response to variations in said physical characteristics at or near said object surface, said hologram including a first uniaxial grating, whereby first deformations of said object surface parallel to said grating vector, i.e., perpendicular to lines comprising said grating, alters the spatial frequency of said grating, thereby causing a beam diffracted from said hologram in response to illumination by a coherent address beam to produce a change in fringe pattern proportional to strain of said object surface,

b. illuminating said film with one or more address beams of coherent radiation, said coherent radiation illuminating said film comprising two address beams laterally spaced apart from one another incident upon laterally spaced apart locations of said film, said incident address beams producing two separate diffracted beams that interfere with one another to produce a fringe pattern proportional to the difference in spatial frequencies of said grating at said locations of said film,

c. collecting at least a portion of radiation diffracted from said film in response to said illumination, and

d. analyzing said collected radiation to determine variations in said physical characteristics at or near said object surface that cause a variation in said collected radiation.

7. The method of claim 6 further including the step of causing modulation of at least one of said address beams.

8. The method of claim 7 wherein said modulation is further defined as phase modulation.

9. An apparatus for remotely measuring a physical characteristic at or near the curved surface of an object, said object having a thin film affixed to at least a portion of said surface of said object, said film having formed in at least a portion thereof a hologram, said film being adapted to produce a first, retroreflected beam end a second, zero order diffracted beam, said first and second beams intersecting to form a sample volume near the surface of said film, said apparatus comprising,

a. means for illuminating said film with one or more address beams effective in producing one or more diffracted beams from said grating,

b. means for collecting at least a portion of said diffracted beams, and

c. signal processing means for analyzing said collected portion of said diffracted beams, whereby physical characteristics at or near said object surface may be remotely determined.

10. An apparatus for remotely measuring a physical characteristic at or near the curved surface of an object, said object having a thin film affixed to at least a portion of said surface of said object, said film having formed in at least a portion thereof a hologram adapted to produce at least two diffracted beams intersecting at or above the surface of said film, said apparatus comprising,

a. means for illuminating said film with one or more address beams effective in producing one or more diffracted beams from said grating, whereby illuminating said film with said address beam produces at or above said surface a sample volume containing a plurality of interference fringes,

b. means for collecting at least a portion of said diffracted beams, and

c. signal processing means for analyzing said collected portion of said diffracted beams, whereby physical characteristics at or near said object surface may be remotely determined.

11. The apparatus of claim 10 wherein said signal processing means is further defined as being adapted to measure the Doppler velocity of particles in said sample volume.

12. The apparatus of claim 11 wherein said film is further defined as including a mirrored surface adjacent said hologram.

13. The apparatus of claim 12 wherein said means for illuminating said film is further defined as comprising a first address beam incident upon said mirrored surface and a second address beam incident upon said hologram, said first and second address beams being so oriented with respect to said mirrored surface and said hologram so as to produce a first, reflected beam and a second, diffracted beam intersecting said reflected beam.

14. The apparatus of claim 11 wherein said film is further defined as including a pair of adjacent first and second holographic gratings effective in producing in response to a pair of parallel first and second address beams first and second intersecting address beams.

15. The apparatus of claim 14 wherein said means for illuminating said film is further defined as comprising means for producing a first address beam adapted to impinge upon said first grating, means for producing a second address beam incident upon said second grating, and means for moving said beams relative to one another thereby producing first and second diffracted beams intersecting in a sample volume spaced above said film a distance proportional to the relative spacing between said first and second address beams.

16. An apparatus for remotely measuring a physical characteristic at or near the curved surface of an object, said object having a thin film affixed to at least a portion of said surface of said object, said film being elastically deformable in concert with deformations of said surface of said object, said film having formed in at least a portion thereof a hologram containing a first uniaxial grating, whereby first deformations of said object surface perpendicular to lines comprising said first grating alter spacing between said lines, thereby causing a beam diffracted from said hologram in response to illumination by said address beam to produce a diffracted fringe pattern which changes in proportion to strain of said object surface, said apparatus comprising,

a. means for illuminating said film with one or more address beams effective in producing one or more diffracted beams from said grating, said means for illuminating said film being further defined as comprising two address beams laterally spaced apart from one another incident upon laterally spaced apart locations of said film, said incident address beams being adapted to produce two separate diffracted beams that interfere with one another to produce a fringe pattern proportional to the difference in grating spacing at said locations of said film,

b. means for collecting at least a portion of said diffracted beams, and

c. signal processing means for analyzing said collected portion of said diffracted beams, whereby physical characteristics at or near said object surface may be remotely determined.

17. The apparatus of claim 16 wherein said means for illuminating said film is further defined as including modulation means for causing modulation of at least one of said address beams.

18. The apparatus of claim 17 wherein said modulation means is further defined as being adapted to cause phase modulation of said address beams.

19. A sensor adapted to be affixed to a curved surface of an object to permit remote measurement of physical properties at or near said object surface, said sensor comprising a thin, flexible film adapted to be affixed conformally to said object surface and containing a holographic image including a first diffraction grating, said sensor further including a specularly reflective surface adjacent said holographic image.

20. The sensor of claim 19 wherein said holographic image is further defined as including a second diffraction grating orthogonal to said first diffraction grating.

21. The sensor of claim 20 wherein said first and second diffraction gratings are optically formed in the same area of said sensor.

22. The sensor of claim 19 wherein said holographic image is further defined as including a second diffraction grating parallel to said first diffraction grating and having a beam angle inclined to that of said first diffraction grating.