A/D converter with charge-redistribution DAC and split summation of main and correcting DAC outputs

• US 5,684,487 A
• Filed: 06/05/1995
• Issued: 11/04/1997
• Est. Priority Date: 06/05/1995
• Status: Expired due to Term

• Current Assignee: Analog Devices, Inc.
• Original Assignee: Analog Devices, Inc.
• Inventors: Timko, Michael P.
• Primary Examiner(s): Young, Brian K.
• Application Number:
  US08/461,189
• Time in Patent Office: 883 Days
• Field of Search: 341/172, 341/118, 341/120, 341/121, 341/144, 341/150, 341/155
• US Class Current: 341/172
• CPC Class Codes: H03M 1/1047 using an auxiliary digital/analogue converter for adding the correction values to the analogue signal H03M1/1052 takes precedence
• CPC Class Codes: H03M 1/468 in which the input S/H circuit is merged with the feedback DAC array

Abstract

An analog-to-digital (A/D) converter of the successive-approximation type wherein the digital-to-analog converter (DAC) includes a charge-redistribution, binary-weighted switched-capacitor array for producing the analog output for comparison with the analog input signal. A second switched-capacitor DAC is employed to develop error correction signals to be combined with the analog signal from the A/D conversion DAC. The conversion DAC array is connected to one input terminal of the comparator, and the error-correction DAC array is connected to the other comparator input terminal, an arrangement which reduces the number of capacitors required while providing symmetrical capacitance loading of the comparator input circuit.

Claims

1. The method of converting an analog signal to a digital signal by a successive-approximation process carried out by an integrated-circuit (IC) chip aria including the following steps:

supplying bits of a successive-approximation word to a first group of switched capacitors to produce corresponding analog signals;

directing said analog signals to one input terminal of a comparator;

utilizing stored calibration coefficients to develop control signals for a second group of switched capacitors developing analog correction signals for the respective individual bits of said successive-approximation word;

computing said calibration coefficients at the time manufacture of said IC chip;

said calibration coefficients being computed by circuitry located off of said IC chip and operable to activate a sequence of operations of digital switch control circuitry for said second group of switched capacitors;

said sequence of operations producing calibration coefficients for each bit of said successive-approximation word;

developing multi-bit correction signals responsive to each of said calibrate coefficients for each bit of said successive-approximation word which is turned on as a result of carrying out said successive-approximation process;

summing said multi-bit correction signals to develop a composite correction signal for all of the turned-on bits;

applying said composite correction signal to said other comparator input terminal; and

directing the output of said comparator to logic means for controlling the successive-approximation processing to determine the bits of the final digital output signal.

2. The method of claim 1 wherein said calibration coefficients are stored in a read-only-memory.

3. The method of claim 1 wherein said multi-bit correction signals are entered into an adder for summing the correction signals.

4. The method of claim 3 wherein the correction signals corresponding to each turned-on bit are summed in said adder and placed in a register for application to said comparator.