Radiation detectors

• US 5,693,947 A
• Filed: 10/30/1995
• Issued: 12/02/1997
• Est. Priority Date: 04/28/1993
• Status: Expired due to Fees

• Current Assignee: The University Of Surrey
• Original Assignee: University of Surrey
• Inventors: Morton, Edward J.
• Primary Examiner(s): Hannaher, Constantine
• Application Number:
  US08/537,873
• Time in Patent Office: 764 Days
• Field of Search: 250/370.09
• US Class Current: 250/370.09
• CPC Class Codes: G01T 1/185 with ionisation chamber arrangements
• CPC Class Codes: G01T 1/24 with semiconductor detectors
• CPC Class Codes: G01T 1/2928 using solid state detectors
• CPC Class Codes: H01L 27/14676 X-ray, gamma-ray or corpuscular radiation imagers measuring X-, gamma- or corpuscular radiation G01T1/00

Abstract

A radiation detector has a dual-capacitive structure comprising an array A of first capacitors (10) including discrete electrodes (13) arranged in rows and columns and a second capacitor (20). The second capacitor (20) incorporates a radiation converter (21) which co-operates with the first capacitors (10) to cause an accumulation of charge on the discrete electrodes (13) according to the spatial distribution of radiation to which the radiation converter is exposed. Read-out means (30) is provided to output a signal representative of the accumulated charge.

Claims

1. A radiation detector comprising,

a plurality of first capacitors forming a two dimensional array, each said first capacitor having a discrete, charge-collection electrode,

a second capacitor having a radiation-receiving surface, the second capacitor including radiation conversion means for converting radiation received at said radiation-receiving surface to electrical charge, each said first capacitor being connected electrically in series with said second capacitor and having a capacitance greater than the capacitance of said second capacitor,

charge-focussing means for focussing said electrical charge produced by said radiation conversion means onto the discrete, charge-collection electrodes of said plurality of first capacitors, whereby, in operation, electrical charge accumulates on said charge-collection electrodes substantially according to the spatial distribution of the intensity of radiation received at said radiation-receiving surface,

and read-out means for outputting an output signal representative of the accumulated charge on the discrete, charge-collection electrodes of said plurality of first capacitors.

2. A radiation detector as claimed in claim 1 wherein the ratio of the capacitance of each said first capacitor to the capacitance of said second capacitor is in the range from 10,000 to 5.

3. A radiation detector as claimed in claim 2 wherein the ratio of the capacitance of each said first capacitor to the capacitance of said second capacitor is in the range from 10,000 to 100.

4. A radiation detector as claimed in claim 1, wherein said plurality of first capacitors includes a layer of dielectric material, and said discrete, charge-collection electrodes are formed on a surface of said layer of dielectric material.

5. A radiation detector as claimed in claim 1, wherein said plurality of first capacitors comprises a layer of semiconductor material and said discrete, charge-collection electrodes are formed on a first surface of said layer of semiconductor material.

6. A radiation detector as claimed in claim 5 wherein said semiconductor material is hydrogenated amorphous silicon (a-Si:

H) or polysilicon (p-Si).

7. A radiation detector as claimed in claim 5 wherein said read-out means comprises a plurality of field effect transistors each for connecting a respective said charge-collection electrode of said plurality of first capacitors to a data line, each said field effect transistor comprising a drain and a source formed on said first surface of said layer of semiconductor material adjacent to the respective said charge-collection electrode to which the field effect transistor is electrically connected.

8. A radiation detector as claimed in claim 7 wherein each said field effect transistor has a gate electrode formed on a second surface of said layer of semiconductor material.

9. A radiation detector as claimed in claim 8 wherein the gate electrodes of said field effect transistors are connected to control lines for enabling said read out means to output said output signal row-by-row or column-by-column.

10. A radiation detector as claimed in claim 9 wherein said read-out means comprises means for outputting said output signal from different rows (or columns) in said array either sequentially, column-by-column (or row-by-row) or in multiplex fashion.

11. A radiation detector as claimed in claim 7 wherein said charge-focussing means includes a body of semiconductor material formed on said first surface of said layer, said body of semiconductor material substantially surrounding each said charge-collection electrode and also surrounding the field effect transistor to which the respective charge-collection electrode is electrically connected.

12. A radiation detector as claimed in claim 11 wherein each said field effect transistor has a gate electrode formed on a second surface of said layer of semiconductor material.

13. A radiation detector as claimed in claim 12 wherein the gate electrodes of the field effect transistors are connected to control lines for enabling said read-out means to output said output signal row-by-row or column-by-column.

14. A radiation detector as claimed in claim 1 wherein said read-out means comprises a plurality of semiconductor switching devices each for connecting a respective said charge-collection electrode of said plurality of first capacitors to a data line.

15. A radiation detector as claimed in claim 14 wherein said semiconductor switching devices are field effect transistors, each said field effect transistor being situated immediately below the respective said charge-collection electrode.

16. A radiation detector as claimed in claim 14 wherein said semiconductor switching devices are field effect transistors, each said field effect transistor being situated adjacent to the respective said charge-collection electrode.

17. A radiation detector as claimed in claim 14 including means for electrically isolating said first capacitors and said second capacitor from said data line during a preset integration period during which electrical charge can accumulate on said charge-collection electrodes.

18. A radiation detector as claimed in claim 1 including a layer of a first radiation conversion material for converting radiation to which that layer is exposed to optical radiation, and wherein said radiation conversion means of said second capacitor includes a further layer of a second radiation conversion material for converting optical radiation produced in said layer of said first radiation conversion material to electrical charge.

19. A radiation detector as claimed in claim 18 wherein said first radiation conversion material is a crystalline material having a columnar structure.

20. A radiation detector as claimed in claim 19 wherein said first radiation conversion material is caesium iodide (CsI).

21. A radiation detector as claimed in claim 1 wherein said charge-focussing means creates a plurality of potential wells in said radiation conversion means, each said potential well being arranged to focus charge onto a respective said charge-collection electrode.

22. A radiation detector as claimed in claim 1 comprising a plurality of diode pairs, the diodes in each pair being connected together back-to-back to a respective said charge-collection electrode.

23. A radiation detector as claimed in claim 1 wherein said charge-focussing means includes a body of semiconductor material so arranged as to focus said electrical charge onto said charge-collection electrodes.

24. A radiation detector as claimed in claim 23 wherein said electrical charge focussed by said body of semiconductor material consists of electrons and said body of semiconductor material includes a body of p-type semiconductor material providing a charge-collection contact on each said charge-collection electrode.

25. A radiation detector as claimed in claim 1 including means for generating an electric-field across said second capacitor.

26. A radiation detector as claimed in claim 1 wherein the radiation conversion means is selected from the group consisting of:

(a) group IV semiconductors including silicon and germanium in crystalline, polycrystalline or amorphous form,

(b) compound semiconductors including GaAs, CdTe, HgI₂,TlBr in crystalline, polycrystalline or amorphous form,

(c) semiconducting polymers,

(d) amorphous selenium,

(e) ionisation media including gas ion chambers containing gases such as Ar, Xe, Kr, gases with quench agents, and liquid ion Chambers,

(f) gas proportional chambers containing gases such as Ar, Xe, Kr, gases with suitable quench agents,

(g) liquid ion chambers,

(h) scintillators in combination with a photocathodes,

(i) scintillators irradiating semiconductor layers,

(j) metal foils having a substantial neutron interaction cross-section in combination with a device selected from (a) to (i) above,

(k) piezo-electric material, and

(l) semiconductor material operating as hall effect devices.

27. An imaging apparatus incorporating a radiation detector as claimed in claim 1.

28. A medical X-radiation imaging apparatus incorporating a radiation detector as claimed in claim 1.