Semiconductor circuit design verifying apparatus

• US 5,699,264 A
• Filed: 04/17/1996
• Issued: 12/16/1997
• Est. Priority Date: 12/12/1995
• Status: Expired due to Fees

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation), Mitsubishi Electric Semiconductor Software Company Limited
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation), Mitsubishi Electric Semiconductor Software Company Limited
• Inventors: Yamamoto, Hirofumi, Nakamura, Yoshiki, Yamasaki, Terutoshi
• Primary Examiner(s): Teska, Kevin J.
• Assistant Examiner(s): Garbowski, Leigh Marie
• Application Number:
  US08/633,315
• Time in Patent Office: 608 Days
• Field of Search: 364/488, 364/489, 364/490, 364/491, 364/578
• US Class Current: 716/113
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking

Abstract

In a semiconductor circuit design verifying apparatus, a parasitic device retrieving part retrieves a parasitic device for a signal line connecting first stage active devices to a next stage active device. A time constant computing device computes a time constant between each first stage active device and the next stage active device including the parasitic device for the signal line between the first stage active devices and the next stage active device. An output data generating device outputs the time constant and information associated with the time constant to a user.

Claims

1. A semiconductor circuit design verifying apparatus comprising:

design information inputting means for inputting design information of a semiconductor circuit, the semiconductor circuit including a plurality of active devices and a plurality of signal lines;

parasitic device retrieving means for retrieving a parasitic device for a signal line, the signal line connecting a plurality of first stage active devices to a next stage active device driven by the first stage active devices, based on the design information input by said design information inputting means, each active device and the parasitic device including a resistance component and a capacitance component;

time constant computing means for computing a time constant between each first stage active device and the next stage active device driven by each first stage active device, among the plurality of active devices, each time constant being calculated from the resistance and capacitance components of each first stage active device, the next stage active device, and the parasitic device for the signal line connecting the first stage active devices and the next stage active device retrieved by the parasitic device retrieving means; and

time constant information outputting means for displaying each time constant and information associated with each time constant computed by the time constant computing means in connection with at least a part of the design information of the semiconductor circuit.

2. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant computing means computes each time constant by replacing the resistance components and the capacitance components of each first stage active device, the next stage active device, and the parasitic device with a combination of one synthesized resistance and one synthesized capacitance.

3. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant information outputting means displays each time constant and information concerning each time constant computed by the time constant computing means corresponding to a signal line in a layout-plotted drawing of a semiconductor circuit.

4. The semiconductor circuit design verifying apparatus according to claim 1, wherein the design information includes active device operation state information indicating an operation state of each first stage active device, and the time constant computing means selects at least one of a first computation formula for a first operation state of each first stage active device and a second computation formula for a second operation state of each first stage active device and wherein the time constant computing means computes a time constant in conformity with the selected computation formula.

5. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant computing means computes a time constant of a path including a signal line selected by a user from the input design information of a semiconductor circuit, and sends the computed time constant to the time constant information outputting means.

6. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant computing means computes a time constant for a portion of the semiconductor circuit where a design of the semiconductor circuit was changed if input design information of the semiconductor circuit was updated due to a change of design.

7. The semiconductor circuit design verifying apparatus according to claim 1, wherein the semiconductor circuit includes a bus line and wherein the time constant computing means divides a semiconductor circuit into a first region from each first stage active device up to the bus line and a second region from the bus line to the next stage active device and computes a time constant for the first and second regions independently.

8. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant information outputting means displays the time constants computed by the time constant computing means and information associated with the time constants in descending order according to values of the time constants.

9. The semiconductor circuit design verifying apparatus according to claim 1, wherein the time constant information outputting means displays each time constant and information associated with each time constant computed by the time constant computing means corresponding to a signal line in a logic circuit diagram of the semiconductor circuit.

10. The semiconductor circuit design verifying apparatus according to claim 1, further comprising storing means for storing a reference time constant, and comparing means for comparing each time constant computed by said time constant computing means with the reference time constant stored in the storing means, and wherein the time constant information outputting means displays time constants computed by the time constant computing means having a value larger than the reference time constant in response to a comparison by the comparing means.

11. The semiconductor design verifying apparatus of claim 10 wherein the first operation state comprises a saturated state and the second operation state comprises a non-saturated state.