Method for the non-contact rapid and accurate acquisition of the surface topology of objects

• US 5,706,085 A
• Filed: 08/09/1995
• Issued: 01/06/1998
• Est. Priority Date: 08/03/1995
• Status: Expired due to Fees

• Current Assignee: Gerd Hausler, Stefan G. Blossey
• Original Assignee: Gerd Hausler, Stefan G. Blossey
• Inventors: Hausler, Gerd, Blossey, Stefan G.
• Primary Examiner(s): Turner, Samuel A.
• Application Number:
  US08/513,024
• Time in Patent Office: 881 Days
• Field of Search: 356/357, 356/358, 356/359, 356/360
• US Class Current: 356/512
• CPC Class Codes: G01B 11/026 by measuring distance between sensor and object G01B11/0608 takes precedence
• CPC Class Codes: G01B 11/303 using photoelectric detection means
• CPC Class Codes: G01B 9/02012 using temporal intensity variation
• CPC Class Codes: G01B 9/0209 Low-coherence interferometers

Abstract

The method allows contact-less, precise and rapid measurement of the macroscopic shape of objects. The method is based on the Michelson-interferometer with the object mirror being replaced by the object to be measured. A low coherent light source is used. As either the reference mirror or the object is moved, an intensity modulation can be observed on the observation screen. The height information can be derived from determining the maximum depth of modulation in association with the movement. The determination of the depth of modulation has required full sampling of the modulation at a high sampling rate, or quasistatic movements. Therefore common methods are rather slow. The envelope of the modulation is directly extracted by modulating the light source synchronously to the modulation of the interference patterns and by using a solid-state imaging array which shows low pass characteristics in terms of time. The method allows to move the object or the reference mirror significantly faster than in conventional short coherent interferometers at a far lower sampling rate. If a light source cannot be modulated, the flux of light hitting the target or the sensitivity of the photodetector can be modulated instead.

Claims

1. A method of profiling a surface of an object, which comprises the steps of:

a) placing an object in vicinity of an interferometer having interferometer arms and a translation stage, and transmitting a low coherent light signal from a light source with a mean wavelength λ

to the object;

b) varying an optical path in one of the interferometer arms with the translation stage;

c) receiving a resulting intensity-modulated interferometer signal with a photodetector having low pass characteristics and outputting photodetector output signals;

d) evaluating the photodetector output signals with an image processing system; and

e) extracting a depth of modulation of the interferometer signal by intensity-modulating the low coherent light source.

2. The method according to claim 1, which further comprises shifting the translation stage by respective λ

/2 shifts and, during each λ

/2 shift of the translation stage, varying an intensity of the light source between a high intensity and a low intensity.

3. The method according to claim 2, wherein the step of varying the intensity of the light source comprises varying the intensity sinusoidally.

4. The method according to claim 1, which comprises integrating a signal received by the photodetector section by section and thereby extracting an envelope of the interferometer signal.

5. The method according to claim 1, which comprises modulating the light source at a constant frequency f=2ν

/1, where ν

is a constant speed of the translation stage and λ

is a mean wavelength of the light source.

6. The method according to claim 1, which comprises modulating the light source discontinuously by switching the light source on and off at a constant modulation frequency f=2ν

/1, where ν

is a constant speed of the translation stage and λ

is a mean wavelength of the light source.

7. The method according to claim 1, which comprises integrating the incoming intensity signal section by section with solid-state imaging arrays having a given time of integration between subsequent readouts.

8. The method according to claim 7, wherein the solid-state imaging arrays are CCD-devices.

9. The method according to claim 1 which further comprises changing a phase of light modulation of the light source after each integration time of the photodetector.

10. The method according to claim 1, which comprises. shifting a phase of a modulation of a light output of the light source by π

/2 after each integration time of the photodetector and adding corresponding pixels of two subsequent frames read out from the photodetector.

11. The method according to claim 1, which comprises alternately shifting a phase of a modulation of a light output of the light source by π

/2 and by -π

/2 after each integration time of the photodetectors.

12. The method according to claim 1, which further comprises subtracting an average value of a pixel of a respective photodetector from a present value of the pixel, squaring a difference determined in the subtracting step, and adding up the squared differences of corresponding pixels of subsequent frames.

13. The method according to claim 1, which further comprises storing, in addition to a maximum value for a pixel of a respective photodetector, a last and a next value for each pixel, and determining a position of the maximum value by interpolating wherein the position of the maximum.

14. The method according to claim 13, which further comprises determining a maximum of an absolute difference of subsequent values for each pixel.

15. The method according to claim 1, which comprises maintaining the light signal emitted by the light source constant during one integration time of the photodetector.

16. The method according to claim 1, which comprises setting a modulation frequency to zero at a translation stage speed of λ

/6 per video cycle.

17. A method of profiling a surface of an object, which comprises the steps of:

a) placing an object in vicinity of an interferometer having interferometer arms and a translation stage, and transmitting a non-modulated low coherent light signal with a mean wavelength λ

from a light source to the object;

b) varying an optical path in one of the interferometer arms with the translation stage;

c) receiving a reflected signal with a photodetector having low pass characteristics and outputting photodetector output signals;

d) evaluating the photodetector output signals with an image processing system; and

e) extracting a depth of modulation of the interferometer signal by modulating one of a flux of light which hits the photodetector, and a sensitivity of the photodetector.