×

Method and apparatus for power supply testing

  • US 5,710,701 A
  • Filed: 07/31/1995
  • Issued: 01/20/1998
  • Est. Priority Date: 07/31/1995
  • Status: Expired due to Term
First Claim
Patent Images

1. A testing device arranged for connection between a power supply apparatus and electronic application circuitry, said power supply apparatus having input terminals thereof arranged for connection to an external power source, said power supply apparatus being selectively operable to provide at least one supply voltage at output terminals thereof for application to the electronic application circuitry, said testing device comprising:

  • a timing signal generating device coupled to the input terminals of the power supply apparatus, said timing signal generating device being responsive to a signal received from the external power source for providing a first timing signal after attainment of a first predetermined voltage level at a selected node within said power supply apparatus following a connection of said power supply apparatus to the external power source;

    simulated load current generating means coupled to said timing signal generating device, said simulated load current generating means being responsive to said first timing signal for applying a simulated load current across the output terminals of the power supply apparatus and providing an indicium signal, said indicium signal being representative of a relationship between said one supply voltage across the output terminals of the power supply apparatus during an application of said simulated load current, and a predetermined output voltage specification.

View all claims
  • 7 Assignments
Timeline View
Assignment View
    ×
    ×